You searched on: Author: dylan williams
Displaying records 21 to 30 of 180 records.
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21. Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework
Jeffrey A Jargon, Uwe Arz, Dylan F Williams
We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framew ...
22. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...
23. Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture
Dylan F Williams, Mohammad Tayeb Ghasr, Bradley K Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M Weikle, Reza Zoughi
We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with o ...
24. Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Chih-Ming Wang, Jeffrey A Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-op ...
25. Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework
Jeffrey A Jargon, Dylan F Williams, Thomas M Wallis, Denis X. LeGolvan, Paul D Hale
We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Mi ...
26. A statistical study of de-embedding applied to eye diagram analysis
Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
27. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Dylan F Williams
We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
28. 500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
Dylan F Williams
We develop an uncertainty analysis that captures the dominant sources of measurement error in
state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency
range 500 GHz ‹ 750 GHz. We use the analysis to assess th ...
29. On-Chip Security Using Electromagnetic Analysis
Grant/Contract Reports (NISTGCR)
James Schaffner, Dylan F Williams
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...
30. Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations
Dylan F Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and ...