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You searched on: Author: mark vaudin

Displaying records 51 to 60 of 82 records.
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51. Partial Melt Processing of Solid-Solution Bi^d2^Sr^d2^CaCu^d2^O^d8+{delta} Thick Film Conductors with Nanophase A1^d2^O^d3^ Additions
Published: 5/1/2003
Authors: T J Haugan, Winnie K Wong-Ng, Lawrence P. Cook, Mark D Vaudin, L Swartzendruber, Paul N. Barnes
Abstract: Partial-melt processing of Bi2+xSr2-x-yCa1+yCu2O8+d (Bi-2212) thick film conductors with additions of nanophase Al2O3 on Ag foils was studied for dual purposes of increasing flux pinning and inhibiting Sr-Ca-Cu-O defect formation. Nanophase Al2O3 (< ...

52. A Model System for Interfacial Reactions in LTCC Materials
Published: 4/1/2003
Authors: Lawrence P. Cook, Winnie K Wong-Ng, Peter K. Schenck, Mark D Vaudin, J Suh
Abstract: Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to 900 C, the possibilities for interactions at interfaces between dissimilar materials ar ...

53. Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films
Published: 5/1/2002
Authors: Mark D Vaudin, G R Fox, G - Kowach
Abstract: Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factor ...

54. Phase Relationships and Phase Formation in the System BaF^d2^-BaO-Y^d2^O^d3^-CuO^dx^-H^d2^O
Published: 1/1/2002
Authors: Winnie K Wong-Ng, Lawrence P. Cook, J Suh, Igor Levin, Mark D Vaudin, Ron Feenstra, James P Cline
Abstract: The interplay of melting equilibria and reaction kinetics is important during formation of the Ba2YCu3O6+x (Y-213) phase from starting materials in the quaternary reciprocal system Ba,Y,Cu//O,F. For experimental investigation of the process we are u ...

55. Crystallographic Texture in Ceramics and Metals
Series: Journal of Research (NIST JRES)
Published: 12/1/2001
Author: Mark D Vaudin
Abstract: Preferred crystallographic orientation, or texture, occurs almost universally, both in natural and man-made systems. Many components and devices in electronic and magnetic systems are fabricated from materials that have crystallographic texture. The ...

56. Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films
Published: 11/1/2001
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Mark D Vaudin, Charles E. Bouldin, Joseph C Woicik, Albert J. Paul, W. Robert Thurber, K E Miyano, C A Parker
Abstract: The structural and optical properties of indium gallium nitride (InxGa1-xN) films with 0.04 ...

57. Electrochemical Properties of Nanocrystalline Cadmium Stannate Films
Published: 8/1/2001
Authors: Gintaras Valincius, Vytautas Reipa, V L. Vilker, John Taylor Woodward IV, Mark D Vaudin
Abstract: Electrochemical properties of the sol-gel nanocrystalline cadmium tin oxide electrodes (CTO) were investigated in 0.2 M potassium chloride buffered at pH 7.4 with phosphate. Films were found to be n-type degenerate semiconductors with charge carrier ...

58. Electrochemical Properties of Nanocrystalline Cadmium Stannate Films
Published: 8/1/2001
Authors: Gintaras Valincius, Vytautas Reipa, V L. Vilker, John Taylor Woodward IV, Mark D Vaudin

59. Workshop on Texture in Electronic Applications
Series: Journal of Research (NIST JRES)
Published: 5/1/2001
Authors: Mark D Vaudin, Debra L Kaiser
Abstract: A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government a ...

60. Texture Plus
Published: 2/1/2001
Author: Mark D Vaudin
Abstract: TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan ...

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