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You searched on: Author: dylan williams

Displaying records 141 to 150 of 157 records.
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141. Comments on 'Characterization of Resistive Transmission Lines by Short-Pulse Propagation'
Published: 8/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3034

142. Complex Permittivity Measurements of Gallium Arsenide Using a High-Precision Resonant Cavity
Published: 6/1/1992
Authors: E. J. Vanzura, Claude Weil, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9451

143. Traceability for On-Wafer MMIC Measurements
Published: 6/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19412

144. Verification of Scattering Parameter Measurements
Published: 6/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27632

145. Frequency-Dependent Transmission Line Parameters
Published: 4/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23193

146. Benchmark for the Verification of Microwave CAD Software
Published: 12/1/1991
Authors: R. Furlow, R. Y. Shimoda, Dylan F Williams, Roger Marks, Kuldip Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12768

147. Comparison of On-Wafer Calibrations
Published: 12/1/1991
Authors: Dylan F Williams, Roger Marks, A. Davidson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25109

148. Reciprocity Relations for On-Wafer Power Measurements
Published: 12/1/1991
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24571

149. Transmission Line Capacitance Measurement
Published: 9/1/1991
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18478

150. Characteristic Impedance Determination Using Propagation Constant Measurement
Published: 6/1/1991
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8175



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