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You searched on: Author: nien zhang

Displaying records 61 to 70 of 72 records.
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61. Blind Men and Elephants: Six Approaches to TREC Data
Published: 10/28/1998
Authors: D L. Banks, Paul Douglas Over, Nien F Zhang
Abstract: The paper reviews six recent efforts to better understand performance measurements on information retrieval (IR) within the framework of the Text REtrieval Conferences (TREC): analysis of variance, cluster analyses, rank correlations, beadplots, mil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151743

62. Thermal Characterization of a Cryogenic Radiometer and Comparison with a Laser Calorimeter
Published: 10/1/1998
Authors: David J Livigni, Christopher L. Cromer, Thomas Scott, T J. Johnson, Nien F Zhang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21928

63. Statistical Measure for the Sharpness of the SEM Image
Published: 7/1/1997
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820884

64. Thermal Modeling and Analysis of Laser Calorimeters
Published: 6/1/1996
Authors: Nien F Zhang, David J Livigni, Richard D. Jones, Thomas Scott
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10767

65. New Algorithm for the Measurement of Pitch in Metrology Instruments
Published: 5/1/1996
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee, L Carroll, William J. Keery
Abstract: Traditionally, the measurement of pitch in metrology instruments is thought to be a benign self-compensating function. However, as the measurement uncertainty of metrology instruments is pushed to the nanometer level, evaluation of the performance of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820831

66. Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments
Published: 1/1/1996
Authors: Nien F Zhang, Michael T Postek, Robert D. Larrabee
Abstract: The measurement of pitch in metrology instruments is through to be a benign self-compensating function. In the course of issuing the new scanning electron microscope standard SRM 2090, a new algorithm for the measurement of pitch was developed. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820885

67. Thermal Modeling and Analysis of Laser Calorimeters
Published: 8/1/1995
Authors: Nien F Zhang, David J Livigni, Richard D. Jones, Thomas Scott
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10106

68. Effects of Using Generalized Moving Averages of Stationary Process Data and Their Applications
Published: Date unknown
Author: Nien F Zhang
Abstract: Due to the high frequency sampling of on-line data acquisition systems, most of the on-line data are auto correlated. The autocorrelation of the process data has impacts on the applications of statistical analysis methodologies since the assumption ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151742

69. Estimating the Variance of the Graybill-Deal Estimator of a Common Mean
Published: Date unknown
Author: Nien F Zhang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151789

70. On-Line Process Control
Published: Date unknown
Authors: Raghu N Kacker, Nien F Zhang
Abstract: The natural state of manufacturing and measurement processes is usually nonstationary. The methods of statistical process control (SPC) are therefore inappropriate for on-line control. This paper provides a simple and generic protocol for on-line c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151736



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