NIST logo

Publications Portal

You searched on:
Author: joseph kopanski
Sorted by: title

Displaying records 61 to 70 of 105 records.
Resort by: Date / Title

61. Metrology for Nanosystems and Nanoelectronics Reliability Assessments
Published: 8/20/2012
Authors: Yaw S Obeng, Chukwudi Azubuike Okoro, Joseph J Kopanski
Abstract: The traditional models and techniques for studying reliability in integrated circuits may not be appropriate for nanoelectronics and nanosystems. In this paper, we present an overview of a number of materials and metrology techniques currently un ...

62. Models for Interpreting Measurements Scanning Capacitance Microscope Measurements
Published: 12/31/1997
Authors: Jay F. Marchiando, J R. Lowney, Joseph J Kopanski

63. NIST Accomplishments in Nanotechnology
Series: Special Publication (NIST SP)
Report Number: 1052
Published: 1/1/2006
Authors: Michael T Postek, Joseph J Kopanski, David A Wollman
Abstract: This document includes a list of selected NIST accomplishments in nanotechnology for the period of fiscal years 2004 and 2005.  These accomplishments are grouped into the NNI s Program Component Areas (PCAs), which are defined in the text.   ...

64. New Research in Nanotechnology - Nanotechnology Science and Technology Series
Published: 2/19/2011
Authors: Michael T Postek, Joseph J Kopanski, David A Wollman
Abstract: NIST is developing a broad range of nanometrology (measurements) and nanomanufacturing techniques necessary for the successful commercialization of nanotechnology. This book is a compilation of a number of selected NIST accomplishments in nanotechn ...

65. On calculating scanning capacitance microscopy data for a dopant profile in semiconductors
Published: 2/1/2004
Authors: Jay F. Marchiando, Joseph J Kopanski
Abstract: While the calculating the dopant profile from SCM data (the inverse problem) can be formulated as a regularized nonlinear least-squares optimization problem, wherein Poisson equations are solved within the quasi-static approximation in each iteration ...

66. Oxidation of SiC, in Properties of Silicon Carbide
Published: 12/31/1995
Author: Joseph J Kopanski

67. PSPICE Analysis of a Scanning Capacitance Microscope Sensor
Published: 2/1/2004
Authors: Gyoung Ho Buh, Chi Tran, Joseph J Kopanski

68. PSPICE Analysis of the Scanning Capacitance Microscope Sensor
Published: 4/27/2003
Authors: Gyoung Ho Buh, Chi Tran, Joseph J Kopanski
Abstract: A detailed analysis of the capacitance sensor from a scanning capacitance microscope (SCM) is presented. PSPICE circuit simulations are compared with experimental results. The general behavior of the SCM sensor and practical aspects of the sensor-tun ...

69. Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published: 12/1/1990
Authors: A. van Roggen, L. Yuwono, Hui Zhou, Paul H Meijer, Joseph J Kopanski

70. Practical Metrology Aspects of Scanning Capacitance Microscopy for Silicon 2-D Dopant Profiling, Condensed version
Published: 12/31/1997
Authors: Joseph J Kopanski, Jay F. Marchiando, R. Alvis

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series