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You searched on: Author: dylan williams

Displaying records 141 to 150 of 180 records.
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141. Electrical characterization methods for high-speed interconnections
Published: 8/1/1996
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1238

142. Thermal Noise in Lossy Waveguides
Published: 7/1/1996
Author: Dylan F Williams
Abstract: This work rigorously treats thermal electromagnetic noise in lossy waveguides and develops explicit modal equivalent­ circuit representations for the noise generated by arbitrary passive networks embedded in them. The results show that the formulatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17277

143. On-Wafer Measurement at Millimeter Wave Frequencies
Published: 6/1/1996
Authors: Dylan F Williams, J. M Belquin, G. Dambrine, R. Fenton
Abstract: We investigate millimeter wave on-wafer calibration and measurement in coplanar waveguide and demonstrate the applicability of the multiline thru-reflect-line calibration and good measurement repeatability between laboratories. We also investigate ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15226

144. Line-Reflect-Match Calibrations with Nonideal Microstrip Standards
Published: 12/1/1995
Authors: Dylan F Williams, J. B. Schappacher
Abstract: We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibrat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12723

145. Coaxial Line-Reflect-Match Calibration
Published: 10/1/1995
Authors: Jeffrey A Jargon, Roger Marks, Dylan F Williams
Abstract: We describe a coaxial line-reflect-match calibration that corrects for imperfections in the load used as a match standard. The method provides a practical means of obtaining accurate, wideband calibrations with compact coaxial standard sets. When our ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5589

146. Fiber Coating Diameter: Toward a Glass Artifact Standard
Published: 9/1/1995
Authors: Dylan F Williams, M. Young, L. A. Tietz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19972

147. Comments on "Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances"
Published: 4/1/1995
Authors: Roger Marks, Dylan F Williams
Abstract: In his recent paper, Frickey presents formulas for conversions between various network matrices. Four of these matrices (Z, Y, h, and ABCD) relate voltages and currents at the ports: the other two (S and T) relate wave quantities. These relationships ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22890

148. LRM Probe-Tip Calibrations Using Nonideal Standards
Published: 2/1/1995
Authors: Dylan F Williams, Roger Marks
Abstract: The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27844

149. Compensation for Substrate Permittivity in Probe-Tip Calibration
Published: 12/1/1994
Authors: Dylan F Williams, Roger Marks
Abstract: We demonstrate a method of compensation for the effect of substrate permittivity on coplanar waveguide probe-tip scattering parameter calibrations, modeling the effect as a capacitance at the probe tip. Comparison to on-wafer multiline TRL calibratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15365

150. UWBain Network Analysis Using the Multiline TRL Calibration
Published: 12/1/1994
Authors: Roger Marks, L. A. Hayden, Jeffrey A Jargon, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19045



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