NIST logo

Publications Portal

You searched on:
Author: stephan stranick

Displaying records 21 to 30 of 34 records.
Resort by: Date / Title


21. Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
Published: 9/1/2000
Authors: Chris A Michaels, C EJ Dentinger, Lee J Richter, D B Chase, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831194

22. Removing Optical Artifacts in Near-Field Scanning Optical Microscopy by Using a Three Dimensional Scanning Mode
Published: 9/1/1999
Authors: C. E. Jordan, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We demonstrate a method of acquiring near-field scanning optical microscopy data that allows for the construction of three different types of images from one data set: topographic, constant-gap, and constant-height. This data set includes the topogr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831095

23. Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images
Published: 8/1/1999
Authors: Lee J Richter, C EJ Dentinger, Richard R Cavanagh, Garnett W Bryant, A Liu, Stephan J Stranick, C D Keating, M J Natan
Abstract: We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This depend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831088

24. Near-Field Scanning Optical Microscopy Incorporating Raman Scattering for Vibrational Mode Contrast
Published: 1/1/1999
Authors: C EJ Dentinger, Stephan J Stranick, Richard R Cavanagh, Lee J Richter, D B Chase
Abstract: Near-field scanning optical microscopy offers the ability to combine a broad range of spectral contrast features with spatial resolution that is an order of magnitude better than that set by the diffraction limit of the probe light. For many chemica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831070

25. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 12/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100664

26. High Efficiency, Dual Collection Mode Near-Field Scanning Optical Microscope
Published: 7/1/1998
Authors: Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: We have developed a near-field scanning optical microscope that provides simultaneous transmission and reflection mode measurements while concurrently recording a topograph of the sample surface. In this microscope design, an ellipsoidal cavity is u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831044

27. Imaging Benzene Molecules and Phenyl Radicals on Cu{111}
Published: 2/18/1998
Authors: P S Weiss, M M Kamma, Stephan J Stranick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901828

28. Nanoscale Characterization of Gold Colloid Monolayers: A Comparison of Four Techniques
Published: 12/1/1997
Authors: K C Grabar, Stephan J Stranick, S L Tang, M J Natan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100356

29. Chemical Imaging of Thin Films Polymer Blends With Near-Field Infrared Microscopy and Spectroscopy
Published: Date unknown
Authors: Stephan J Stranick, Xiaohong Gu, D B Chase, Chris A Michaels
Abstract: The utility of an infrared scanning near-field microscope in the characterization of the mesoscale structure of thin film polymer blends is demonstrated. This unique IR microscope souples the nanoscale spatial resolution of scanning probe microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830269

30. Controlling the Growth Direction of ZnO Nanowires on c-Plane Sapphire
Published: Date unknown
Authors: Babak Nikoobakht, Albert Davydov, Stephan J Stranick
Abstract: Well oriented vertical ZnO nanowires (NWs) are grown on c-plane sapphire via a vapor-phase transport process using an Au thin film as a catalyst. This new finding is novel and unexpected due to the fact that the lattice mismatch between the zinc oxi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853395



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series