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Author: chih-ming wang
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1. A Generalized Confidence Interval for a Measurand in the Presence of type-A and type-B Uncertainties
Published: 4/11/2006
Authors: Chih-Ming Wang, Hariharan K Iyer
Abstract: We consider the problem of estimating a measurand based on a sequence of measurements. Each measurement has both type-A and type-B errors. The measurements may have been obtained from a single experiment or several separate experiments. We investigat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150260

2. A Statistical Model for Cladding Diameter of Optical Fibers
Published: 4/1/2003
Authors: Chih-Ming Wang, Timothy J Drapela
Abstract: The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunicat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151779

3. A Transfer Standard for Measuring Photoreceiver Frequency Response
Published: 11/1/1996
Authors: Paul D Hale, Chih-Ming Wang, R. Park, W. Y. Lau
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16540

4. A robust algorithm for eye-diagram analysis
Published: 11/1/2008
Authors: Jeffrey A Jargon, Paul D Hale, Chih-Ming Wang
Abstract: We present a new method for analyzing eye diagrams that always provides a unique solution by making use of a robust, least-median-of-squares (LMS) location estimator. In contrast to commonly used histogram techniques, the LMS procedure is insensit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32775

5. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907585

6. Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30092

7. Accurate Interferometric Retardance Measurements
Published: 9/1/1997
Authors: Kent Rochford, Chih-Ming Wang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7953

8. Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals
Published: 10/1/2003
Authors: Kevin J Coakley, Chih-Ming Wang, Paul D Hale, Tracy S. Clement
Abstract: We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51084

9. An Optimal Vector-Network-Analyzer Calibration Algorithm
Published: 12/1/2003
Authors: Dylan F Williams, Chih-Ming Wang, Uwe Arz
Abstract: We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet efficient, search algorithm, a complete error analysis that includes both random and systematic e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31321

10. Calculation of pulse parameters and propagation of uncertainty
Published: 3/1/2009
Authors: Paul D Hale, Chih-Ming Wang
Abstract: The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of ea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32782