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Author: yoshihiro ohno
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Displaying records 161 to 170.
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161. NIST Facility for Total Spectral Radiant Flux Calibration
Published: Date unknown
Authors: Yoshihiro Ohno, Yuqin Zong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841837

162. NIST Measurement Services: Total Spectral Radiant Flux Calibrations
Series: Special Publication (NIST SP)
Report Number: sp
Published: Date unknown
Authors: Yuqin Zong, Carl C Miller, Yoshihiro Ohno
Abstract: The National Institute of Standards and Technology supplies calibrated standards and special tests of incandescent type of lamps for total spectral radiant flux (TSRF) from 360 nm to 830 nm. The total spectral radiant flux scale is based on both the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841078

163. NIST Reference Spectroradiometer for Color Display Calibrations
Published: Date unknown
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A program has recently been established at the National Institute of Standards and Technology (NIST) to develop calibration services for color-measuring instruments to address commercial and industrial needs for higher-accuracy measurements of displa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841976

164. New Photometer Standards for Low Uncertainty Illuminance Scale Realization
Published: Date unknown
Authors: George P Eppeldauer, Carl C Miller, Yoshihiro Ohno
Abstract: Improved performance photometers have been developed at the National Institute of Standards and Technology (NIST) to utilize the low spectral responsivity uncertainty of spectral irradiance responsivity measurements performed on the facility of Spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841066

165. Optical Metrology for LEDs and Solid State Lighting
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: The performance of Light Emitting Diodes (LEDs), including efficiency, flux level, lifetime, and the variation of color, is advancing at a remarkable pace. LEDs are increasingly used for many applications including automotive, aviation, display, tran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840989

166. Recent Developments in Detector-Based Photometry and Future Needs in Photometry
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: A group of standard photometers are now used to realize, maintain, and transfer the photometric units at the National Institute of Standards and Technology (NIST). The detector-based calibration procedures utilizing standard photometers have been im ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841404

167. Simulation Analysis of White LED Spectra and Color Rendering
Published: Date unknown
Author: Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841816

168. Spectral Matching With an LED-Based Spectrally Tunable Light Source
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, Yoshihiro Ohno
Abstract: A spectrally tunable light source using a large number of LEDs and an integrating sphere has been designed and constructed at the National Institute of Standards and Technology (NIST). The source is designed to have a capability of producing any visi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840970

169. Standardization of LED Measurements Updates
Published: Date unknown
Authors: Carl C Miller, Yoshihiro Ohno
Abstract: The article describes the current LED standards and recommendations. It also discusses the work in Commission Internationale De L Eclairage Technical Committees to form new recommendations for LED measurements of total luminous flux, partial LED flu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841859

170. Toward an Improved Color Rendering Metric
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: Several aspects of the Color Rendering Index (CRI) are flawed, limiting its usefulness in assessing the color rendering capabilities of LEDs for general illumination. At NIST, we are developing recommendations to modify the CRI that would overcome t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840971



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series