Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: xiaoyu zheng

Displaying records 21 to 27.
Resort by: Date / Title

Published: 9/6/2009
Authors: Jun-Feng Song, Samuel Rea Low III, Xiaoyu A Zheng
Abstract: In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration of Rockwell diamond indenters has been a key issue for Rockwell hardness standardization ...

22. Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust
Published: 4/12/2009
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Thomas B Renegar, Xiaoyu A Zheng, Theodore Vincent Vorburger, Albert M. Hilton, Marc J Cangemi, Lei Chen, Michael A. Hernandez, Russell E Hajdaj, Michael R Bishop, Aaron Cordes
Abstract: In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) ‹ a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab ‹ a 1765 m2 (19,000 ft2) cl ...

23. NIST Microform Calibration System for Rockwell Hardness Standardization
Published: 8/25/2008
Authors: Jun-Feng Song, Samuel Rea Low III, Xiaoyu A Zheng
Abstract: In the uncertainty budget of Rockwell hardness tests, microform geometric errors of the diamond indenter are a major contributor. The microform calibration of Rockwell diamond indenters has been one of the key steps for Rockwell hardness standardiza ...

24. Topography Measurements for Determining the Decay Factors in Surface Replication
Published: 7/4/2008
Authors: Jun-Feng Song, P Rubert, Xiaoyu A Zheng, Theodore Vincent Vorburger
Abstract: The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwide ballistics measurement traceability and measurement q ...

25. Surface Topography Analysis for a Feasibility Assessment of a National Ballistics Imaging Database
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7362
Published: 5/1/2007
Authors: Theodore Vincent Vorburger, James H Yen, B Bachrach, Thomas B Renegar, Li Ma, Hyug-Gyo Rhee, Xiaoyu A Zheng, Jun-Feng Song, Charles Dewey Foreman
Abstract: This document reports on a study to determine the feasibility and utility of a national ballistics database of casing and bullet images. The purpose of such a proposed database would be to provide a reference collection of ballistic images against ...

26. Comparison of Optical and Stylus Methods for Measurement of Rough Surfaces
Published: 1/1/2007
Authors: Theodore Vincent Vorburger, H G Rhee, Thomas B Renegar, Jun-Feng Song, Xiaoyu A Zheng
Abstract: Abstract Optical methods are increasingly used for measurement of surface texture, particularly for areal measurements where the optical methods are generally faster. A new Working Group under Technical Committee (TC) 213 in the International Organiz ...

27. Correlation of Topography Measurements of NIST SRM 2460 Standard Bullets by Four Techniques
Published: 1/1/2006
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Thomas B Renegar, Xiaoyu A Zheng, Hyug-Gyo Rhee, John M Libert, Li Ma, K Bogart, Susan M Ballou, B Bachrach
Abstract: Three optical instruments including an interferometric microscope, a Nipkow disk confocal microscope and a laser scanning confocal microscope are used for the measurements of bullet profile signatures of a National Institute of Standards and Technolo ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series