NIST logo

Publications Portal

You searched on: Author: chih-ming wang

Displaying records 41 to 50 of 73 records.
Resort by: Date / Title

41. Consistency Tests for Key Comparison Data
Published: 5/1/2004
Authors: Dominic F. (Dominic F.) Vecchia, Chih-Ming Wang

42. An Optimal Vector-Network-Analyzer Calibration Algorithm
Published: 12/1/2003
Authors: Dylan F Williams, Chih-Ming Wang, Uwe Arz
Abstract: We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet efficient, search algorithm, a complete error analysis that includes both random and systematic e ...

43. Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals
Published: 10/1/2003
Authors: Kevin J Coakley, Chih-Ming Wang, Paul D Hale, Tracy S. Clement
Abstract: We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before e ...

44. The NIST Traceable Reference Material Program for Wavelength Reference Absorption Cells
Series: Special Publication (NIST SP)
Published: 8/1/2003
Authors: Timothy J Drapela, Sarah L. Gilbert, William C Swann, Chih-Ming Wang
Abstract: A program is described by which commercially produced wavelength-calibration gas-absorption cells may be related to primary standards maintained by the National Institute of Standards and Technology (NIST) and Standard Reference Materials produced by ...

45. A Statistical Model for Cladding Diameter of Optical Fibers
Published: 4/1/2003
Authors: Chih-Ming Wang, Timothy J Drapela
Abstract: The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunicat ...

46. Interlaboratory Comparison of Magnetic Thin Film Measurements
Series: Journal of Research (NIST JRES)
Report Number: of
Published: 4/1/2003
Authors: F C Da silva, Chih-Ming Wang, D P Pappas
Abstract: A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment m/s, the remanent moment m/^ur^, and the intrinsic coercivity H/c of nine sa ...

47. Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For ...

48. Effects of Noise Level in Fitting In-Situ Optical Reflectance Spectroscopy Data
Published: 9/1/2002
Authors: Chih-chiang Fu, Kristine A Bertness, Chih-Ming Wang
Abstract: We discuss the combination of noise level and scaling factor accuracy needed in optical reflectance spectroscopy data in order to obtain accurate parameters by fitting simulated Optical Reflectance Spectroscopy data curves with different noise level.

49. Uncertainty of Oscilloscope Timebase Distortion Estimate
Published: 2/1/2002
Authors: Chih-Ming Wang, Paul D Hale, Kevin J Coakley, Tracy S. Clement
Abstract: We study several problems related to the characterization of the timebase in high-speed sampling oscilloscopes. First, we examine the bias of using the method of the first-order approximation to estimate the additive and time jitter noises, and prese ...

50. Round Robin for Optical Fiber Bragg Grating Metrology
Series: Journal of Research (NIST JRES)
Published: 12/1/2000
Authors: Allen Rose, Chih-Ming Wang, Shellee Dawn Dyer

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series