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Displaying records 41 to 50 of 67 records.
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41. Response of a silicon photodiode to pulsed radiation,
Published: 1/1/2003
Authors: Robert Edward Vest, Steven E Grantham

42. Towards high accuracy reflectometry for extreme-ultraviolet lithography,
Published: 1/1/2003
Authors: Charles S Tarrio, Steven E Grantham, M B Squires, Robert Edward Vest, Thomas B Lucatorto

43. Absolute Extreme Ultraviolet Metrology
Published: 8/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham
Abstract: NIST has a long-standing program for the calibration of extreme ultraviolet optical components. Begun with the advent of the Synchrotron Ultraviolet Radiation Facility (SURF) almost 40 years ago, early activities centered on the development and char ...

44. AlGaN Schottky Diodes for Short-Wavelength UV Applications
Published: 6/1/2001
Authors: P P Chow, J J Klaassen, Robert Edward Vest, J M VanHove, A Wowchak, C Polley
Abstract: High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohn ...

45. The New Ultraviolet Spectral Responsivity Scale Based on Cryogenic Radiometry at Synchrotron Ultraviolet Radiation Facility III
Published: 5/1/2001
Authors: Ping-Shine Shaw, Thomas C Larason, R Gupta, Steven W Brown, Robert Edward Vest, Keith R Lykke
Abstract: The recently completed upgrade of the Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) has improved the accuracy of radiometric measurements over a broad spectral range from the infrar ...

46. Absolute EUV Metrology,
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham

47. Extreme Ultraviolet Metrology at SURF III
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham, Thomas B Lucatorto
Abstract: The last two decades have seen the development normal-incidence multiplayer mirrors and semiconductor photodiodes for extreme ultraviolet (EUV) radiation. Applications such as in astrophysics, lithography, and plasma physics, require precise calibra ...

48. Extreme-Ultraviolet Metrology at SURF III,
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, Steven E Grantham, Thomas B Lucatorto

49. New Developments for the Extreme Ultraviolet Detector Radiometry Beamline at SURF III
Published: 10/1/2000
Authors: Robert Edward Vest, L R Canfield
Abstract: The upgrade of the SURF electron storage ring has provided an opportunity to make several improvements to the detector radiometry beamline (BL-9). A new control and data acquisition system has been developed and new high-order-suppression filters hav ...

50. NIST Programs for Calibrations in the Far Ultraviolet Spectral Region
Published: 11/1/1999
Authors: Robert Edward Vest, L R Canfield, Mitchell L. Furst, R M Graves, A D Hamilton, L R Hughey, Thomas B Lucatorto, R P. Madden
Abstract: The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standa ...

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