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Author: steven phillips
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51. The Estimation of Measurement Uncertainty of Small Circular Features Measured by CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5698
Published: 2/1/1995
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy, i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820754

52. The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines
Published: 4/1/1998
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler, J Buttress
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820903

53. The Validation of CMM Task Specific Measurement Uncertainty Software
Published: 1/1/2003
Authors: Steven David Phillips, Bruce R. Borchardt, A Abackerli, Craig M Shakarji, Daniel S Sawyer, P Murray, B Rasnick, K Summerhays, J M Baldwin, M P Henke
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822036

54. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Published: 6/1/2000
Author: Steven David Phillips
Abstract: The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820969

55. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822244

56. Uncertainty Due to Finite Resolution Measurements
Published: 5/1/2008
Authors: Steven David Phillips, Blaza Toman, William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912361

57. User Manual for the Interim Testing Artifact for CMMs
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5602
Published: 2/1/1995
Authors: Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
Abstract: The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820767

58. VOLUMETRIC PERFORMANCE EVALUATION OF A LASER SCANNER
Published: 10/20/2013
Authors: Balasubramanian Muralikrishnan, Massimiliano M. Ferrucci, Daniel S Sawyer, Grant Gerner, Vincent D Lee, Christopher J Blackburn, Steven David Phillips, Peter Petrov, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
Abstract: There are several sources of error in a laser scanner measurement. The optical and material properties of the target, the shape, form, surface texture, color, reflectivity, and orientation of the target in space, environmental effects, etc., all cont ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914153

59. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822066



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