NIST logo

Publications Portal

You searched on: Author: howard yoon

Displaying records 61 to 70 of 128 records.
Resort by: Date / Title


61. Kolsky Bar With Electrical Pulse Heating of the Sample
Published: 6/1/2003
Authors: Eric Paul Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W Yoon, Lyle E Levine, Richard Joel Fields, D Basak, Timothy J Burns
Abstract: The accuracy of simulations for modeling of machining processes is often limited due to insufficient knowledge of the material properties during machining, which can involve strain rates on the order of 104 per second or higher, plus rapid material h ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821995

62. A SURF Beamline for Synchrotron Source-Based Absolute Radiometry
Published: 2/1/2003
Authors: Ping-Shine Shaw, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R. Lykke
Abstract: A new source-based radiometry beamline at Synchrotron Ultraviolet Radiation Facility (SURF III) was constructed recently. The goal of this beamline is to establish a national source standard with wide spectral range from far UVto IR by using the cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841629

63. FASCAL 2: A New NIST Facility for the Calibration of the Spectral Irradiance of Sources
Published: 2/1/2003
Authors: Howard W Yoon, J E Proctor, Charles E Gibson
Abstract: The Facility for Automated Spectroradiometric Calibrations (FASCAL) is the primary facility for spectral irradiance and spectral radiance calibrations at NIST and has been in continous use since the early 1970's. Due to the increasing demands for sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841660

64. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published: 1/1/2003
Authors: Matthew A Davies, Howard W Yoon, T L Schmitz, T J Burns, M D Kennedy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103716

65. Calibrated thermal microscopy of the tool-chp interface in machining
Published: 1/1/2003
Authors: Matthew A. Davies, Howard W Yoon, Tony L Schmitz, Timothy J Burns, Michael Kennedy
Abstract: This paper presents the results of calibrated, microscopic measurement of the temperature fields at the tool-chip interface during the steady-state, orthogonal machining of AISI 1045 steel. The measurement system consists of a nearly diffraction lim ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821886

66. Constitutive Model Data for Machining Simulation Using the NIST Pulse-Heat Kolsky Bar
Published: 1/1/2003
Authors: Eric Paul Whitenton, Michael Kennedy, Matthew A. Davies, Gerald V. Blessing, Brian S. Dutterer, Richard L. Rhorer, Howard W Yoon, Richard Joel Fields, D Basak, Timothy J Burns
Abstract: A new facility for dynamic material testing using a traditional Kolsky bar with the addition of controlled electrical-resistive pulse heating has been established at the National Institute of Standrds and Technology (NIST). Dynamic stress-strain data ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821954

67. FASCAL 2: A New NIST Facility for the Spectral Irradiance Calibrations of Sources
Published: 1/1/2003
Authors: Howard W Yoon, J E Proctor, Charles E Gibson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104270

68. Kolsky Bar with Electrical Pulse Heating of the Sample
Published: 1/1/2003
Authors: R Rhorer, D Basak, G Blessing, T J Burns, Matthew A Davies, B Dutterer, R Fields, M D Kennedy, L Levine, E Whitenton, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104725

69. Linearity of InGaAs Photodiodes
Published: 1/1/2003
Authors: Howard W Yoon, James J. Butler, Thomas C Larason, George P Eppeldauer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104272

70. Microsecond Time-Resolved Pyrometry During Rapid Resistive Heating of Samples in a Kolsky Bar Apparatus, ed. by D. Ripple
Published: 1/1/2003
Authors: D Basak, Howard W Yoon, R Rhorer, T J Burns
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104321



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series