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41. New Developments for the Extreme Ultraviolet Detector Radiometry Beamline at SURF III
Published: 10/1/2000
Authors: Robert Edward Vest, L R Canfield
Abstract: The upgrade of the SURF electron storage ring has provided an opportunity to make several improvements to the detector radiometry beamline (BL-9). A new control and data acquisition system has been developed and new high-order-suppression filters hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840095

42. Noble Gas Excimer Scintillation Following Neutron Capture in Boron Thin Films
Published: 4/11/2014
Authors: Alan K Thompson, Jacob McComb, Charles W Clark, Michael A. Coplan, Mohamad Al-Sheikhly, Robert Edward Vest
Abstract: Far-ultraviolet (FUV) scintillation signals have been measured in heavy noble gases (argon, krypton, xenon) following boron-neutron capture (10B(n,α)7Li) in 10B thin films. The observed scintillation yields are comparable to the yields from some ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915257

43. Photoemission from Silicon Photodiodes and Induced Changes in the Detection Efficiency in the Far Ultraviolet,
Published: 1/1/1997
Authors: Robert Edward Vest, L R Canfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101788

44. Present Status of Radiometric Quality Silicon Photodiodes
Published: 2/1/2003
Authors: R Korde, C Prince, N. Cunningham, Robert Edward Vest, E Gullikson
Abstract: Evaluation of five types of silicon photodiodes was undertaken to verify their suitability for absolute radiometry and also for their use as transfer standards in the spectral region from 1 nm to 1100 nm. Four types of photodiodes were fabricated for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840128

45. Present status of radiometric quality silicon photodiodes,
Published: 1/1/2003
Authors: R Korde, C Prince, D Cunningham, Robert Edward Vest, E Gullikson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101588

46. Quantitative Measurement of Outgas Products From EUV Photoresists
Published: 3/14/2008
Authors: Charles S Tarrio, Bruce A Benner Jr, Robert Edward Vest, Steven E Grantham, Shannon Bradley Hill, Thomas B Lucatorto, Jay H Hendricks, Patrick J Abbott, Greg Denbeaux, Alin Antohe, Chimaobi Mbanaso, Kevin Orbek
Abstract: The photon-stimulated emission of organic molecules from the photoresist during exposure is a serious problem for extreme- ultraviolet lithography (EUVL) because the adsorption of the outgassing products on the EUV optics can lead to carbonization an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842436

47. Quantum Efficiency of Solar-Blind Semiconductor Photodiodes in the Far Ultraviolet
Published: 2/1/2003
Authors: Robert Edward Vest, B Hertog, P Chow
Abstract: A difficulty in diverse metrological applications is the measurement of relatively low intensity ultraviolet radiation in the presence of an intense visible radiation background. The development of a detector technology that combines the high efficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840129

48. Quantum efficiency of solar-blind semiconductor photodiodes in the far ultraviolet,
Published: 1/1/2003
Authors: Robert Edward Vest, B Hertog, P P Chow
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101787

49. Radiometry at the NIST SURF II Storage Ring Facility
Published: 1/1/1995
Authors: Mitchell L. Furst, R M Graves, L R Canfield, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101539

50. Response of a Silicon Photodiode to Pulsed Radiation
Published: 9/1/2003
Authors: Robert Edward Vest, Steven E Grantham
Abstract: Both the integrated-charge and peak-voltage responsivity of a 1 cm2 Si photodiode optimized for the extreme ultraviolet have been measured with 532 nm wavelength pulsed radiation. The peak power of the optical pulse is varied from 35 mW to 24 kW wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840152



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