NIST logo

Publications Portal

You searched on:
Author: charles tarrio
Sorted by: title

Displaying records 71 to 80 of 96 records.
Resort by: Date / Title


71. Polymer Photochemistry at the EUV Wavelength
Published: 6/8/2010
Authors: Charles S Tarrio, Theodore Fedynyshyn, Russell Goodman, Alberto Cabral, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904827

72. Post-Polish Figuring of Optical Surfaces Using Multilayer Deposition, ed. by G. Kubiak and D. Kania
Published: 1/1/1996
Authors: Charles S Tarrio, E Spiller, C J Evans, Thomas B Lucatorto, Charles W Clark
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100204

73. SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research
Published: 9/1/2011
Authors: Uwe Arp, Charles W Clark, Lu Deng, Nadir Sabirovich Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Shannon Bradley Hill, Thomas B Lucatorto, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storag ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906750

74. Selected Programs at the New SURF III Electron Storage Ring
Published: 6/1/2000
Authors: Mitchell L. Furst, Uwe Arp, G P Cauchon, A D Hamilton, L R Hughey, Thomas B Lucatorto, Charles S Tarrio
Abstract: The conversion of the electron storage ring at NIST (the National Institute of Standards and Technology) to SURF III (the Synchrotron Ultraviolet Radiation Facility) has resulted in a significant improvement to the azimuthal uniformity of magnetic fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841424

75. Si/B^d4C Narrow-Bandpass Mirrors for the Extreme Ultraviolet,
Published: 1/1/1994
Authors: J M Slaughter, B S Meadower, R N. Watts, Charles S Tarrio, Thomas B Lucatorto, C M Falco
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101720

76. Smoothing of Mirror Substrates by Thin-Film Deposition
Published: 9/8/1999
Authors: E Spiller, S Baker, E Parra, Charles S Tarrio
Abstract: Superpolished optical flats with high spatial frequency roughness below 0.1 nm have been commercially available for years. However, it is much more difficult to obtain figured optics of similar quality. We have obtained and tested the finish of fig ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840071

77. Soft X-Ray Calibration of the Co/C Multilayer Mirrors for the Objective Crystal Spectrometer (OXS) on the Spectrum R {omlat} ntgen-Gamma Satellite (SRG)
Published: 1/1/1996
Authors: S Abdoli, Charles S Tarrio, F E Christensen, H W Schnopper
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100145

78. Soft X-Ray Damage to p-terphenyl Coatings for Detectors
Published: 1/1/1994
Authors: E L Benitez, M L Dark, D E Husk, S E Schnatterly, Charles S Tarrio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101440

79. Structure and Performance of Si/Mo Multilayer Mirrors for the Extreme Ultra-violet,
Published: 1/1/1994
Authors: J M Slaughter, D W Schulze, C R Hillis, A Mirone, R Stalio, R N. Watts, Charles S Tarrio, Thomas B Lucatorto, Michael Krumrey, P Mueller, C M Falco
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101721

80. Synchrotron Beamline for Extreme-Ultraviolet Multilayer Mirror Endurance Testing
Published: 5/1/2005
Authors: Charles S Tarrio, Steven E Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840203



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series