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You searched on: Author: dylan williams

Displaying records 121 to 130 of 180 records.
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121. 0.1-10 GHZ CMOS Voltage Standard
Published: 5/1/1999
Authors: Dylan F Williams, David K Walker
Abstract: We discuss the development of a sinusoidal CMOS voltage standard. The standard incorporates a FET power sensor that transfers the voltage measured at a primary standards laboratory to a user‰s laboratory. We anticipate an absolute accuracy of about 1 ...

122. Characteristic Impedance, Causality, and Microwave Circuit Theory
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new waveguide equivalent-circuit theory guarantees causality of the network parameters of passive devices.

123. Characteristic Impedance, Power, and Causality
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new causal power-normalized waveguide equivalent-circuit theory determines uniquely both the magnitude and phase of the characteristic impedance of a waveguide.

124. Multiconductor Transmission-Line Characterization: Representations, Approximations, and Accuracy
Published: 4/1/1999
Authors: Dylan F Williams, J. E. Rogers, Christopher L Holloway
Abstract: This paper investigates a measurement method that characterizes lossy printed multiconductor transmission lines, its accuracy, the choice of measurement representations, and some simple approximations. We illustrate the method with measurements of ...

125. Metal-Insulator-Semiconductor Transmission Lines
Published: 2/1/1999
Author: Dylan F Williams
Abstract: This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investiga ...

126. High Frequency Limitations of the JEDEC 123 Guideline
Published: 10/1/1998
Author: Dylan F Williams
Abstract: Abstract: This paper assesses certain systematic high frequency measurement errors inherent in the procedures described in the JEDEC 123 Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters.

127. National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections
Published: 10/1/1998
Authors: Donald C. DeGroot, Dylan F Williams
Abstract: Abstract: The National Institute of Standards and Technology operates a number of research projects to advance measurement science and technology for the microelectronic industries. We report here on one component of the NIST program, the fundamental ...

128. Accurate Characteristic Impedance Measurement on Silicon
Published: 6/1/1998
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar wa ...

129. Comparison of SOLR and TRL Calibrations
Published: 6/1/1998
Authors: David K Walker, Dylan F Williams
Abstract: We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard definitions and verify its accuracy by comparing it to a multiline thru-reflect-line calibration.

130. In-Line Multiport Calibration Algorithm
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-p ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series