NIST logo

Publications Portal

You searched on:
Author: dylan williams

Displaying records 141 to 149.
Resort by: Date / Title

141. Transmission Line Capacitance Measurement
Published: 9/1/1991
Authors: Dylan F Williams, Roger Marks

142. Characteristic Impedance Determination Using Propagation Constant Measurement
Published: 6/1/1991
Authors: Roger Marks, Dylan F Williams

143. Translate LRL and LRM Calibrations
Published: 2/1/1991
Authors: Dylan F Williams, Roger Marks, K. R. Phillips

144. MMIC Package Characterization with Active Loads
Published: 11/1/1990
Authors: K. R. Phillips, Dylan F Williams

145. Progress Toward MMIC On-Wafer Standards
Published: 11/1/1990
Authors: Dylan F Williams, Roger Marks, K. R. Phillips, T. Miers

146. The Interpretation and Use of S-Parameters in Lossy Lines
Published: 11/1/1990
Authors: Dylan F Williams, Roger Marks

147. Development of On-Wafer Microwave Standards at NIST
Published: 12/1/1989
Author: Dylan F Williams

148. Vector Mixer Characterization for Image Mixers
Published: Date unknown
Authors: Joel Dunsmore, Sean Hubert, Dylan F Williams
Abstract: The vector mixer characterization method first introduced by Dunsmore [1] can be used only for mixers where the Local Oscillator (LO) frequency lies between the RF input and output frequencies. Attempts to use the method for mixers with the LO greate ...

149. Uncertainty of timebase corrections
Published: 10/1/0009
Authors: Chih-Ming Wang, Paul D Hale, Dylan F Williams
Abstract: We develop a covariance matrix describing the uncertainty of a new timebase for waveform measurements determined with the National Institute of Standards and Technology's timebase correction algorithm. This covariance matrix is used with covarian ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series