NIST logo

Publications Portal

You searched on:
Author: gerald fraser

Displaying records 141 to 150.
Resort by: Date / Title

141. Rotational Spectrum and Structure of the Complex Ar-CH^d3^CN
Published: 1/1/1991
Authors: R S Ford, R D. Suenram, Gerald T Fraser, Francis John Lovas, K R Leopold

142. A Summary of Heat-Flux Sensor Calibration Data
Series: Journal of Research (NIST JRES)
Published: Date unknown
Authors: A V Murthy, Gerald T Fraser, D P DeWitt
Abstract: This paper presents a statistical evaluation of the responsivity data on a number of heat-flux sensors, calibrated using an electrical substitution radiometer as a transfer standard up to 5 W cm-2. The sensors, furnished by the customers, were of ci ...

143. Absolute Flux Calibrations of Stars
Published: Date unknown
Authors: Gerald T Fraser, Steven W Brown, Howard W Yoon, Bettye C Johnson, Keith R Lykke
Abstract: Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega referenced against the Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30 years that offer the potential to impro ...

144. Achieving Satellite Instrument Calibration for Climate Change (ASIC3)
Published: Date unknown
Authors: Gerald T Fraser, Raju Vsnu Datla
Abstract: The Workshop on Achieving Satellite Instrument Calibration for Climate Change (ASIC3) was a follow-up to a 2002 Workshop (Ohring et al., 2004; Ohring et al., 2005) that had developed the measurement requirements for a number of global climate variabl ...

145. In-Cavity Calibration of High Heat-Flux Sensors: Experimental Validation
Published: Date unknown
Authors: A V Murthy, Gerald T Fraser, D P DeWitt
Abstract: This paper deals with the feasibility of performing primary calibration of heat-flux sensors at high irradiance levels by placing inside the cylindrical cavity of a graphite-tube blackbody. The experimental study comprised of measurements on two Sch ...

146. NIST Highlight for Optical Radiation News
Published: Date unknown
Author: Gerald T Fraser
Abstract: Highlights of Optical Technology activities for the CORM biannual newsletter.

147. Rotation-Tunneling Spectrum of Deuterated Ammonia Dimer
Published: Date unknown
Authors: E N Karyakin, Gerald T Fraser, J G Loeser, R J Saykally
Abstract: The millimeter and submillimeter-wave molecular-beam spectrum of the perdeuterated ammonia dimer (ND3)2 has been measured between approximately 50 GHz and 400 GHz using an electric-resonance optothermal spectrometer(EROS). As in the case of the (NH3) ...

148. Spectroscopic Applications Group's Programs
Published: Date unknown
Author: Gerald T Fraser
Abstract: Web pages describing Spectroscopic Applications Group's Programs.

149. Submillimeter and THz Detection of Dimethyl Methyl Phosphonate in Air
Series: NIST Interagency/Internal Report (NISTIR)
Published: Date unknown
Authors: Vyacheslav Borisovich Podobedov, R J Lavrich, T M Korter, Gerald T Fraser, David F Plusquellic, A C Samuels
Abstract: Experimental measurements and theoretical calculations were performed to assess the potential for using continuous-wave submillimeter and THz (far-infrared) linear-absorption spectroscopies to detect chemical-warfare agents in air at ambient temperat ...

150. System-Level Pre-Launch Calibration of Onboard Solar Diffusers
Published: Date unknown
Authors: R Barnes, Steven W Brown, Keith R Lykke, Gerald T Fraser, James J. Butler
Abstract: Onboard diffuse reflecting plaques are carried to orbit as radiometric reference standards for Earth-observing satellite instruments. For many instruments the reflectance properties of the plaque are characterized independent of the instrument, and ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series