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You searched on: Author: dylan williams

Displaying records 21 to 30 of 180 records.
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21. Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework
Published: 11/30/2012
Authors: Jeffrey A Jargon, Uwe Arz, Dylan F Williams
Abstract: We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framew ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912557

22. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Published: 10/1/2012
Authors: Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
Abstract: We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909866

23. Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture
Published: 8/1/2012
Authors: Dylan F Williams, Mohammad Tayeb Ghasr, Bradley K Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M Weikle, Reza Zoughi
Abstract: We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908621

24. Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Published: 7/6/2012
Authors: Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Chih-Ming Wang, Jeffrey A Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Abstract: Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-op ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910633

25. Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework
Published: 6/22/2012
Authors: Jeffrey A Jargon, Dylan F Williams, Thomas M Wallis, Denis X. LeGolvan, Paul D Hale
Abstract: We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910883

26. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

27. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909155

28. 500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
Published: 10/31/2011
Author: Dylan F Williams
Abstract: We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz ‹ 750 GHz. We use the analysis to assess th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907216

29. On-Chip Security Using Electromagnetic Analysis
Series: Grant/Contract Reports (NISTGCR)
Report Number: 687-12-71
Published: 10/27/2011
Authors: James Schaffner, Dylan F Williams
Abstract: In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910062

30. Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations
Published: 10/10/2011
Authors: Dylan F Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
Abstract: We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907946



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series