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You searched on: Author: scott wight

Displaying records 21 to 30 of 37 records.
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21. Direct Measurement of Electron Beam Scattering in the Environmental Scanning Electron Microscope Using Phosphor Imaging Plates
Published: 5/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor imaging plate technology has made it possible to directly image the distribution of primary beam electrons and scattered electrons in the environmental scanning electron microscope. The phosphor plate is exposed under electron scattering co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831140

22. What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Published: 8/1/1999
Author: Scott A Wight
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831119

23. Beam Size in the Environmental Scanning Electron Microscopy: A Comparison of Model and Experimental Data
Published: 9/1/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903911

24. Detection and Characterization of Radioactive Particles
Published: 8/1/1998
Authors: Cynthia J Zeissler, Scott A Wight, Richard Mark Lindstrom
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901850

25. Quantitative secondary ion mass spectrometry imaging of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
Published: 7/1/1998
Authors: John G Gillen, Scott A Wight, David S. Bright, T M. Herne
Abstract: Fluorinated alkanethiol self assembled monolayers (SAM) films immobilized on gold substrates have been used as electron-sensitive resists to map quantitatively the spatial distribution of the primary electron beam scattering in an environmental scann ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831060

26. Environmental Scanning Electron Microscopy Measurements Compared with the Low Vacuum Model
Published: 2/18/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901829

27. Better Visualization Inside the Environmental Scanning Electron Microscope Through the Infrared Chamberscope Coupled with a Mirror
Published: 12/1/1997
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100379

28. Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100382

29. Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100381

30. Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Published: 12/1/1997
Authors: Scott A Wight, G Gillen, T M. Herne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100336



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