NIST logo

Publications Portal

You searched on:
Author: joseph tan
Sorted by: title

Displaying records 1 to 10 of 45 records.
Resort by: Date / Title


1. A high efficiency ultrahigh vacuum compatible flat field spectrometer for extreme ultraviolet wavelengths
Published: 1/1/2005
Authors: B Blagojevic, E O Le bigot, K Fahy, A Aguilar, K Makonyi, E Takacs, Joseph N Tan, Joshua M Pomeroy, John H. Burnett, John D Gillaspy, R Roberts j
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101941

2. Absolute transition frequencies and quantum interference in a frequency comb based measurement of the 6,7Li D lines
Published: 7/6/2011
Authors: Craig J Sansonetti, Clayton Simien, John D Gillaspy, Joseph N Tan, Samuel Middleton Brewer, Roger Charles Brown, Saijun Wu, James V Porto
Abstract: Optical frequencies of the D lines of 6,7Li were measured with a relative accuracy of 5x10-11 using an optical comb synthesizer. Quantum interference in the laser induced fluorescence for the partially-resolved D2 lines was found to produce polariz ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908094

3. Accurate Modeling of Benchmark X-ray Spectra from Highly-Charged Ions of Tungsten
Published: 10/26/2006
Authors: Y Ralchenko, Joseph N Tan, John D Gillaspy, Joshua M Pomeroy, E Silver
Abstract: We present detailed collisional-radiative modeling for the benchmark x-ray spectrum of highly-charged tungsten ions in the range between 3 \AA \ and 10 \AA produced in an Electron Beam Ion Trap (EBIT) with a beam energy of 4.08 keV. Remarkably good ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840848

4. Accurate modeling of benchmark x-ray spectra from highly charged ions of tungsten
Published: 1/1/2006
Authors: Yuri Ralchenko, Joseph N Tan, John D Gillaspy, Joshua M Pomeroy, E Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102432

5. An Electron Beam Ion Trap (EBIT) plus a microcalorimeter: a good combination for laboratory astrophysics
Published: 1/1/2005
Authors: Joseph N Tan, E Silver, Joshua M Pomeroy, J M Laming, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102561

6. Application of Laser-Cooled Ions to Frequency Standards and Metrology
Published: 1/1/1996
Authors: David J Wineland, James C Bergquist, D J Berkeland, John J Bollinger, F C Cruz, Wayne M Itano, Branislav M. Jelenkovic, B E. King, D M Meekhof, J D Miller, C Monroe, Joseph N Tan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=105696

7. Atomic Ion Crystals in Non-Neutral Plasmas
Published: 1/1/1999
Authors: John J Bollinger, T M Mitchell, X -P Huang, Wayne M Itano, Joseph N Tan, Branislav M. Jelenkovic, David J Wineland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=105152

8. Bragg Diffraction from Crystallized Ion Plasmas
Published: 1/1/1998
Authors: Wayne M Itano, John J Bollinger, Joseph N Tan, Branislav M. Jelenkovic, X -P Huang, David J Wineland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104947

9. Chen et al. ReplyThe 3C / 3D Line Ratio in Nixix: New Ab Initio Theory and Experimental Results [Physical Review Letters 97, 143201 (2006)]
Published: 9/7/2007
Authors: G X Chen, K P Kirby, E Silver, N Brickhouse, John D Gillaspy, Joseph N Tan, Joshua M Pomeroy, J M Laming
Abstract: No abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840888

10. Crystalline Order in Laser-cooled, Non-neutral Ion Plasmas
Published: 1/1/2000
Authors: John J Bollinger, T M Mitchell, X -P Huang, Wayne M Itano, Joseph N Tan, Branislav M. Jelenkovic, David J Wineland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104858



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series