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You searched on: Author: Jennifer Verkouteren

Displaying records 1 to 10 of 27 records.
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1. Inkjet Metrology II: Resolved Effects of Ejection Frequency, Fluidic Pressure and Droplet Number on Reproducible Drop-on-Demand Dispensing
Published: 6/13/2011
Authors: R Michael Verkouteren, Jennifer R Verkouteren
Abstract: We report highly reproducible gravimetric and optical measurements of microdroplets enabled by fluidic pressure feedback control and state-of-the-art measurement systems that lend new insights into the process of drop-on-demand (DOD) printing. Baseli ...

2. Reliability of Ion Mobility Spectrometry for Qualitative Analysis of Complex, Multicomponent Illicit Drug Samples
Published: 3/20/2011
Authors: Jennifer R Verkouteren, Jessica L Staymates
Abstract: Ion Mobility Spectrometry (IMS) has been used for trace analysis of illicit drugs, but it can also provide reliable qualitative analysis of bulk forensic drug items, despite the complexity of these samples. The drug/drug and drug/excipient combinati ...

3. Automated Mapping of Explosives Particles in Composition C-4 Fingerprints
Published: 3/1/2010
Authors: Jennifer R Verkouteren, Jessica L Staymates, Inho Cho
Abstract: A method is described to perform automated mapping of RDX particles in C-4 fingerprints. The method employs polarized light microscopy and image analysis to map the entire fingerprint and the distribution of RDX particles. The approach is relativel ...

4. Inkjet Metrology: High-Accuracy Mass Measurements of Microdrops Produced by a Drop-on-Demand Dispenser
Published: 10/15/2009
Authors: R Michael Verkouteren, Jennifer R Verkouteren
Abstract: We describe three gravimetric methods for accurately measuring the mass of picoliter-sized fluid droplets generated by a piezoelectric drop-on-demand (DOD) dispenser. Optical methods are also described for co-measurement of droplet diameters. Droplet ...

5. Method to Determine Collection Efficiency of Particles by Swipe Sampling
Published: 9/1/2008
Authors: Jennifer R Verkouteren, Jessica L Staymates, Robert A Fletcher, Wayne Smith, George A Klouda, John G Gillen
Abstract: A methodology was developed to evaluate particle collection efficiencies from swipe sampling of trace residues. Swipe sampling is used for many applications where trace residues must be collected, including the evaluation of radioactive particle con ...

6. Polymer Microsphere Particle Standards Containing High Explosives
Published: 1/1/2008
Authors: Matthew E Staymates, Jennifer R Verkouteren, Jessica L Staymates, John G Gillen, Cory Berkland, Robert A Fletcher

7. NIST Program to Support Testing and Evaluation of Trace Explosive Detection
Published: 10/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, Wayne Smith
Abstract: Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and c ...

8. NIST Program to Support Testing and Evaluation of Trace Explosives Detection
Published: 9/1/2007
Authors: R Michael Verkouteren, John G Gillen, Jennifer R Verkouteren, Robert A Fletcher, Eric S Windsor, W.J. Smith

9. Verification of a Gas Mask Calibrant
Series: NIST Interagency/Internal Report (NISTIR)
Published: 2/19/2007
Authors: Robert A Fletcher, Jiann C Yang, George William Mulholland, R Lance King, Michael R Winchester, D Klinedinst, Jennifer R Verkouteren, Thomas George Cleary, David Buckingham, James J Filliben

10. New Guidelines for d13C Measurements
Published: 4/1/2006
Authors: T Coplen, W A Brandt, M Gehre, Manfred Groning, HAJ Meijer, Blaza Toman, Jennifer R Verkouteren
Abstract: Consistency of 13C measurements can be improved 39-47% by anchoring the 13C scale with two isotopic referencematerials differing substantially in 13C/12C. It isrecommended that 13C values of both organic andinorganic materials be measured and expr ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series