NIST logo

Publications Portal

You searched on:
Author: dylan williams

Displaying records 121 to 130 of 149 records.
Resort by: Date / Title


121. Microwave Characterization of Printed Circuit Transmission Lines
Published: 6/1/1994
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21820

122. On-Wafer Impedance Measurement on Lossy Substrates
Published: 6/1/1994
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10006

123. LRM Probe-Tip Calibrations with Imperfect Resistors and Loss Lines
Published: 12/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5517

124. Verification of Commercial Probe-Tip Calibrations
Published: 12/1/1993
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13160

125. Accurate Transmission Line Characterization
Published: 8/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9032

126. Reciprocity Relations in Waveguide Junctions
Published: 7/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4756

127. Calibrating On-Wafer Probes to the Probe Tips
Published: 12/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19010

128. Interconnection Transmission Line Parameter Characterization
Published: 12/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3071

129. Planar Resistors for Probe Station Calibration
Published: 12/1/1992
Authors: David K Walker, Dylan F Williams, Nicole Morgan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16177

130. A General Waveguide Circuit Theory
Series: Journal of Research (NIST JRES)
Published: 10/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6581



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series