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Displaying records 61 to 70 of 106 records.
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61. Microtomography of an integrated circuit interconnect with an electromigration void
Published: 1/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Ying-ju Wang, Uwe Arp, Thomas B Lucatorto, B D Ravel, Charles S Tarrio

62. Momentum Dependence of Local Fields in Solids,
Published: 1/1/1992
Authors: Charles S Tarrio, S E Schnatterly

63. Multilayer Mirrors for the Objective Crystal Spectrometer on the Spectrum R{omlat}ntgen Gamma Satellite
Published: 1/1/1995
Authors: E Louis, E Spiller, S Abdali, F E Christensen, H J Voorma, N B Koster, P K Frederiksen, Charles S Tarrio, Eric M Gullikson, F Bijkerk

64. Multilayers for Next Generation X-Ray Sources
Published: Date unknown
Authors: S Bajt, H N Chapman, E Spiller, S Hau-Riege, J Alameda, A J Nelson, C C Walton, B Kjornrattanawanich, Andrew Aquila, Charles S Tarrio, Steven E Grantham
Abstract: Multilayers are artificially layered structures that can be used to create optics and optical elements for a broad range of x-ray wavelengths, or can be optimized for other applications. The development of next generation x-ray sources (synchrotrons ...

65. NIST VUV Metrology Programs to Support Space Based Research,
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw

66. NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw

67. Narrow band EUV multilayer coating for the MOSES rocket,
Published: 1/1/2006
Authors: S M Owens, J S Gum, Charles S Tarrio, S Grantham, J A Dvorak, B Kjornrattanawanich, R Keski kuha, R J Thomas, C C Kankelborg

68. New Developments at the NIST/DARPA EUV Optics Characterization Facility,
Published: 1/1/1997
Author: Charles S Tarrio

69. Normal-Incidence Optics for Solar Coronal Imaging,
Published: 1/1/1995
Authors: E Spiller, J Wilczynski, L Golub, G Nystrom, Eric M Gullikson, Charles S Tarrio

70. Optical Constants of In-Situ Deposited Films of Important EUV Multilayer Materials,
Published: 1/1/1998
Authors: Charles S Tarrio, R N. Watts, Thomas B Lucatorto, J M Slaughter, C M Falco

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