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Displaying records 21 to 30 of 65 records.
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21. Dimensional Metrology Issues of Army Body Armor Testing
Series: OTHER
Published: 2/18/2010
Authors: Kirk D Rice, Michael A Riley, Amanda Lattam Forster, Steven David Phillips, Craig M Shakarji, Daniel S Sawyer, Christopher J Blackburn, Bruce R. Borchardt, James J Filliben
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904958

22. Dimensional measurement traceability of 3D imaging data
Published: 1/19/2009
Authors: Steven David Phillips, Craig M Shakarji, Michael Krystek, K Summerhays
Abstract: This paper discusses the concept of metrological traceability to the SI unit of length, the meter. We describe how metrological traceability is realized, give a recent example of the standardization of laser trackers, and discuss progress and challe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900252

23. Discussion of Statistical Issues in Geometric Feature Inspection Using Coordinate Measuring Machines
Published: 2/1/1997
Authors: Steven David Phillips, K Eberhardt
Abstract: A coordinate measuring machine (CMM) is a computer controlled device that uses a probe to obtain measurements on a manufactured part''s surface, usually one point at a time. Probe movements may be programmed or determined manually by operatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820802

24. EVALUATION OF A LASER SCANNER FOR LARGE VOLUME COORDINATE METROLOGY ‹ A COMPARISON OF RESULTS BEFORE AND AFTER FACTORY CALIBRATION
Published: 10/1/2014
Authors: Massimiliano M. Ferrucci, Balasubramanian Muralikrishnan, Daniel S Sawyer, Steven David Phillips, Peter Petrov, Yuri Yakovlev, Andrey Astrelin, Spike Milligan, John Palmateer
Abstract: Large volume laser scanners are increasingly being used for a variety of dimensional metrology applications. Methods to evaluate the performance of these scanners are still under development and there are currently no documentary standards available. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915965

25. Economics of Measurement Uncertainty and Tolerances
Published: 7/1/2009
Authors: Steven David Phillips, J.M. Baldwin, William Tyler Estler
Abstract: Productivity is considered by considering Cobb-Douglas production function and focusing on total factor productivity (TFP). We argue that developed economies like the United States need to develop TFP by utilizing advances in computation power and in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902981

26. Error Compensation for CMM Touch Trigger Probes
Published: 1/1/1995
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, Christoph Johann Witzgall, M Levenson, et al
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modem coordinate measuring machines (CMMs). The model provides a quantitative description of the pre-travel variation or probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820736

27. Error Compensation for CMM Touch Trigger Probes
Published: 10/1/1996
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, G Witzgall, M Levenson, K Eberhardt, Marjorie A McClain, Y Shen, X Zhang
Abstract: We present the analysis of a simple mechanical model of a common type of kinematic seat touch trigger probe widely used on modern coordinate measuring machines (CMMs). The model provides a quantitative description of the pretravel variation or probe- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822130

28. Evaluating CT for Metrology: The Influence of Material Thickness on Measurements
Published: 10/7/2014
Authors: Joseph Schlecht, Eric Ferley, Shaun COUGHLIN , Steven David Phillips, Vincent D Lee, Craig M Shakarji
Abstract: X-ray imaging provides a non-destructive means to measure internal features of a workpiece, and CT offers unique capabilities for internal measurements in 3-D. However, due to the computational nature of CT and its indirect measurement process, asses ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916961

29. Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias
Published: 9/1/1997
Authors: Steven David Phillips, K Eberhardt, B Parry
Abstract: This paper proposes a method to extend the current ISO Guide to the Expression of Uncertainty in Measurement to include the case of known, but uncorrected, measurement bias. It is strongly recommended that measurement results be corrected for bias, h ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820858

30. Improving Kinematic Touch Trigger Probe Performance
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943



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