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Author: dylan williams

Displaying records 141 to 150 of 156 records.
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141. Complex Permittivity Measurements of Gallium Arsenide Using a High-Precision Resonant Cavity
Published: 6/1/1992
Authors: E. J. Vanzura, Claude Weil, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9451

142. Traceability for On-Wafer MMIC Measurements
Published: 6/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19412

143. Verification of Scattering Parameter Measurements
Published: 6/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27632

144. Frequency-Dependent Transmission Line Parameters
Published: 4/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23193

145. Benchmark for the Verification of Microwave CAD Software
Published: 12/1/1991
Authors: R. Furlow, R. Y. Shimoda, Dylan F Williams, Roger Marks, Kuldip Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12768

146. Comparison of On-Wafer Calibrations
Published: 12/1/1991
Authors: Dylan F Williams, Roger Marks, A. Davidson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25109

147. Reciprocity Relations for On-Wafer Power Measurements
Published: 12/1/1991
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24571

148. Transmission Line Capacitance Measurement
Published: 9/1/1991
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18478

149. Characteristic Impedance Determination Using Propagation Constant Measurement
Published: 6/1/1991
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8175

150. Translate LRL and LRM Calibrations
Published: 2/1/1991
Authors: Dylan F Williams, Roger Marks, K. R. Phillips
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18606



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