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Author: benjamin tsai
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1. A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range
Published: 6/4/2014
Authors: Catherine C Cooksey, Benjamin K Tsai, David W Allen
Abstract: The spectral reflectance signature of human skin provides opportunities to advance observations ranging from medical treatment to security applications. In this study 28 volunteers participated in a skin reflectance measurement of the inside of the r ...

2. Tunable Supercontinuum Fiber Laser Source for BRDF Measurements in the STARR II Gonioreflectometer
Published: 9/27/2012
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer, Victor Alan Ying, Catherine C Cooksey, Benjamin K Tsai
Abstract: STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is the follow-on to the current NIST STARR (Spectral Tri-function Automated Reference Reflec ...

3. NIST Measurement Services: Regular Spectral Transmittance
Series: Special Publication (NIST SP)
Report Number: 250-69
Published: 3/10/2011
Authors: David W Allen, Edward A. Early, Benjamin K Tsai, Catherine C Cooksey
Abstract: This document describes measurement services, instrumentation, and measurement techniques for regular spectral transmittance over the spectral range from 250 nm to 2500 nm at the National Institute of Standards and Technology. Section 2 explains the ...

4. The Extension of the NIST BRDF Scale from 1100 nm to 2500 nm
Published: 8/21/2009
Authors: Howard W Yoon, David W Allen, George P Eppeldauer, Benjamin K Tsai
Abstract: Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility ...

5. A Summary of Lightpipe Radiation Thermometry Research at NIST
Series: Journal of Research (NIST JRES)
Published: 4/1/2006
Author: Benjamin K Tsai
Abstract: During the last ten years, research in lightpipe radiation thermometry has significantly reduced the uncertainties for temperature measurements in semiconductor processing. The National Institute of Standards and Technology (NIST) has improved the c ...

6. A Summary of Lightpipe Radiation Thermometry Research at NIST
Series: Journal of Research (NIST JRES)
Report Number: 111
Published: 1/1/2006
Author: Benjamin K Tsai

7. Design and characterization of Si and InGaAs pyrometers for radiance temperature scale realization between 232 {?}C and 962 {?}C
Published: 1/1/2006
Authors: Mart Noorma, Sergey Mekhontsev, K Khromchenko, Alex Gura, Maritoni Abatayo Litorja, Benjamin K Tsai, Leonard M Hanssen

8. Traceable Temperature Calibrations of Radiation Thermometers for Rapid Thermal Processing
Published: 11/1/2005
Author: Benjamin K Tsai
Abstract: Lightpipe radiation thermometers (LPRTs) have been successfully calibrated at NIST for rapid thermal processing (RTP) applications using a sodium heat-pipe blackbody (Na-HPBB) between 700 C and 900 C with an uncertainty of about 0.3 C (k = 1) trac ...

9. Emittance standards for improved radiation thermometry during thermal processing of silicon materials, ed. by D. Zvizdic
Published: 1/1/2005
Authors: Benjamin K Tsai, D P DeWitt, E A. Early, Leonard M Hanssen, Sergey Mekhontsev, Matthias Rink, K G Kreider, B J Lee, Z M Zhang

10. Modeling Radiative Properties of Silicon with Coatings and Comparison with Reflectance Measurements
Published: 1/1/2005
Authors: D P DeWitt, E A. Early, B J Lee, Benjamin K Tsai, Z M Zhang

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  • SP 250-XX: Calibration Services
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