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Author: mark vaudin

Displaying records 11 to 20 of 81 records.
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11. Measurement of Axisymmetric Crystallographic Texture
Series: Special Publication (NIST SP)
Report Number: sp
Published: 1/1/2009
Author: Mark D Vaudin
Abstract: Crystallographic texture has for many years been the fiefdom of metallurgists and geologists, who have developed elegant methodologies for the analysis of highly complex textures and texture evolutions. Over the past two decades, the importance and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851083

12. Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
Published: 12/12/2008
Authors: Mark D Vaudin, Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: Strains in Si as small as 104 (corresponding to stresses of 10 MPa) have been measured using electron back scatter diffraction (EBSD), with spatial resolution close to 10 nm, and confocal Raman microscopy (CRM) with spatial resolution app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854129

13. Surface Effects on the Elastic Modulus of Te Nanowires
Published: 6/17/2008
Authors: Gheorghe Stan, Sergiy Krylyuk, Albert Davydov, Mark D Vaudin, Leonid A Bendersky, Robert Francis Cook
Abstract: Nondestructive elastic property measurements have been performed on Te nanowires with diameters in the range 20 150 nm. By using contact resonance atomic force microscopy, the elastic indentation modulus perpendicular to the prismatic facets of the n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851078

14. Equi-Axed Grain Formation in Electrodeposited Sn-Bi
Published: 4/1/2008
Authors: E Sandnes, Maureen E Williams, Mark D Vaudin, Gery R Stafford
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854416

15. Equi-Axed Grain Formation in Electrodeposited Sn-Bi
Published: 12/29/2007
Authors: E Sandnes, Maureen E Williams, Mark D Vaudin, Gery R Stafford
Abstract: Sn is widely used as a coating in the electronics industry because it provides excellent solderability, ductility, electrical conductivity and corrosion resistance. However, Sn whiskers have been observed to grow spontaneously from Sn electrodeposit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853522

16. Growth of Silicon Carbide Nanowires by a Microwave Heating-Assisted Physical Vapor Transport Using Group VIII Metal Catalysts
Published: 11/13/2007
Authors: Siddarth Sundaresan, A V Davydov, Mark D Vaudin, James E Maslar, Y -L Tian, M V Rao
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854386

17. Growth of Silicon Carbide Nanowires by a Microwave Heating-Assisted Physical Vapor Transport Using Group VIII Metal Catalysts
Published: 11/13/2007
Authors: Siddarth Sundaresan, Albert Davydov, Mark D Vaudin, Igor Levin, James E Maslar, Yong-lai Tian, M V Rao
Abstract: SiC nanowires are grown by a novel catalyst-assisted sublimation-sandwich (SS) method. This involves microwave heating-assisted physical vapor transport from a source 4H-SiC wafer to a closely positioned substrate 4H-SiC wafer. The substrate wafer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851050

18. Correlations between the Crystallographic Texture and Grain Boundary Character in Polycrystalline Materials
Published: 10/1/2007
Authors: R E Garcia, Mark D Vaudin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854342

19. Texture and Phase Analysis of a Ca3Co4O9/Si (100) Thermoelectric Film
Published: 8/1/2007
Authors: Winnie K Wong-Ng, Y F Hu, Mark D Vaudin, B He, Makoto Otani, N D Lowhorn, Q Li
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854369

20. Texture and Phase Analysis of a Ca^d3^Co^d4^O^d9^ / Si (100) Thermoelectric Film
Published: 7/26/2007
Authors: Winnie K Wong-Ng, Y F Hu, Mark D Vaudin, B He, Makoto Otani, Nathan Lowhorn, Q Li
Abstract: This paper reports the texture analysis as well as the identification of two crystalline phases between a thin film of monoclinic Ca3Co4O9 and a cubic (100) Si substrate, using a diffractometer equipped with a 2-dimensional area detector. No reflecti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851036



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