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You searched on: Author: john woodward iv

Displaying records 11 to 20 of 52 records.
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11. Space-based photometric precision from ground-based telescopes
Published: 7/1/2010
Authors: Peter C Zimmer, John T McGraw, Anthony B Hull, Daniel C Zirzow, Steven W Brown, Claire Elizabeth Cramer, Gerald T Fraser, Keith R. Lykke, Allan W. Smith, John Taylor Woodward IV, Christopher W Stubbs, Mark R Ackermann, Dean C Hines
Abstract: Ground-based telescopes supported by lidar and spectrophotometric auxiliary instrumentation can attain space-based precision for all-sky photometry, with uncertainties dominated by fundamental photon counting statistics. Earth‟s atmosphere is a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906522

12. Internal quantum efficiency modeling of silicon photodiodes
Published: 4/1/2010
Authors: Thomas R Gentile, Steven W Brown, Keith R. Lykke, Ping-Shine Shaw, John Taylor Woodward IV
Abstract: Results are presented for modeling of the internal quantum efficiency (IQE) of silicon photodiodes in the 400 nm to 900 nm wavelength range. The IQE data are based on measurements of the external quantum efficiencies of three transmission trap detec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904680

13. Hyperspectral Imager Characterization and Calibration
Published: 12/1/2009
Authors: John Taylor Woodward IV, Steven W Brown, Allan W. Smith, Keith R. Lykke
Abstract: Current radiometric calibration standards, specifically blackbody and lamp-based optical radiation sources, produce spatially, spectrally, and temporally simple scenes. Hyperspectral imaging instruments, which in-practice view spatially, spectrally, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903023

14. Multimodal, Nanoscale, Hyperspectral Imaging Demonstrated on Heterostructures of Quantum Dots and DNA-Wrapped Single-Wall Carbon Nanotubes
Published: 10/21/2009
Authors: Hyeong G. Kang, Matthew Lawrence Clarke, Jianyong Tang, John Taylor Woodward IV, Shin G. Chou, Zhenping Zhou, Angela R Hight Walker, Tinh Nguyen, Jeeseong Hwang
Abstract: A multimodality imaging technique integrating atomic force, polarized Raman, and fluorescence lifetime microscopy and a 2D autocorrelation image analysis is applied to study the properties of a mesoscopic heterostucture of nanoscale materials. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902938

15. Mechanism of Formation of Vesicle Fused Phospholipid Monolayers on Alkanethiol Self-Assembled Monolayer Supports
Published: 6/15/2009
Authors: John Taylor Woodward IV, Curtis W Meuse
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830453

16. Absolute Flux Calibration of Stars; Calibration of the Reference Telescope
Published: 6/2/2009
Authors: Allan W. Smith, John Taylor Woodward IV, Colleen Alana Jenkins, Steven W Brown, Keith R. Lykke
Abstract: Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega with instruments calibrated using the Planckian radiance from a Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900900

17. Supercontinuum Sources for Metrology
Published: 6/2/2009
Authors: John Taylor Woodward IV, Allan W. Smith, Colleen Alana Jenkins, Chungsan Lin, Steven W Brown, Keith R. Lykke
Abstract: Supercontinuum (SC) sources are novel laser-based sources that generate a broad, white-light continuum in single mode photonic crystal fibers. Currently, up to 6 W of optical power is available, spanning the spectral range from 460 nm to 2500 nm. A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900202

18. Characterization of the Latent Image to Developed Image in Model EUV Photoresists
Published: 2/22/2008
Authors: John Taylor Woodward IV, Kwang-Woo Choi, Vivek M Prabhu, Shuhui Kang, Kristopher Lavery, Wen-Li Wu, Michael Leeson, Anuja De Silva, Nelson Felix, Christopher K. Ober
Abstract: Current extreme ultraviolet (EUV) photoresist materials do not yet meet exposure-dose sensitivity, line-width roughness, and resolution requirements. In order to quantify how trade-offs are related to the materials properties of the resist and proc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853583

19. Component Segregation in Model Chemically Amplified Resists
Published: 3/15/2007
Authors: John Taylor Woodward IV, Theodore Fedynyshyn, David Astolfi, Susan Cann, Michael Leeson
Abstract: We have applied chemical force microscopy (CFM) to probe the chemical segregation of resist materials. CFM is capable of providing simultaneous information about surface topography and chemical heterogeneity of partiallt developed resist films. We ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841082

20. Molecular-scale structural and functional characterization of sparsely tethered bilayer lipid membranes
Published: 3/1/2007
Authors: Duncan J. McGillivray, Gintaras Valincius, David J. Vanderah, W. Febo-Ayala, John Taylor Woodward IV, Frank Heinrich, John J Kasianowicz, Mathias Losche
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906578



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