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You searched on: Author: dylan williams

Displaying records 21 to 30 of 172 records.
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21. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...

22. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...

23. 500 GHz ‹ 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
Published: 10/31/2011
Author: Dylan F Williams
Abstract: We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz ‹ 750 GHz. We use the analysis to assess th ...

24. On-Chip Security Using Electromagnetic Analysis
Series: Grant/Contract Reports (NISTGCR)
Report Number: 687-12-71
Published: 10/27/2011
Authors: James Schaffner, Dylan F Williams
Abstract: In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...

25. Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations
Published: 10/10/2011
Authors: Dylan F Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
Abstract: We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and ...

26. Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements
Published: 9/28/2010
Authors: Arkadiusz C. Lewandowski, Dylan F Williams, Wojciech Wiatr
Abstract: We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm t ...

27. Use of Electronic Calibration Units for Vector-Network-Analyzer Verification
Published: 7/30/2010
Authors: Dylan F Williams, Arkadiusz C. Lewandowski, Denis X. (Denis Xavier) LeGolvan, Ronald A Ginley, Chih-Ming Wang, Jolene D Splett
Abstract: We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network ...

28. A New Electronic Verification Method for Vector Network Analyzers
Published: 6/13/2010
Authors: Ronald A Ginley, Dylan F Williams, Denis X. (Denis Xavier) LeGolvan
Abstract: The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several ma ...

29. Covariance-Based Vector-Network-Analyzer Uncertainty Analysis for Time- and Frequency-Domain Measurements
Published: 6/10/2010
Authors: Arkadiusz C. Lewandowski, Dylan F Williams, Paul D Hale, Chih-Ming Wang, Andrew M Dienstfrey
Abstract: We develop a covariance-matrix-based uncertainty analysis for vector-network-analyzer scattering-parameter measurements. The covariance matrix captures all of the measurement uncertainties and statistical correlations between them. This allows the un ...

30. Identifying RF Identification Cards from Measurements of Resonance and Carrier Harmonics
Published: 5/27/2010
Authors: Henry Romero, Catherine A Remley, Dylan F Williams, Chih-Ming Wang, Timothy X. Brown
Abstract: We show that careful measurements of the unloaded resonant frequency and quality factor of radio frequency identification proximity cards allow identification of different card models and, for the set of cards we studied, identification with mini ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
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  • SP 823-XX: Integrated Services Digital Network Series