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You searched on: Author: michael fasolka Sorted by: title

Displaying records 21 to 30 of 67 records.
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21. Fourier Analysis Near-Field Polarimetry for Measurement of Local Optical Properties of Thin Films
Published: 7/1/2003
Authors: Lori S. Goldner, Michael J Fasolka, S Nougier, H P Nguyen, Garnett W Bryant, Jeeseong Hwang, K D. Weston, Kathryn L Beers, A Urbas, Edwin L Thomas
Abstract: We present measurements of the local dichroism and birefringence of thin film specimens us ing techniques that combine near-field scanning optical microscopy (NSOM) and a novel polarization modulation (PM) polarimetry utilizing Fourier analysis of th ...

22. Generating Thickness Gradients of Thin Polymer Films via Flow Coating
Published: 2/1/2006
Authors: Christopher M Stafford, Kristen Roskov, Thomas Epps, Michael J Fasolka
Abstract: Thickness is a governing factor in the behavior of films and coatings. To enable the high-throughputanalysis of this parameter in polymer systems, we detail the design and operation of a flow coater device for fabricating continuous libraries of pol ...

23. Gradient Chemical Micropatterns: A Reference Substrate for Surface Nanometrology
Published: 8/1/2005
Authors: D Julthongpiput, Michael J Fasolka, Wenhua Zhang, Tinh Nguyen, Eric J. Amis
Abstract: We present fabrication routes for a new type of surface specimen that exhibits a micropattern with a gradient in chemical contrast between the pattern domains. Design elements in the specimen allow chemical contrast in the micropattern to be related ...

24. Gradient Micropatterns for Surface Nanometrology and Thin Nanomaterials Development
Published: 1/1/2005
Authors: Michael J Fasolka, D Julthongpiput, Wenhua Zhang, Alamgir Karim, Eric J. Amis

25. Gradient Reference Specimens for Advanced Scanned Probe Microscopy
Published: 7/1/2004
Authors: D Julthongpiput, Michael J Fasolka, Eric J. Amis
Abstract: Recent years have seen the emergence of a new generation of SPM techniques, which intend to measure chemical, mechanical, and electro/optical properties on the nanoscale. Currently, these techniques provide qualitative (or semi-quantitative) data, o ...

26. Gradient Reference Surfaces for Scanning Probe Microscopy
Published: 1/1/2004
Authors: Michael J Fasolka, D Julthongpiput, Kimberly A Briggman

27. Gradient Solvent Vapor Annealing of Block Copolymer Thin Films Using a Microfluidic Mixing Device
Published: 2/9/2011
Authors: Kathryn L Beers, Michael J Fasolka, Julie N. L. Albert, Timothy D. Bogart, Ronald L. Lewis, J. Brian Hutchison, Bryan D. Vogt, Thomas H Epps
Abstract: Solvent vapor annealing (SVA) with solvent mixtures is a promising approach for controlling block copolymer thin film self-assembly. In this work, we present the design and fabrication of a solvent-resistant microfluidic mixing device to produce dis ...

28. Gradient and Microfluidic Library Approaches to Polymer Interfaces
Published: 1/1/2010
Authors: Michael J Fasolka, Christopher M Stafford, Kathryn L Beers
Abstract: We present and overview of research conducted at the National Institute of Standards and Technology aimed at developing combinatorial and high throughput measurement approaches to polymer surfaces, interfaces and thin films. Topics include, 1) the g ...

29. High Throughput Measurement of the Elastic Modulus of Polymer Thin Films
Published: 2/1/2004
Authors: Christopher M Stafford, A Chiche, D Julthongpiput, Michael J Fasolka
Abstract: Combinatorial and High Throughput (C&HT) methods combine clever experiment design, instrument automation, and computing tools to form a new paradigm for scientific research. Given this premise, the C&HT concept is being adapted to study problems in m ...

30. High throughput adhesion testing using a modified edge lift-off test
Published: 2/17/2008
Authors: Jiong Liu, Martin Y Chiang, Michael J Fasolka, Christopher M Stafford
Abstract: The strength of an adhesively bonded joint depends on a host of factors such as surface treatment, roughness, materials properties, cure conditions and environmental variables. Therefore testing of adhesion within this large parameter space can be v ...

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