Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: jolene splett Sorted by: title

Displaying records 1 to 10 of 37 records.
Resort by: Date / Title

1. A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
Published: 2/17/2011
Authors: Jolene D Splett, Dominic F. (Dominic F.) Vecchia, Loren Frederick Goodrich
Abstract: We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium samples and investigate the effects of using different functional models on the final value. RRR is typically defined as the ratio of the electrical resista ...

2. A Liquid Density Standard Over Wide Ranges of Temperature and Pressure Based on Toluene
Series: Journal of Research (NIST JRES)
Published: 2/1/2008
Authors: Mark O McLinden, Jolene D Splett
Abstract: The density of liquid toluene has been measured over the temperature range -60 {degree}C to 200 {degree}C with pressures up to 36 MPa. A two-sinker hydrostatic-balance densimeter utilizing a magnetic suspension coupling provides an absolute determina ...

3. Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations
Published: 1/1/2003
Authors: Todd E Harvey, Kristine A Bertness, Robert K Hickernell, C. M. Wang, Jolene D Splett
Abstract: We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth r ...

4. Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For ...

5. An Empirical Model for the Warm-Up Drift of a Commercial Harmonic Phase Standard
Published: 6/1/2007
Authors: Jeffrey A Jargon, Jolene D Splett, Dominic F. (Dominic F.) Vecchia, Donald C. DeGroot
Abstract: We develop an empirical model for the warm-up drift in a harmonic phase standard used to calibrate the phase distortion of a nonlinear vector network analyzer. The model enables us to estimate the time at which the standard reaches stability.

6. Analysis of Charpy impact verification data: 1993-2003
Published: 3/1/2006
Authors: Jolene D Splett, Christopher N McCowan
Abstract: Indirect verification tests, used to verify the performance of Charpy impact machines according to ASTM Standard E23, are evaluated by the National Institute of Standards and Technology (NIST) and the data from these tests are co1lected in a database ...

7. Certified KLST Miniaturized Charpy Specimens for the Indirect Verification of Small-Scale Impact Machines
Published: 4/28/2015
Authors: Enrico Lucon, Christopher N McCowan, Raymond L Santoyo, Jolene D Splett
Abstract: Small specimen test techniques are becoming ever more popular as the need increases to characterize mechanical properties by use of the smallest possible amount of material, due to various restrictions on material availability, irradiation, testing s ...

8. Charpy Machine Verification: Limits and Uncertainty
Series: Special Publication (NIST SP)
Published: 9/1/2008
Authors: Jolene D Splett, Christopher N McCowan, Chih-Ming Wang
Abstract: The purpose of this document is to clarify some issues pertaining to uncertainty statements and the ASTM E 23 limits used in the Charpy machine verification program. We explain some of the distributional subtleties associated with uncertainty and ult ...

9. Color Error in the Digital Camera Image Capture Process
Published: 4/1/2014
Authors: John Penczek, Paul A Boynton, Jolene D Splett
Abstract: The color error of images taken by digital cameras is evaluated with respect to its sensitivity to the image capture conditions. A parametric study was conducted to investigate the dependence of image color error on camera technology, illumination sp ...

10. Correlation Between the Pressure Dependence of the Critical Temperature and the Reversible Strain Effect on the Critical Current and Pinning Force in Bi^d2^Sr^d2^CaCu^d2^O^d8+x^ Wires
Published: 12/16/2011
Authors: Xifeng Lu, Loren Frederick Goodrich, Daniel Cornelis van der Laan, Jolene D Splett, Najib Cheggour, T G Holesinger, F J Baca
Abstract: Bi^d2^Sr^d2^CaCu^d2^O^d8+x^ round wires are among the most promising high-temperature superconductor candidates for making high-field magnets that operate at fields above 20 Tesla. Owing to the brittle nature of high-temperature superconductors, thei ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series