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Author: robert vest
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Displaying records 41 to 50 of 58 records.
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41. Near UV Electroreflectance Facility
Published: 1/1/1997
Author: Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101862

42. Photoemission from Silicon Photodiodes and Induced Changes in the Detection Efficiency in the Far Ultraviolet,
Published: 1/1/1997
Authors: Robert Edward Vest, L R Canfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101788

43. Evaluation of Au/GaAsP and Au/GaP Schottky Photodiodes as Radiometric Detectors in the EUV, Proceedings of the Synchrotron Radiation Instrumentation, Argon National Laboratories, October 1995,
Published: 1/1/1996
Authors: Robert Edward Vest, L R Canfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101789

44. Stable Silicon Photodiodes for Absolute Intensity Measurements in the VUV and Soft X-Ray Regions
Published: 1/1/1996
Authors: Eric M Gullikson, R Korde, L R Canfield, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101548

45. Radiometry at the NIST SURF II Storage Ring Facility
Published: 1/1/1995
Authors: Mitchell L. Furst, R M Graves, L R Canfield, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101539

46. Dual Grating Monochromator for Detector Calibrations Using Synchrotron Radiation as an Absolute Source at NIST,
Published: 1/1/1994
Authors: Robert Edward Vest, L R Canfield, Mitchell L. Furst, R P. Madden, N Swanson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101790

47. World Wide Web Description of SURF II
Published: 1/1/1994
Author: Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100362

48. Update on NIST VUV transfer standard detector program
Published: 1/1/1993
Authors: L R Canfield, Robert Edward Vest, R P. Madden
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100149

49. Update on NIST VUV transfer standard detector program,
Published: 1/1/1993
Authors: L R Canfield, Robert Edward Vest, R P. Madden
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101816

50. At-Wavelength Metrology for EUV Lithography at NIST
Published: Date unknown
Authors: Charles S Tarrio, Steven E Grantham, Robert Edward Vest, Thomas B Lucatorto
Abstract: The National Institute of Standards and Technology (NIST) is active in many areas of metrology impacting extreme ultraviolet lithography. We will describe our activities in the areas of reflectometry, pulsed radiometry, and long-term multiplayer mir ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841693



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