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Author: steven phillips
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51. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Steven David Phillips
The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
52. Uncertainty Due to Finite Resolution Measurements
Steven David Phillips, B Tolman, William Tyler Estler
We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
53. Uncertainty Due to Finite Resolution Measurements
Steven David Phillips, Blaza Toman, William Tyler Estler
54. User Manual for the Interim Testing Artifact for CMMs
NIST Interagency/Internal Report (NISTIR)
Amy Singer, J Land, Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, Gregory W Caskey, et al
The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ...
55. VOLUMETRIC PERFORMANCE EVALUATION OF A LASER SCANNER
Balasubramanian Muralikrishnan, Massimiliano M. Ferrucci, Daniel S Sawyer, Grant Gerner, Vincent D Lee, Christopher J Blackburn, Steven David Phillips, Peter Petrov, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
There are several sources of error in a laser scanner measurement. The optical and material properties of the target, the shape, form, surface texture, color, reflectivity, and orientation of the target in space, environmental effects, etc., all cont ...
56. Validation of CMM Task Specific Measurement Uncertainity Software
M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...