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You searched on: Author: nien zhang

Displaying records 11 to 20 of 71 records.
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11. Statistical Analysis for Interlaboratory Comparisons with Linear Trends in Multiple Loops
Published: 4/24/2012
Author: Nien F Zhang
Abstract: A statistical analysis for interlaboratory comparisons with linear trends in multiple loops is proposed. This approach can be applied to comparisons with multiple artifacts in multiple loops. The uncertainties for the comparisons reference values and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910458

12. A Bayesian Statistical Model for Hybrid Metrology to Improve Measurement Accuracy
Published: 7/31/2011
Authors: Richard M Silver, Nien F Zhang, Bryan M Barnes, Jing Qin, Hui Zhou, Ronald G Dixson
Abstract: We present a method to combine measurements from different techniques that reduces uncertainties and can improve measurement throughput. The approach directly integrates the measurement analysis of multiple techniques that can include different conf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908377

13. Nested Uncertainties and Hybrid Metrology to Improve Measurement Accuracy
Published: 4/18/2011
Authors: Richard M Silver, Nien F Zhang, Bryan M Barnes, Hui Zhou, Jing Qin, Ronald G Dixson
Abstract: In this paper we present a method to combine measurement techniques that reduce uncertainties and improve measurement throughput. The approach has immediate utility when performing model-based optical critical dimension measurements. When modeling ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908290

14. Linking the Results of CIPM and RMO Key Comparisons with Linear Trends
Series: Journal of Research (NIST JRES)
Published: 6/30/2010
Author: Nien F Zhang
Abstract: A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparisons have the same nominal values or of a same magnitude. The degrees of equivalence be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902845

15. Certification of Drugs of Abuse in a Human Serum Standard Reference Material: SRM 1959
Published: 3/24/2010
Authors: Susan Shu Cheng Tai, Jocelyn L. Prendergast, Lorna Tregoning Sniegoski, Michael James Welch, Karen W Phinney, Nien F Zhang
Abstract: A new Standard Reference Material (SRM) for drugs of abuse in human serum (SRM 1959) has been developed. SRM 1959 is a frozen human serum material fortified with seven drugs of abuse, benzoylecgonine (BZE), methadone (METH), methamphetamine (MAM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832392

16. Comparisons of Estimators of process standard deviation in constructing Shewhart control charts with unequal subgroup sizes
Published: 1/20/2010
Authors: Nien F Zhang, P Winkel
Abstract: The and control charts with unequal subgroup size have been discussed in the literature and used in practice. Several estimators of the process standard deviation based on sample standard deviations have been proposed in constructing the charts. We d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51243

17. Angle-resolved Optical Metrology using Multi-Technique Nested Uncertainties
Published: 8/15/2009
Authors: Richard M Silver, Bryan M Barnes, Hui Zhou, Nien F Zhang, Ronald G Dixson
Abstract: This paper introduces recent advances in scatterfield microscopy using improved normalization and fitting procedures. Reduced measurement uncertainties are obtained through the use of more accurate normalization procedures in combination with better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902735

18. A generalized method for multiple artifacts problem in interlaboratory comparisons with linear trends
Published: 5/22/2009
Authors: Weiping Zhang, Nien F Zhang
Abstract: A generalized statistical approach for interlaboratory comparisons with linear trends is proposed. This new approach can be applied to the general case when the artifacts are measured and reported multiple times in each participating laboratory. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=890065

19. Three Statistical Paradigms for the Assessment and Interpretation of Measurement Uncertainty
Published: 1/12/2009
Authors: William F Guthrie, Hung-Kung Liu, Andrew L Rukhin, Blaza Toman, Chih-Ming Wang, Nien F Zhang
Abstract: The goals of this chapter are to present different approaches to uncertainty assessment from a statistical point of view and to relate them to the methods that are currently being used in metrology or are being developed within the metrology communit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51273

20. SIM Comparison of DC Resistance Standards at 1 {Omega}, 1 M{Omega}, and 1 G{Omega}
Published: 1/1/2009
Authors: Dean G Jarrett, Randolph E Elmquist, Nien F Zhang, Alejandra Tonina, M Porfiri, Janice Fernandes, H Schechter, Daniel Izquierdo, C Faverio, Daniel Slomovitz, Dave Inglis, Kai Wendler, Felipe Hernandez-Marquez, B Rodriguez
Abstract: A set of regional comparisons of dc resistance standards at the nominal values of 1 {Omega}, 1 M {Omega}, and 1 G {Omega} has recently been completed in the Sistema Interamericano de Metrogia (SIM) region. The motivation, design, standards, and resu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33141



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