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You searched on: Author: jack stone jr

Displaying records 31 to 40 of 53 records.
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31. Refractometry Using a Helium Standard
Published: 7/1/2004
Authors: Jack A Stone Jr., Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822160

32. Using Helium as a Standard of Refractive Index: Correcting Errors in a Gas Refractometer
Published: 6/1/2004
Authors: Jack A Stone Jr., Alois Stejskal
Abstract: The refractive index of helium at atmospheric pressure can be determined from ab initio calculations in combination with careful pressure and temperature measurements. Therefore helium can serve as a theory-based standard of refractive index; it migh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823173

33. Performance Analysis of Next-Generation LADAR for Manufacturing, Construction, and Mobility
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7117
Published: 5/6/2004
Authors: William C Stone, Maris Juberts, Nicholas G Dagalakis, Jack A Stone Jr., Jason John Gorman
Abstract: The NIST Construction Metrology and Automation Group (CMAG), in cooperation with the NIST Intelligent Systems Division (ISD), is developing performance metrics and researching issues related to the design and development of a Next-Generation LADAR (l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822493

34. Uncertainties in Small-Angle Measurement Systems Used to Calibrate Angle Artifacts
Published: 5/1/2004
Authors: Jack A Stone Jr., M Amer, Bryon S. Faust, Jay H Zimmerman
Abstract: We have studied a number of effects that can give rise to errors in small-angle measurement systems when they are used to calibrate artifacts such as optical polygons. Of these sources of uncertainty, the most difficult to quantify are errors associa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822151

35. Angle Metrology Using AAMACS and Two Small-Angle Measurement Systems
Published: 11/28/2003
Authors: Jack A Stone Jr., M Amer, Bryon S. Faust, Jay H Zimmerman
Abstract: The highest accuracy method for angle measurement employed at NIST(National Institute of Standards and Technology) makes use of an automated stack of three indexing tables-- our Advanced Automated Master Angle Calibration System (AAMACS)-- in conjunc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822027

36. Wavelength-Tracking Capabilities of a Fabry-Perot Cavity
Published: 11/20/2003
Authors: Jack A Stone Jr., Alois Stejskal
Abstract: We have characterized the accuracy of atmospheric wavelength tracking based on a laser servolocked to a simple Fabry-Peron cavity. The motivations are (1) to explore a method for air refractive index measurement and (2) to determine the stability and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822028

37. The Advanced Angle Metrology System at NIST
Published: 11/1/2003
Author: Jack A Stone Jr.
Abstract: At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823171

38. Index of Refraction of Air
Published: 2/16/2001
Authors: Jack A Stone Jr., Jay H Zimmerman
Abstract: These Web pages are intended primarily as a computational tool that can be used to calculate the refractive index of air for a given wavelength of light and given atmospheric conditions (air temperature, pressure, and humidity). The calculations are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823138

39. Real-Time Displacement Measurements With a Fabry-Perot Cavity and a Diode Laser
Published: 1/1/2000
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: We present the basic operating principles of a traceable measurement system for use with scanned probe microscopes and nanometer-resolution displacement sensors. Our method is based upon a tunable external-cavity diode laser system which is Pound-Dre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820963

40. Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820952



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