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Author: mark vaudin

Displaying records 31 to 40 of 81 records.
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31. Texture Measurements in <001> Fiber-Oriented PMN-PT
Published: 4/9/2006
Authors: Kristen H Brosnan, G L Messing, Richard J Meyer, Mark D Vaudin
Abstract: Textured (1-x)(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-PT) ceramics obtained by the templated grain growth (TGG) process a significant fraction of the piezoelectric properties of the Bridgman growth single crystals at a fraction of the cost. These materials could ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850936

32. Nanometer Scale Crystallographic Texture Mapping of Platinum and Lead Zirconate Titanate Thin Films by Electron Backscatter Diffraction
Published: 3/9/2006
Authors: G R Fox, X Han, T Maitland, Mark D Vaudin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850819

33. High Degree of Crystalline Perfection in Spontaneously Grown GaN Nanowires
Published: 1/1/2006
Authors: Kristine A Bertness, Alexana Roshko, Albert Davydov, Igor Levin, Mark D Vaudin, Joy Barker, John B Schlager, Norman A Sanford, Lawrence H Robins
Abstract: We have grown a variety of isolated GaN nanowires using gas-source molecular beam epitaxy (MBE) and characterized their structural and optical properties. The nanowires have demonstrated a number of promising materials characteristics, including low ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32144

34. Composition and Carrier Concentration Dependence of the Electronic Structure of InyGa1-yAs1-xNx Films With Nitrogen Mole Fraction Less Than 0.012
Published: 11/1/2005
Authors: Youn Seon Kang, Lawrence H Robins, Anthony Birdwell, Alexander J. Shapiro, W. Robert Thurber, Mark D Vaudin, M M Fahmi, D Bryson, S N Mohammad
Abstract: The electronic structure of Si-doped InyGa1-yAs1-xNx films on GaAs substrates, grown bynitrogen-plasma-assisted molecular-beam epitaxy, was examined by photoreflectance PR spectroscopy at temperatures between 20 and 300 K. The films were approximate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850826

35. Horizontal Growth and In Situ Assembly of Oriented ZnO Nanowires
Published: 3/13/2005
Authors: Babak Nikoobakht, Chris A Michaels, Mark D Vaudin, Stephan J Stranick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854241

36. Photoreflectance Study of the Electronic Structure of Si-Doped InyGa^d1-y^As^d1-x^N^dx^ Films With x<0.012
Published: 3/1/2005
Authors: Youn Seon Kang, Lawrence H Robins, Anthony Birdwell, Alexander J. Shapiro, W. Robert Thurber, Mark D Vaudin, M M Fahmi, D Bryson, S N Mohammad
Abstract: The electronic structure of Si-doped InyGa1-yAs1-xNx films on GaAs substrates, grown by nitrogen-plasma-assisted MBE, was examined by photoreflectance (PR) spectroscopy at temperatures between20 K and 300 K. The measured critical-point energies were ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850822

37. Saturation Molalities and Standard Molar Enthalpies of Solution of 2 -Deoxyadenosine H^d2^O(cr), 2 -Deoxycytidine H^d2^O(cr), 2 -Ddeoxyguanosine H^d2^O(cr), 2 -Deoxyinosine(cr), and 2 -deoxyuridine(cr) in H^d2^O(l)
Published: 3/1/2005
Authors: Yadu D. Tewari, Patrick D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830462

38. The Development and Evaluation of TiO^d2^ Nanoparticle Films for Conductometric Gas Sensing on MEMS Microhotplate Platforms
Published: 1/1/2005
Authors: Kurt D Benkstein, Christopher B Montgomery, Mark D Vaudin, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830913

39. Horizontal Growth and In Situ Assembly of Oriented Zinc Oxide Nanowires
Published: 10/1/2004
Authors: Babak Nikoobakht, Chris A Michaels, Stephan J Stranick, Mark D Vaudin
Abstract: The positioning and directed assembly of semiconductor nanowires (NWs) is of considerable current interest for bottom-up approaches to the engineering of intricate structures from nanoscale building blocks. We report a horizontal growth mode for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831361

40. Studies of Deformation Induced Texture Development in Sheet Materials Using Diffraction Techniques
Published: 8/2/2004
Authors: Stephen W Banovic, Mark D Vaudin, Thomas H Gnaeupel-Herold, D M. Saylor, K P Rodbell
Abstract: Crystallographic texture measurements were made on a series of rolled aluminum sheet specimens deformed in equi-biaxial tension up to a strain level of 0.11. The measurement techniques used were neutron diffraction with a 4-circle goniometer, electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853272



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