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You searched on: Author: dylan williams

Displaying records 121 to 130 of 195 records.
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121. Characteristic Impedance of Microstrip on Silicon
Published: 10/25/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: We compare power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip transmission lines on silicon substrates.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920435

122. Characteristic impedance of microstrip on silicon
Published: 10/25/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: In this paper, we compare the power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip transmission lines on silicon substrates.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920441

123. Accurate Experimental Characterization of On-Chip Interconnects
Published: 8/13/1999
Authors: Dylan F Williams, Uwe Arz Hartmut Grabinski
Abstract: In this paper we examine different approaches to the extraction of frequency dependent line parameters from broadband S-parameter measurements.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920443

124. A Causal Microwave Circuit Theory and Its Implications
Published: 8/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: We will describe a new causal power-normalized waveguide equivalent-circuit theory and explore its implications. The new theory marries a power normalization with additional constraints that enforce simultancity of the theory's voltages and currents ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6678

125. Electrical Measurements for Electronic Interconnections at NIST
Published: 8/1/1999
Authors: Dylan F Williams, Donald C. DeGroot
Abstract: The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7260

126. A Complete Multimode Equivalent-Circuit Theory for Electrical Design
Series: Journal of Research (NIST JRES)
Published: 6/22/1999
Authors: Dylan F Williams, L. A. Hayden, Roger Marks
Abstract: This work presents a complete equivalent-circuit theory for lossy multimode transmission lines. Its voltages and currents are based on general linear combinations of standard normalized modal voltages and currents. The theory includes new expressions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30244

127. 0.1-10 GHZ CMOS Voltage Standard
Published: 5/1/1999
Authors: Dylan F Williams, David K Walker
Abstract: We discuss the development of a sinusoidal CMOS voltage standard. The standard incorporates a FET power sensor that transfers the voltage measured at a primary standards laboratory to a user‰s laboratory. We anticipate an absolute accuracy of about 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20565

128. Characteristic Impedance, Causality, and Microwave Circuit Theory
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new waveguide equivalent-circuit theory guarantees causality of the network parameters of passive devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23423

129. Characteristic Impedance, Power, and Causality
Published: 5/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new causal power-normalized waveguide equivalent-circuit theory determines uniquely both the magnitude and phase of the characteristic impedance of a waveguide.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17005

130. Multiconductor Transmission-Line Characterization: Representations, Approximations, and Accuracy
Published: 4/1/1999
Authors: Dylan F Williams, Christopher L Holloway, Janet E Rogers
Abstract: This paper investigates a measurement method that characterizes lossy printed multiconductor transmission lines, its accuracy, the choice of measurement representations, and some simple approximations. We illustrate the method with measurements of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920449



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