NIST logo

Publications Portal

You searched on: Author: winnie wong-ng

Displaying records 11 to 20 of 156 records.
Resort by: Date / Title


11. High Resolution Reference X-ray Diffraction Pattern for Bis(2-methylimidazolyl)-Zinc, C8H10N4Zn (ZIF-8)
Published: 4/24/2011
Authors: Winnie K Wong-Ng, James A Kaduk, Laura Espinal, Matthew Suchomel, Andrew John Allen
Abstract: The family of zeolitic imidazolate framework (ZIF) compounds are efficient sorbent materials that can be used for catalytic, ion exchange, gas storage and gas separation applications. A high resolution reference x-ray powder diffraction pattern for o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906156

12. On the Design of High Efficiency Thermoelectric Type I Clathrates through Transition Metal Doping
Published: 4/14/2010
Authors: Winnie K Wong-Ng, X Shi, Joing Yang, S Bai, Jihui Yang, Hsin Wang, James Salvador, W Zhang, L Chen
Abstract: We have developed a scheme for improving the thermoelectric properties of type I Ba8Ga16Ge30 clathrates by doping transition metals, TM, on the Ga sites. TM doping introduces charge distortion and lattice defects into the materials which increases t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902384

13. Phase Compatibility of the Thermoelectric Compounds in the Sr-Ca-Co-O System
Published: 4/14/2010
Authors: Winnie K Wong-Ng, Guangyao Liu, Joshua Brooks Martin, Evan L. Thomas, Nathan Lowhorn, James A. Kaduk
Abstract: Two low-dimensional cobaltite series in the Sr-Ca-Co-O system have been investigated for their solid solution limit, structure, and compatibility phase relationships (850 deg C in air). Thermoelectric properties have been measured for selected member ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903156

14. The 2009 Material Research Society (MRS) Spring Meeting Report
Published: 12/31/2009
Author: Winnie K Wong-Ng
Abstract: The 2009 Materials Research Society (MRS) Spring Meeting took place in San Francisco Moscone Center from April 13 through 17. This large-scale meeting included forty-one technical symposia, nine symposium tutorials, three poster sessions, a popular S ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903921

15. RECENT INVESTIGATIONS OF Sr-Ca-Co-O THERMOELECTRIC MATERIALS
Published: 12/21/2009
Authors: Winnie K Wong-Ng, Guangyao Liu, Makoto Otani, Evan L. Thomas, Nathan Lowhorn, Martin L Green, James A. Kaduk
Abstract: Three low-dimension cobaltites in the Sr-Ca-Co-O system have been studied for their structure and thermoelectric properties. Using x-ray pole figure construction technique, a Ca3Co4O9 thin film showed excellent fiber texture but no ab in-plane textur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901376

16. Reference X-ray Powder Diffraction Pattern of a New High-Pressure Phase, CaCo2O4
Published: 12/17/2009
Authors: Winnie K Wong-Ng, James A Kaduk, Masaaki Isobe
Abstract: Research in new cobaltites is important for waste heat recovery applications. A new calcium cobaltite phase, CaCo2O4, prepared under high pressure, has been reported recently to have a large Seebeck coefficient. This paper reports the reference x-ray ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902371

17. Enhanced Mass Transport in Ultra-Rapidly-Heated Ni/Si Thin-Film Multilayers
Published: 11/15/2009
Authors: Lawrence P. Cook, Richard E Cavicchi, Nabil Bassim, Susie Eustis, Winnie K Wong-Ng, Igor Levin, Ursula R Kattner, Carelyn E Campbell, Christopher B Montgomery, William F. Egelhoff Jr., Mark D Vaudin
Abstract: We have investigated multilayer and bilayer Ni/Si thin films by nano-differential scanning calorimetry (DSC) at ultra rapid scan rates, in a temperature-time regime not accessible with conventional apparatus. DSC experiments were completed at slower ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900235

18. Development of a Seebeck Coefficient Standard Reference Material
Published: 8/7/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Evan L. Thomas, Makoto Otani, Martin L Green, Neil Dilley, Jeffrey Sharp, Thanh N. Tran
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854458

19. Thermoelectric and Structural Characterization of Ba2Ho(Cu3-xCox)O6+y
Published: 6/13/2009
Authors: Winnie K Wong-Ng, Z Yang, Y F Hu, Qingzhen Huang, Nathan Lowhorn, Makoto Otani, James A Kaduk, Martin L Green, Q Li
Abstract: The search for thermoelectric materials for power generation and for solid-state cooling have led to the increased interest of layered cobalt-containing oxides because of their thermal stability at high temperature and their desirable thermoelectric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851090

20. A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach
Published: 5/7/2009
Authors: Makoto Otani, Evan L. Thomas, Winnie K Wong-Ng, Peter K. Schenck, Nathan Lowhorn, Martin L Green, Hiroyuki Ohguchi
Abstract: A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two property screening devices, developed at NIST, was used for thermoelectric material exploration. The thermoelectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854167



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series