NIST logo

Publications Portal

You searched on:
Author: robert vest
Sorted by: title

Displaying records 41 to 50 of 66 records.
Resort by: Date / Title


41. Photoemission from Silicon Photodiodes and Induced Changes in the Detection Efficiency in the Far Ultraviolet,
Published: 1/1/1997
Authors: Robert Edward Vest, L R Canfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101788

42. Present Status of Radiometric Quality Silicon Photodiodes
Published: 2/1/2003
Authors: R Korde, C Prince, N. Cunningham, Robert Edward Vest, E Gullikson
Abstract: Evaluation of five types of silicon photodiodes was undertaken to verify their suitability for absolute radiometry and also for their use as transfer standards in the spectral region from 1 nm to 1100 nm. Four types of photodiodes were fabricated for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840128

43. Present status of radiometric quality silicon photodiodes,
Published: 1/1/2003
Authors: R Korde, C Prince, D Cunningham, Robert Edward Vest, E Gullikson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101588

44. Quantitative Measurement of Outgas Products From EUV Photoresists
Published: 3/14/2008
Authors: Charles S Tarrio, Bruce A Benner Jr, Robert Edward Vest, Steven E Grantham, Shannon Bradley Hill, Thomas B Lucatorto, Jay H Hendricks, Patrick J Abbott, Greg Denbeaux, Alin Antohe, Chimaobi Mbanaso, Kevin Orbek
Abstract: The photon-stimulated emission of organic molecules from the photoresist during exposure is a serious problem for extreme- ultraviolet lithography (EUVL) because the adsorption of the outgassing products on the EUV optics can lead to carbonization an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842436

45. Quantum Efficiency of Solar-Blind Semiconductor Photodiodes in the Far Ultraviolet
Published: 2/1/2003
Authors: Robert Edward Vest, B Hertog, P Chow
Abstract: A difficulty in diverse metrological applications is the measurement of relatively low intensity ultraviolet radiation in the presence of an intense visible radiation background. The development of a detector technology that combines the high efficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840129

46. Quantum efficiency of solar-blind semiconductor photodiodes in the far ultraviolet,
Published: 1/1/2003
Authors: Robert Edward Vest, B Hertog, P P Chow
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101787

47. Radiometry at the NIST SURF II Storage Ring Facility
Published: 1/1/1995
Authors: Mitchell L. Furst, R M Graves, L R Canfield, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101539

48. Response of a Silicon Photodiode to Pulsed Radiation
Published: 9/1/2003
Authors: Robert Edward Vest, Steven E Grantham
Abstract: Both the integrated-charge and peak-voltage responsivity of a 1 cm2 Si photodiode optimized for the extreme ultraviolet have been measured with 532 nm wavelength pulsed radiation. The peak power of the optical pulse is varied from 35 mW to 24 kW wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840152

49. Response of a silicon photodiode to pulsed radiation,
Published: 1/1/2003
Authors: Robert Edward Vest, Steven E Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101786

50. SDO EVE CCD and Thin Foil Filter Characterization and Selection
Published: 9/13/2007
Authors: Matthew Triplett, David Croster, Thomas N Woods, Francis Eparvier, Phillip Chamberlin, Gregory D Berthiaume, David Weitz, Robert Edward Vest
Abstract: The NASA Solar Dynamics Observatory (SDO), scheduled for launch in 2008, incorporates a suite of instruments including the EUV Variability Experiment (EVE). The EVE instrument package contains grating spectrographs used to measure the solar extreme u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840284



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series