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Author: Steven Choquette
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1. Temperature Measurement and Optical Path-length Bias Improvement Modifications to NIST Ozone Reference Standards
James E Norris, Steven J Choquette, Franklin R Guenther, Joele Viallon, Philippe Moussay, Robert Wielgosz
Ambient ozone measurements in the U.S. and many other countries are traceable to a National Institute of Standards and Technology Standard Reference Photometer (NIST SRP). The NIST SRP serves as the highest level ozone reference standard in the U.S. ...
2. Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240
and 800 nm
Journal of Research (NIST JRES)
Lili Wang, Steven J Choquette
A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the
scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in
water. Absorption measurements were performed with the ...
3. Measurement of Scattering Cross Section with a Spectrophotometer with an Integrating Sphere Detector
Journal of Research (NIST JRES)
Lili Wang, Steven J Choquette, Yu-Zhong Zhang, Victoria Karpiak, Adolfas Kastytis Gaigalas
A commercial spectrometer with an integrating sphere (IS) detector was used to measure the
scattering cross section of microspheres. Analysis of the measurement process showed that two
measurements of the extinction, one with the cuvette placed i ...
4. Certified Transmittance Density Uncertainties for Standard Reference Materials using a Transfer Spectrophotometer
Technical Note (NIST TN)
John Carlton Travis, Melody V Smith, Steven J Choquette, Hung-Kung Liu
Overall uncertainties are evaluated for the certification of transmittance density (absorbance referred to air) and regular spectral transmittance for solid neutral density filter Standard Reference Materials by means of a transfer spectrophotometer. ...
5. Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares
Aaron A Urbas, Steven J Choquette
A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situati ...
6. Use of Standard Reference Material 2242 (Relative Intensity Correction Standard for Raman Spectroscopy) for Microarray Scanner
Mary B Satterfield, Marc L Salit, Steven J Choquette
As a critical component of any microarray experiment, scanner performance has the potential to contribute variability and bias,
the magnitude of which is usually not quantified. Using Standard Reference Material (SRM) 2242, certified for Raman spec ...
7. Relative intensity correction of Raman spectrometers: NIST SRMs 2241 through 2243 for 785 nm, 532 nm, and 488 nm/514.5 nm excitation
Steven J Choquette, E S. Etz, Wilbur S. Hurst, Douglas H. Blackburn, Stefan D Leigh
8. SRM 2036 Near Infrared Reflection Wavelength Standard
David Lee Duewer, Steven J Choquette, Leonard M Hanssen, E A. Early
9. Standard Reference Materials for Relative Intensity Correction of Raman Spectrometers
Steven J Choquette
NIST has developed a set of transfer standards for the relative correction of the intensity axis of Raman spectrometers. Three standards, covering the most commonly used lasers have been issued, and development of a fourth standard for 1064 nm excit ...
10. Development and Certification of NIST Standard Reference Materials for Relative Raman Intensity Calibration
E S. Etz, Steven J Choquette, Wilbur S. Hurst
In the practice of analytical Raman spectroscopy, it becomes increasingly important to employ a procedure for the correction of the relative intensity of Raman spectra. The determination of the intensity response function of a Raman instrument tradi ...