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You searched on: Author: mark vaudin

Displaying records 51 to 60 of 82 records.
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51. Partial Melt Processing of Solid-Solution Bi^d2^Sr^d2^CaCu^d2^O^d8+{delta} Thick Film Conductors with Nanophase A1^d2^O^d3^ Additions
Published: 5/1/2003
Authors: T J Haugan, Winnie K Wong-Ng, Lawrence P. Cook, Mark D Vaudin, L Swartzendruber, Paul N. Barnes
Abstract: Partial-melt processing of Bi2+xSr2-x-yCa1+yCu2O8+d (Bi-2212) thick film conductors with additions of nanophase Al2O3 on Ag foils was studied for dual purposes of increasing flux pinning and inhibiting Sr-Ca-Cu-O defect formation. Nanophase Al2O3 (< ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850608

52. A Model System for Interfacial Reactions in LTCC Materials
Published: 4/1/2003
Authors: Lawrence P. Cook, Winnie K Wong-Ng, Peter K. Schenck, Mark D Vaudin, J Suh
Abstract: Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to 900 C, the possibilities for interactions at interfaces between dissimilar materials ar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850712

53. Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films
Published: 5/1/2002
Authors: Mark D Vaudin, G R Fox, G - Kowach
Abstract: Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851129

54. Phase Relationships and Phase Formation in the System BaF^d2^-BaO-Y^d2^O^d3^-CuO^dx^-H^d2^O
Published: 1/1/2002
Authors: Winnie K Wong-Ng, Lawrence P. Cook, J Suh, Igor Levin, Mark D Vaudin, Ron Feenstra, James P Cline
Abstract: The interplay of melting equilibria and reaction kinetics is important during formation of the Ba2YCu3O6+x (Y-213) phase from starting materials in the quaternary reciprocal system Ba,Y,Cu//O,F. For experimental investigation of the process we are u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850597

55. Crystallographic Texture in Ceramics and Metals
Series: Journal of Research (NIST JRES)
Published: 12/1/2001
Author: Mark D Vaudin
Abstract: Preferred crystallographic orientation, or texture, occurs almost universally, both in natural and man-made systems. Many components and devices in electronic and magnetic systems are fabricated from materials that have crystallographic texture. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850558

56. Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films
Published: 11/1/2001
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Mark D Vaudin, Charles E. Bouldin, Joseph C Woicik, Albert J. Paul, W. Robert Thurber, K E Miyano, C A Parker
Abstract: The structural and optical properties of indium gallium nitride (InxGa1-xN) films with 0.04 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850464

57. Electrochemical Properties of Nanocrystalline Cadmium Stannate Films
Published: 8/1/2001
Authors: Gintaras Valincius, Vytautas Reipa, V L. Vilker, John Taylor Woodward IV, Mark D Vaudin
Abstract: Electrochemical properties of the sol-gel nanocrystalline cadmium tin oxide electrodes (CTO) were investigated in 0.2 M potassium chloride buffered at pH 7.4 with phosphate. Films were found to be n-type degenerate semiconductors with charge carrier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850463

58. Electrochemical Properties of Nanocrystalline Cadmium Stannate Films
Published: 8/1/2001
Authors: Gintaras Valincius, Vytautas Reipa, V L. Vilker, John Taylor Woodward IV, Mark D Vaudin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904228

59. Workshop on Texture in Electronic Applications
Series: Journal of Research (NIST JRES)
Published: 5/1/2001
Authors: Mark D Vaudin, Debra L Kaiser
Abstract: A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850490

60. Texture Plus
Published: 2/1/2001
Author: Mark D Vaudin
Abstract: TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850426



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