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Author: william wallace

Displaying records 71 to 80 of 95 records.
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71. Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy
Published: 4/23/2001
Authors: P T. Wilson, Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831222

72. Absolute Molecular Orientational Distribution of the Polystyrene Surface
Published: 4/1/2001
Authors: Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characteriza ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841486

73. Mass Spectrometry of Spin-On-Glass Low-K Dielectric Precursors
Published: 4/1/2001
Authors: William E Wallace III, Kathleen M. Flynn, Joseph M Antonucci
Abstract: The degree-of-intramolecular-condensation, defined as the number of residual silanol (SiOH) groups per oligomer, for a variety of silsesquioxane polymers was measured by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. R ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851802

74. NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis
Published: 3/1/2001
Authors: Charles Martin Guttman, S Wetzel, William R. Blair, B M Fanconi, Kathleen M. Flynn, R J Goldschmidt, William E Wallace III, David Lloyd VanderHart
Abstract: Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851614

75. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850052

76. Covalent Cationization Method for the Analysis of Polyethylene by Mass Spectrometry
Published: 1/1/2001
Authors: Barry J. Bauer, William E Wallace III, B M Fanconi, Charles Martin Guttman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853745

77. Electrospray FTMS and MALDI TOF MS Characterization of [(O3/2SiMe)x(OSi(OH)Me)y(OSiMe2)z] Silsesquioxane Resin
Published: 1/1/2001
Authors: R E Tecklenburg, H Chen, William E Wallace III
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853797

78. Mass Spectroscopy of Spin-on-glass Low-k Dielectric Precursors
Published: 1/1/2001
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853800

79. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Published: 1/1/2001
Authors: E Fuoco, G Gillen, M B Wijesundara, William E Wallace III, L Hanley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853757

80. Wafer Level Underfill: Experiments and Modeling.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6731
Published: 1/1/2001
Authors: Daniel Josell, William E Wallace III, Daniel Wheeler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853766



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