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Author: Dale Newbury

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1. Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
Published: 12/1/2011
Authors: Nicholas W m Ritchie, Dale E Newbury, Abigail P. Lindstrom
Abstract: Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive x-ray spectrometry. Peaks which result from non-ideal behavior in the detector or sample can fool even an experience microanalyst into believing that they have ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907003

2. Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence
Published: 6/1/2011
Authors: Jeffrey M Davis, Dale E Newbury, Nicholas W m Ritchie, Edward P. Vicenzi, Dale P Bentz, Albert J. Fahey
Abstract: X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904216

3. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C k Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900913

4. Mistakes Encountered During Automatic Peak Identification in Low Beam Energy X-Ray Microanalysis
Published: 4/1/2007
Author: Dale E Newbury
Abstract: Automated peak identification in electron beam excited x-ray microanalysis with energy dispersive x-ray spectrometry is subject to occasional mistakes even on well separated, high intensity peaks arising from major constituents. The problem is exace ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831435

5. Preface for Special Issue of Surface and Interface Analysis with the Proceedings of the NIST Workshop on 'Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology'
Published: 11/1/2005
Authors: Cedric John Powell, Dale E Newbury
Abstract: An introduction is given for the Proceedings of the Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology that was held at NIST on November 8-10, 2004.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831387

6. Simulation of Electron-Excited X-Ray Spectra With NIST-NIH Desktop Spectrum Analyzer (DTSA)
Published: 11/1/2005
Authors: Dale E Newbury, Robert L. Myklebust
Abstract: Desktop Spectrum Analyzer (DTSA) is a comprehensive software platform for the collection, simulation, processing, qualitative and quantitative analysis of electron-excited x-ray spectra. Spectrum simulation is based upon solving the rigorous express ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831371

7. X-Ray Spectrometry and Spectrum Image Mapping at Output Count Rates Above 100 kHz with a Silicon Drift Detector on a Scanning Electron Microscope
Published: 9/1/2005
Author: Dale E Newbury
Abstract: A third generation silicon drift detector (SDD), a silicon multicathode detector (SMCD), was tested as an analytical x-ray spectrometer on a scanning electron microscope. The resolution, output count rate, and spectral quality were tested as a funct ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831384

8. Blunders in Automatic Qualitative Analysis (Peak Identification) for Energy Dispersive X-Ray Spectrometry: The Low Voltage Microanalysis Situation
Published: 8/1/2005
Author: Dale E Newbury
Abstract: Automatic qualitative analysis for peak identification is a standard feature of virtually all modern computer-aided analysis software for energy dispersive x-ray spectrometry with electron excitation. Testing of recently installed systems from four ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831374

9. High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
Published: 3/21/2005
Authors: Dale E Newbury, J H J Scott, Scott A Wight, J T. Armstrong, John A Small
Abstract: Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831323

10. "Derived Spectra" Software Tools for Detecting Spatial and Spectral Features in Spectrum Images
Published: 1/1/2005
Authors: Dale E Newbury, David S. Bright
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831366



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