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Author: scott wight

Displaying records 21 to 30 of 35 records.
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21. Beam Size in the Environmental Scanning Electron Microscopy: A Comparison of Model and Experimental Data
Published: 9/1/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903911

22. Detection and Characterization of Radioactive Particles
Published: 8/1/1998
Authors: Cynthia J Zeissler, Scott A Wight, Richard M. Lindstrom
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901850

23. Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
Published: 7/1/1998
Authors: John G Gillen, Scott A Wight, David S. Bright, T M. Herne
Abstract: Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scann ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831060

24. Environmental Scanning Electron Microscopy Measurements Compared with the Low Vacuum Model
Published: 2/18/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901829

25. Better Visualization Inside the Environmental Scanning Electron Microscope Through the Infrared Chamberscope Coupled with a Mirror
Published: 12/1/1997
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100379

26. Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100382

27. Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100381

28. Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100336

29. Microhotplate Chemical Vapor Deposition in the Environmental SEM Chamber
Published: 12/1/1997
Authors: Scott A Wight, Richard E Cavicchi, M J Nystrom, F DiMeo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100380

30. SIMS Imaging of Electron Beam Scattering in the Environmental SEM
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100383



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