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Author: john small

Displaying records 11 to 20 of 35 records.
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11. Electron Backscatter Diffraction (EBSD) of Single Particles
Published: 2/1/2002
Author: John A Small
Abstract: Over the years several different methods have been developed for the quantitative x-ray microanalysis of individual particles Small (1981), Armstrong (1991). Despite the large number of quantitative methods available, the accuracy for the x-ray micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831248

12. Energy Dispersive X-ray spectromety by Microcalorimetry for the SEM
Published: 1/1/2002
Authors: Dale E Newbury, David A Wollman, Sae Woo Nam, Gene C Hilton, Kent D Irwin, John A Small, John M Martinis
Abstract: Analytical x-ray spectrometry for electron beam instruments has been significantly advanced with the development of the NIST microcalorimeter energy dispersive x-ray spectrometer (mcal EDS). The mcal EDS operates by measuring the temperature rise wh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831224

13. Improving the Quality of Electron Backscatter Diffraction (EBSD) Patterns From Nanoparticles
Published: 1/1/2002
Authors: John A Small, J R Michael, David S. Bright
Abstract: In this study, we investigated the relative contributions of automic number (Z) and density (p) to the degradation of the electron backscatter diffraction (EBSD) pattern quality for nanoparticles < 500 nm in diameter. This was accomplished by minimi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831232

14. Comparison of High- and Low-Voltage X-Ray Mapping of an Electronic Device
Published: 2/1/2001
Authors: John A Small, David S. Bright
Abstract: In recent years, field-emission gun scanning electron microscopes, FEG-SEMs, with high-brightness electron guns and excellent performance at low electron beam energies (E^d0^ less then or equal to 5 keV) have become readily available. Concurrently th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831195

15. Chapter 12: Analysis of Individual Collected Particles
Published: 1/1/2001
Authors: Robert A Fletcher, John A Small, J H J Scott
Abstract: This chapter describes microscopes and microprobes used for analysis of collected, individual particles. The instruments discussed are the light microscope, electron microscopes (scanning, environmental and transmission), electron microprobes, laser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831472

16. Phase Identification of Individual Crystalline Particle by Electron Backscatter Diffraction
Published: 1/1/2001
Authors: John A Small, J R Michael
Abstract: Recently, an electron backscatter diffraction (EBSD) system was developed that uses a 1024 x 1024 CCD camera coupled to a thin phosper. This camera has been shown to produce excellent EBSD patterns. In this system, crystallographic information is d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831186

17. Phase Identification of Individual Crystalline Particles by Electron Backscatter Diffraction
Published: 1/1/2001
Authors: John A Small, J R Michael
Abstract: Recently, an electron backscatter diffraction EBSD system was developed that uses a 1024 x 1024 CCD camera coupled to a thin scintillator rather than photographic film. In this system, crystallagraphic information is determined and coupled with the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831110

18. Activities of the International Organization for Standardization Technical Committee 202 Microbeam Analysis
Published: 10/1/2000
Author: John A Small
Abstract: In January of 1992 the ISO Council announced the acceptance of resolution 50/1991 establishing TC202 Microbeam Analysis. The China State Bureau of Technology Supervision (CSBTS) was appointed by the ISO council as secretariat of TC 202 and remains i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831167

19. Improving the Analytical Accuracy in the Analysis of Particles by Employing Low Voltage Analysis
Published: 8/1/2000
Authors: John A Small, J T. Armstrong
Abstract: The energy of the electron beam, in conventional electron probe microanalysis, is generally in the range of 15-25 keV which provides the necessary overvoltage to excite efficiently the K and L x-ray lines for elements with atomic numbers in the range ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831178

20. Improving the Accuracy of Particle Analysis
Published: 7/1/2000
Authors: John A Small, J R Michael, Dale E Newbury
Abstract: Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe samples.The main difference was that corrections had to be made to the experimental k-rat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831177



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