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You searched on: Author: steven phillips Sorted by: title

Displaying records 21 to 30 of 68 records.
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21. Design and calibration of an artifact for evaluating laser scanning articulating arm CMMs used for measuring complex non-concurrent surfaces
Published: 10/30/2015
Authors: Vincent D Lee, Steven David Phillips, Craig M Shakarji, Jeffrey Hosto, Jeffrey Huber, Gillich Barbara
Abstract: Dimensional metrology is a foundational science finding applications throughout modern technology, including the testing of human-worn body armor designed to mitigate damage from kinetic projectiles fired from small arms. We describe the design and ...

22. Dimensional Metrology Issues of Army Body Armor Testing
Series: OTHER
Published: 2/18/2010
Authors: Kirk D Rice, Michael A Riley, Amanda Lattam Forster, Steven David Phillips, Craig M Shakarji, Daniel S Sawyer, Christopher J. Blackburn, Bruce R. Borchardt, James J Filliben

23. Dimensional measurement traceability of 3D imaging data
Published: 1/19/2009
Authors: Steven David Phillips, Craig M Shakarji, Michael Krystek, K Summerhays
Abstract: This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challe ...

24. Discussion of Statistical Issues in Geometric Feature Inspection Using Coordinate Measuring Machines
Published: 2/1/1997
Authors: Steven David Phillips, K Eberhardt
Abstract: A coordinate measuring machine (CMM) is a computer controlled device that uses a probe to obtain measurements on a manufactured part''s surface, usually one point at a time. Probe movements may be programmed or determined manually by operatio ...

Published: 10/1/2014
Authors: Massimiliano M. Ferrucci, Balasubramanian Muralikrishnan, Daniel S Sawyer, Steven David Phillips, Peter Petrov, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
Abstract: Large volume laser scanners are increasingly being used for a variety of dimensional metrology applications. Methods to evaluate the performance of these scanners are still under development and there are currently no documentary standards available. ...

26. Economics of Measurement Uncertainty and Tolerances
Published: 7/1/2009
Authors: Steven David Phillips, J.M. Baldwin, William Tyler Estler
Abstract: Productivity is considered by considering Cobb-Douglas production function and focusing on total factor productivity (TFP). We argue that developed economies like the United States need to develop TFP by utilizing advances in computation power and in ...

27. Error Compensation for CMM Touch Trigger Probes
Published: 1/1/1995
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, Christoph Johann Witzgall, M Levenson, et al
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe ...

28. Error Compensation for CMM Touch Trigger Probes
Published: 10/1/1996
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, G Witzgall, M Levenson, K Eberhardt, Marjorie A McClain, Y Shen, X Zhang
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modern coordinate measuring machines (CMMs). The model provides a quantitative description of the pretravel variation or probe- ...

29. Evaluating CT for Metrology: The Influence of Material Thickness on Measurements
Published: 10/7/2014
Authors: Joseph Schlecht, Eric Ferley, Shaun COUGHLIN , Steven David Phillips, Vincent D Lee, Craig M Shakarji
Abstract: X-ray imaging provides a non-destructive means to measure internal features of a workpiece, and CT offers unique capabilities for internal measurements in 3-D. However, due to the computational nature of CT and its indirect measurement process, asses ...

30. Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias
Published: 9/1/1997
Authors: Steven David Phillips, K Eberhardt, B Parry
Abstract: This paper proposes a method to extend the current ISO Guide to the Expression of Uncertainty in Measurement to include the case of known, but uncorrected, measurement bias. It is strongly recommended that measurement results be corrected for bias, h ...

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  • SP 250-XX: Calibration Services
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