NIST logo

Publications Portal

You searched on:
Author: dylan williams

Displaying records 121 to 130 of 155 records.
Resort by: Date / Title


121. Fiber Coating Diameter: Toward a Glass Artifact Standard
Published: 9/1/1995
Authors: Dylan F Williams, M. Young, L. A. Tietz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19972

122. Comments on 'Conversation Between S, Z, Y, h, ABCD, and T Parameters Which are Valid for Complex Source and Load Impedances'
Published: 4/1/1995
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22890

123. LRM Probe-Tip Calibrations Using Nonideal Standards
Published: 2/1/1995
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27844

124. Compensation for Substrate Permittivity in Probe-Tip Calibration
Published: 12/1/1994
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15365

125. UWBain Network Analysis Using the Multiline TRL Calibration
Published: 12/1/1994
Authors: Roger Marks, L. A. Hayden, Jeffrey A Jargon, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19045

126. Accurate Electrical Characterization of High-Speed Interconnections
Published: 11/1/1994
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14403

127. Microwave Characterization of Printed Circuit Transmission Lines
Published: 6/1/1994
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21820

128. On-Wafer Impedance Measurement on Lossy Substrates
Published: 6/1/1994
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10006

129. LRM Probe-Tip Calibrations with Imperfect Resistors and Loss Lines
Published: 12/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5517

130. Verification of Commercial Probe-Tip Calibrations
Published: 12/1/1993
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13160



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series