NIST logo

Publications Portal

You searched on:
Author: michael fasolka
Sorted by: title

Displaying records 21 to 30 of 66 records.
Resort by: Date / Title


21. Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films
Published: 7/1/2003
Authors: Lori S. Goldner, Michael J Fasolka, S Nougier, H P Nguyen, Garnett W Bryant, Jeeseong Hwang, K D. Weston, Kathryn L Beers, A Urbas, Edwin L Thomas
Abstract: We present measurements of the local dichroism and birefringence of thin film specimens us ing techniques that combine near-field scanning optical microscopy (NSOM) and a novel polarization modulation (PM) polarimetry utilizing Fourier analysis of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841663

22. Generating Thickness Gradients of Thin Polymer Films via Flow Coating
Published: 2/1/2006
Authors: Christopher M Stafford, Kristen Roskov, Thomas Epps, Michael J Fasolka
Abstract: Thickness is a governing factor in the behavior of films and coatings. To enable the high-throughputanalysis of this parameter in polymer systems, we detail the design and operation of a flow coater device for fabricating continuous libraries of pol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852565

23. Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology
Published: 8/1/2005
Authors: D Julthongpiput, Michael J Fasolka, Wenhua Zhang, Tinh T. Nguyen, Eric J. Amis
Abstract: We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852493

24. Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development
Published: 1/1/2005
Authors: Michael J Fasolka, D Julthongpiput, Wenhua Zhang, Alamgir Karim, Eric J. Amis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853967

25. Gradient Reference Specimens for Advanced Scanned Probe Microscopy
Published: 7/1/2004
Authors: D Julthongpiput, Michael J Fasolka, Eric J. Amis
Abstract: Recent years have seen the emergence of a new generation of SPM techniques, which intend to measure chemical, mechanical, and electro/optical properties on the nanoscale. Currently, these techniques provide qualitative (or semi-quantitative) data, o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852335

26. Gradient Reference Surfaces for Scanning Probe Microscopy
Published: 1/1/2004
Authors: Michael J Fasolka, D Julthongpiput, Kimberly A Briggman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853922

27. Gradient Solvent Vapor Annealing of Block Copolymer Thin Films Using a Microfluidic Mixing Device
Published: 2/9/2011
Authors: Kathryn L Beers, Michael J Fasolka, Julie N. L. Albert, Timothy D. Bogart, Ronald L. Lewis, J. Brian Hutchison, Bryan D. Vogt, Thomas H Epps
Abstract: Solvent vapor annealing (SVA) with solvent mixtures is a promising approach for controlling block copolymer thin film self-assembly. In this work, we present the design and fabrication of a solvent-resistant microfluidic mixing device to produce dis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907784

28. Gradient and Microfluidic Library Approaches to Polymer Interfaces
Published: 1/1/2010
Authors: Michael J Fasolka, Christopher M Stafford, Kathryn L Beers
Abstract: We present and overview of research conducted at the National Institute of Standards and Technology aimed at developing combinatorial and high throughput measurement approaches to polymer surfaces, interfaces and thin films. Topics include, 1) the g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901433

29. High Throughput Measurement of the Elastic Modulus of Polymer Thin Films
Published: 2/1/2004
Authors: Christopher M Stafford, A Chiche, D Julthongpiput, Michael J Fasolka
Abstract: Combinatorial and High Throughput (C&HT) methods combine clever experiment design, instrument automation, and computing tools to form a new paradigm for scientific research. Given this premise, the C&HT concept is being adapted to study problems in m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852342

30. High throughput adhesion testing using a modified edge lift-off test
Published: 2/17/2008
Authors: Jiong Liu, Martin Y Chiang, Michael J Fasolka, Christopher M Stafford
Abstract: The strength of an adhesively bonded joint depends on a host of factors such as surface treatment, roughness, materials properties, cure conditions and environmental variables. Therefore testing of adhesion within this large parameter space can be v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854488



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series