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You searched on: Author: Dale Newbury

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1. Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
Published: 12/1/2011
Authors: Nicholas W m Ritchie, Dale E Newbury, Abigail P. Lindstrom
Abstract: Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive x-ray spectrometry. Peaks which result from non-ideal behavior in the detector or sample can fool even an experience microanalyst into believing that they have ...

2. Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence
Published: 6/1/2011
Authors: Jeffrey M. Davis, Dale E Newbury, Nicholas W m Ritchie, Edward P. Vicenzi, Dale P Bentz, Albert J. Fahey
Abstract: X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue w ...

3. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...

4. Mistakes Encountered During Automatic Peak Identification in Low Beam Energy X-Ray Microanalysis
Published: 4/1/2007
Author: Dale E Newbury
Abstract: Automated peak identification in electron beam excited x-ray microanalysis with energy dispersive x-ray spectrometry is subject to occasional mistakes even on well separated, high intensity peaks arising from major constituents. The problem is exace ...

5. Preface for Special Issue of Surface and Interface Analysis with the Proceedings of the NIST Workshop on 'Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology'
Published: 11/1/2005
Authors: Cedric John Powell, Dale E Newbury
Abstract: An introduction is given for the Proceedings of the Workshop on Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology that was held at NIST on November 8-10, 2004.

6. Simulation of Electron-Excited X-Ray Spectra With NIST-NIH Desktop Spectrum Analyzer (DTSA)
Published: 11/1/2005
Authors: Dale E Newbury, Robert L. Myklebust
Abstract: Desktop Spectrum Analyzer (DTSA) is a comprehensive software platform for the collection, simulation, processing, qualitative and quantitative analysis of electron-excited x-ray spectra. Spectrum simulation is based upon solving the rigorous express ...

7. X-Ray Spectrometry and Spectrum Image Mapping at Output Count Rates Above 100 kHz with a Silicon Drift Detector on a Scanning Electron Microscope
Published: 9/1/2005
Author: Dale E Newbury
Abstract: A third generation silicon drift detector (SDD), a silicon multicathode detector (SMCD), was tested as an analytical x-ray spectrometer on a scanning electron microscope. The resolution, output count rate, and spectral quality were tested as a funct ...

8. Blunders in Automatic Qualitative Analysis (Peak Identification) for Energy Dispersive X-Ray Spectrometry: The Low Voltage Microanalysis Situation
Published: 8/1/2005
Author: Dale E Newbury
Abstract: Automatic qualitative analysis for peak identification is a standard feature of virtually all modern computer-aided analysis software for energy dispersive x-ray spectrometry with electron excitation. Testing of recently installed systems from four ...

9. High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
Published: 3/21/2005
Authors: Dale E Newbury, J H J Scott, Scott A Wight, J T. Armstrong, John A Small
Abstract: Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectro ...

10. "Derived Spectra" Software Tools for Detecting Spatial and Spectral Features in Spectrum Images
Published: 1/1/2005
Authors: Dale E Newbury, David S. Bright

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