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Author: steven phillips
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Displaying records 51 to 54.
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51. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...

52. Uncertainty Due to Finite Resolution Measurements
Published: 5/1/2008
Authors: Steven David Phillips, Blaza Toman, William Tyler Estler

53. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...

54. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...

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