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You searched on: Author: nien zhang

Displaying records 11 to 20 of 68 records.
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11. Linking the Results of CIPM and RMO Key Comparisons with Linear Trends
Series: Journal of Research (NIST JRES)
Published: 6/30/2010
Author: Nien F Zhang
Abstract: A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparisons have the same nominal values or of a same magnitude. The degrees of equivalence be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902845

12. Certification of Drugs of Abuse in a Human Serum Standard Reference Material: SRM 1959
Published: 3/24/2010
Authors: Susan Shu Cheng Tai, Jocelyn L. Prendergast, Lorna Tregoning Sniegoski, Michael James Welch, Karen W Phinney, Nien F Zhang
Abstract: A new Standard Reference Material (SRM) for drugs of abuse in human serum (SRM 1959) has been developed. SRM 1959 is a frozen human serum material fortified with seven drugs of abuse, benzoylecgonine (BZE), methadone (METH), methamphetamine (MAM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832392

13. Comparisons of Estimators of process standard deviation in constructing Shewhart control charts with unequal subgroup sizes
Published: 1/20/2010
Authors: Nien F Zhang, P Winkel
Abstract: The and control charts with unequal subgroup size have been discussed in the literature and used in practice. Several estimators of the process standard deviation based on sample standard deviations have been proposed in constructing the charts. We d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51243

14. Angle-resolved Optical Metrology using Multi-Technique Nested Uncertainties
Published: 8/15/2009
Authors: Richard M Silver, Bryan M Barnes, Hui H. Zhou, Nien F Zhang, Ronald G Dixson
Abstract: This paper introduces recent advances in scatterfield microscopy using improved normalization and fitting procedures. Reduced measurement uncertainties are obtained through the use of more accurate normalization procedures in combination with better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902735

15. A generalized method for multiple artifacts problem in interlaboratory comparisons with linear trends
Published: 5/22/2009
Authors: Weiping Zhang, Nien F Zhang
Abstract: A generalized statistical approach for interlaboratory comparisons with linear trends is proposed. This new approach can be applied to the general case when the artifacts are measured and reported multiple times in each participating laboratory. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=890065

16. Three Statistical Paradigms for The Assessment and Interpretation of Measurement Uncertainty
Published: 1/12/2009
Authors: William F Guthrie, Hung-Kung Liu, Andrew L Rukhin, Blaza Toman, Chih-Ming Wang, Nien F Zhang
Abstract: The goals of this chapter are to present different approaches to uncertainty assessment from a statistical point of view and to relate them to the methods that are currently being used in metrology or are being developed within the metrology communit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51273

17. SIM Comparison of DC Resistance Standards at 1 {Omega}, 1 M{Omega}, and 1 G{Omega}
Published: 1/1/2009
Authors: Dean G Jarrett, Randolph E Elmquist, Nien F Zhang, Alejandra Tonina, M Porfiri, Janice Fernandes, H Schechter, Daniel Izquierdo, C Faverio, Daniel Slomovitz, Dave Inglis, Kai Wendler, Felipe Hernandez-Marquez, B Rodriguez
Abstract: A set of regional comparisons of dc resistance standards at the nominal values of 1 {Omega}, 1 M {Omega}, and 1 G {Omega} has recently been completed in the Sistema Interamericano de Metrogia (SIM) region. The motivation, design, standards, and resu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33141

18. SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT
Published: 1/1/2009
Authors: Randolph E Elmquist, Dean G Jarrett, Nien F Zhang
Abstract: 2006 - 2007 Resistance standards comparison between SIM Laboratories Pilot Laboratory: National Institute of Standards and Technology, Gaithersburg, MD, USA. Revised March 2008.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33025

19. Allan Variance of Time Series Models of Measurement Data
Published: 9/22/2008
Author: Nien F Zhang
Abstract: The uncertainty of the mean of autocorrelated measurements from a stationary process has been discussed in the literature. However, when the measurements are from a non-stationary process, how to assess their uncertainty remains unresolved. Allan v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152041

20. Does the Angle of a Fingerprint Scanner Affect User Performance?
Published: 9/22/2008
Authors: Mary Frances Theofanos, Ross J Micheals, Shahram Orandi, Brian C Stanton, Nien F Zhang, Charles L Sheppard
Abstract: As the deployment of biometric technologies such as fingerprints has become more widespread in government applications there is an increased awareness of the human-computer interaction that such technologies involve. User behavior can impact operatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51336



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