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Displaying records 51 to 60 of 65 records.
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51. Some Developments at NIST on Traceability in Dimensional Measurements
Published: 10/1/2001
Authors: Dennis A Swyt, Steven David Phillips, J Palmateer
Abstract: This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821616

52. Standardized Performance Testing Metrics for Optical Coordinate Measurement Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7883
Published: 5/9/2013
Author: Steven David Phillips
Abstract: Optical probing technology on coordinate measuring machines (CMMs) operates significantly differently from discrete point probing associated with tactile probing CMMs hence manufacturers of this technology seek to use different testing artifacts for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912341

53. Standards for Coordinate Measuring Machines,
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Daniel S Sawyer, P Snoots, K Harrell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820699

54. The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints
Published: 1/1/1997
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, David E Ward, K Eberhardt, M. Levenson, Marjorie A McClain, B Melvin, Ted Hopp, Y Shen
Abstract: The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to address this issue use simulation techniques (e.g., the virtual CMM) where the propagation of k ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820857

55. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

56. The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines
Published: 4/1/1998
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler, J Buttress
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820903

57. The Validation of CMM Task Specific Measurement Uncertainty Software
Published: 1/1/2003
Authors: Steven David Phillips, Bruce R. Borchardt, A Abackerli, Craig M Shakarji, Daniel S Sawyer, P Murray, B Rasnick, K Summerhays, J M Baldwin, M P Henke
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822036

58. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Published: 6/1/2000
Author: Steven David Phillips
Abstract: The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820969

59. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822244

60. Uncertainty Due to Finite Resolution Measurements
Published: 5/1/2008
Authors: Steven David Phillips, Blaza Toman, William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912361



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