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You searched on: Author: dylan williams

Displaying records 121 to 130 of 180 records.
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121. 0.1-10 GHZ CMOS Voltage Standard
Published: 5/1/1999
Authors: Dylan F Williams, David K Walker
Abstract: We discuss the development of a sinusoidal CMOS voltage standard. The standard incorporates a FET power sensor that transfers the voltage measured at a primary standards laboratory to a user‰s laboratory. We anticipate an absolute accuracy of about 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20565

122. Characteristic Impedance, Causality, and Microwave Circuit Theory
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new waveguide equivalent-circuit theory guarantees causality of the network parameters of passive devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23423

123. Characteristic Impedance, Power, and Causality
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new causal power-normalized waveguide equivalent-circuit theory determines uniquely both the magnitude and phase of the characteristic impedance of a waveguide.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17005

124. Multiconductor Transmission-Line Characterization: Representations, Approximations, and Accuracy
Published: 4/1/1999
Authors: Dylan F Williams, J. E. Rogers, Christopher L Holloway
Abstract: This paper investigates a measurement method that characterizes lossy printed multiconductor transmission lines, its accuracy, the choice of measurement representations, and some simple approximations. We illustrate the method with measurements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24602

125. Metal-Insulator-Semiconductor Transmission Lines
Published: 2/1/1999
Author: Dylan F Williams
Abstract: This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investiga ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7847

126. High Frequency Limitations of the JEDEC 123 Guideline
Published: 10/1/1998
Author: Dylan F Williams
Abstract: Abstract: This paper assesses certain systematic high frequency measurement errors inherent in the procedures described in the JEDEC 123 Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3464

127. National Institute of Standards and Technology Programs in Electrical Measurements for Electronic Interconnections
Published: 10/1/1998
Authors: Donald C. DeGroot, Dylan F Williams
Abstract: Abstract: The National Institute of Standards and Technology operates a number of research projects to advance measurement science and technology for the microelectronic industries. We report here on one component of the NIST program, the fundamental ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7607

128. Accurate Characteristic Impedance Measurement on Silicon
Published: 6/1/1998
Authors: Dylan F Williams, Uwe Arz, Hartmut Grabinski
Abstract: This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar wa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10077

129. Comparison of SOLR and TRL Calibrations
Published: 6/1/1998
Authors: David K Walker, Dylan F Williams
Abstract: We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard definitions and verify its accuracy by comparing it to a multiline thru-reflect-line calibration.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16692

130. In-Line Multiport Calibration Algorithm
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6024



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