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You searched on: Author: yoshihiro ohno Sorted by: date

Displaying records 161 to 170 of 180 records.
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161. Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs
Published: Date unknown
Authors: C Jones, Yoshihiro Ohno
Abstract: LEDs are narrow-band emission sources and present special problems in colorimetric characterization. Chromaticity space is mapped using Gaussian spectral models to represent narrow-band emission sources. The Gaussian maps show that the spectral regi ...

162. Detector-Based Sphere Photometry for Industry
Published: Date unknown
Authors: Yoshihiro Ohno, R S Bergman
Abstract: The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of the lumen. This method has many benefits for high-accuracy applications, allowing for me ...

163. Development and Application Issues of a Spectrally Tunable LED Source
Published: Date unknown
Authors: George P Eppeldauer, Steven W Brown, G Dezsi, Irena Fryc, Yoshihiro Ohno
Abstract: A spectrally tunable solid state source based on Light Emitting Diodes (LEDs) is being developed at the National Institute of Standards and Technology (NIST). The tunable source will emulate the spectral distributions of various light sources and can ...

164. Development of a Color Quality Scale
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: A new metric for evaluating the color quality of light sources is being developed at NIST, in close contact with the lighting industry and the CIE. The current CIE Color Rendering Index (CRI) is outdated and has several known deficiencies. The CRI o ...

165. Development of the NIST Detector-based Color Temperature Scale
Published: Date unknown
Authors: George P Eppeldauer, Yoshihiro Ohno
Abstract: Based on the spectral responsivity of the channels of a tristimulus colorimeter, a color temperature scale is being developed at NIST. The low uncertainty of the spectral responsivity measurements can dominate the chromaticity measurement uncertainty ...

166. Evaluation of Color Difference Formulae for Color Rendering Metrics
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: Solid-state lighting is providing strong incentive to develop a new color rendering or color quality metric for sources of general illumination. Differences in perceived color between reflective samples illuminated by the test lamp and a reference s ...

167. Four-Color Matrix Method for Correction of Tristimulus Colorimeters Part 2
Published: Date unknown
Authors: Yoshihiro Ohno, Steven W Brown
Abstract: The Four-Color Method was developed to improve the accuracy of tristimulus colorimeters for measurements of color displays. It was verified that the method works well for CRTs. The accuracy of this method has been studied further for spectral variat ...

168. LED-Based Spectrally Tunable Source for Radiometric, Photometric and Colorimetric Applications
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, George P Eppeldauer, Yoshihiro Ohno

169. Measurement of Solid-State-Lighting Products
Published: Date unknown
Authors: Yoshihiro Ohno, Carl C Miller
Abstract: This paper discusses issues of photometric measurements of solid-state-lighting (SSL) products, for quantities including luminous flux, luminous efficacy, luminous intensity distribution, and color characteristics. Standards for SSL products are urge ...

170. Measuring Color Quality of Light Sources
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: The successful commercialization of solid-state lighting for general illumination will require an effective method to characterize the color quality of these sources. The distinctive spectral characteristics of solid-state lighting sources present bo ...

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  • SP 250-XX: Calibration Services
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