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Author: william wallace

Displaying records 81 to 90 of 95 records.
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81. Determination of the Molecular Mass Distribution of Narrow Polydispersity Polystyrene by MALDI-TOF-MS: Interlaboratory Comparison
Published: 3/1/2000
Authors: Kathleen M. Flynn, S Wetzel, William E Wallace III, William R. Blair, R J Goldschmidt, David Lloyd VanderHart, B M Fanconi
Abstract: NIST has sponsored a matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) interlaboratory comparison using a well-characterized polystyrene to determine the reproducibility in determining the molecular mass dis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851652

82. MALDI-TOF Mass Spectrometry of Polymeric Silsesquioxanes
Published: 3/1/2000
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
Abstract: Matrix-assisted laser desorption ionization time-of-flight mass spectrometry has been shown to be an effective method to determine the degree-of-intramolecular-condensation of polymeric silsesquioxanes. The nature of the organic R' leaving group wa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852815

83. Polymeric Silsesquioxanes: Degree-of-Intramolecular-Condensation Measured by Mass Spectrometry
Published: 3/1/2000
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
Abstract: The degree-of-condensation, defined as the number of residual silanol (SiOH) groups per oligomer, for a variety of silsesquioxane polymers was measured by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. Condensation of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851556

84. Properties of Nanoporous Silica Thin Films Determined by High-Resolution X-Ray Reflectivity and Small-Angle Neutron Scattering
Published: 2/1/2000
Authors: Wen-Li Wu, William E Wallace III, Eric K Lin, G W Lynn, Charles J. Glinka, E T Ryan, H M Ho
Abstract: A new methodology based on a novel combination of a high-resolution specular x-ray reflectivity and small-angle neutron scattering has been developed to evaluate the structural properties of low-dielectric-constant porous silica thin films about one ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851582

85. Determination of the Molecular-Mass Distribution of a Narrow Polydispersity Polystyrene by Maldi-Tof Ms: Interlaboratory Comparison.
Published: 1/1/2000
Authors: Charles Martin Guttman, S Wetzel, William E Wallace III, William R. Blair, R J Goldschmidt, David Lloyd VanderHart, B M Fanconi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853648

86. Thermal Expansion Coefficients of Low-K Dielectric Films From Fourier Analysis of X-Ray Reflectivity
Published: 1/1/2000
Authors: Charles E. Bouldin, William E Wallace III, G W Lynn, S C Roth, Wen-Li Wu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853677

87. Thermally Induced Stress Relaxation and Densification of Spin-on-Glass Thin Films
Published: 1/1/2000
Authors: C. K. Chiang, William E Wallace III, G W Lynn, D Feiler, W. Xia
Abstract: The stress-temperature relationship of silica spin-on-glass thin films on silicon wafers was studied. Upon heating the stress-temperature curves showed a dramatically increasing slope when the temperature of the film was greater than 340 C. At 45 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851605

88. Application of Neutron Interferometry to the Measurement of Thin Film Density
Published: 1/1/1999
Authors: William E Wallace III, David L Jacobson, Muhammad Arif, A I Ioffe
Abstract: The application of neutron interferometry to the measurement of the atom density of polymer thin films (<1 m thick) supported on silicon substrates is described. Polymer films were chosen primarily for their fixed, well-defined stoichiometry; howev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851480

89. Comparison of Classical and MALDI-TOF-MS Analysis of a Polystyrene Interlaboratory Sample
Published: 1/1/1999
Authors: William R. Blair, B M Fanconi, R J Goldschmidt, Charles Martin Guttman, William E Wallace III, S Wetzel, David Lloyd VanderHart
Abstract: Over the past several years, the use of MALDI-TOF-MS for analysis of synthetic polymers has increased significantly. As the number of polymer analyses by MALDI has increased, scrutiny of the MALDI results in comparison to classically derived values ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851607

90. Polymeric Materials Interest Group Workshop: Quantitative Determination of Synthetic Polymer Molecular Mass Distribution
Published: 1/1/1999
Author: William E Wallace III
Abstract: Preliminary report on the NIST molecular mass distribution interlaboratory comparison.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851604



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