Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: eric simmon Sorted by: title

Displaying records 1 to 10 of 46 records.
Resort by: Date / Title

1. A Vision of Cyber-Physical Cloud Computing for Smart Networked Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7951
Published: 8/26/2013
Authors: Eric D Simmon, Kyoung-sook Kim, Eswaran Subrahmanian, Ryong Lee, Frederic Jean Marie de Vaulx, Yohei Murakami, Koji Zettsu, Ram D Sriram
Abstract: A key aspect of the next generation Smart Networked System (SNS) is the bridge between the physical and virtual world. These systems that tightly interlink the cyber and physical worlds are often referred to as Cyber-Physical Systems (CPS). A CPS is ...

2. An Active High Voltage Divider with 20-PPM Uncertainty
Published: 6/1/1996
Authors: O. Petersons, Eric D Simmon, Gerald J FitzPatrick

3. An Active High-Voltage Divider with 20 ?V/V Uncertainty
Published: 4/1/1997
Authors: O. Petersons, Gerald J FitzPatrick, Eric D Simmon

4. An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment
Published: 9/24/2005
Authors: Eric D Simmon, YaShian Li-Baboud, John V Messina
Abstract: The semiconductor industry continues to strive for improvements in the fabrication process. The Advanced Process Control (APC) systems supporting the fabrication process are steadily becoming more complex in order to deal with the high levels of auto ...

5. An Optical Current Transducer for Calibration Studies
Published: 8/1/1993
Authors: Eric D Simmon, Allen Rose, Gerald J FitzPatrick

6. Automation Tools Supporting the Development of Information Standards for Complex Systems
Published: 7/5/2011
Authors: Eric D Simmon, Arthur Griesser, Samuel Dana
Abstract: As information systems continue to become more complex, the data standards to support them grow in complexity as well. To meet the needs of today‰s systems, not only must the standards change, but the standards development process must change as well ...

7. Boundary Discovery in Complex Systems
Published: 9/5/2012
Authors: Eric D Simmon, Joseph Chalfoun, Arthur Griesser
Abstract: Many of today‰s extremely complex meta-systems are cross-domain, they require development by multiple stakeholder groups with different goals each implementing a sub-set of the functionality required for the entire meta-system to operate. As these sy ...

8. Calibration of Dissipation Factor Standards
Published: 4/1/1999
Authors: Eric D Simmon, Gerald J FitzPatrick, O. Petersons
Abstract: Working standards for dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded precision resistor have been developed for calibration purposes. Precision conductance boxes have been built ...

9. Calibration of Dissipation Factor Standards
Published: 7/1/1998
Authors: Eric D Simmon, Gerald J FitzPatrick, O. Petersons
Abstract: Dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded resistor have been developed for calibration purposes. An analysis of these DF Standards, including precautions in their constructi ...

10. Changing Environmental Regulations and the Electronics Industry
Published: 11/10/2010
Authors: John V Messina, Eric D Simmon, Kevin G Brady
Abstract: In 2008, the European Union (EU) started a major review of its new class of environmental regulations with a broad review of the Restriction of Hazardous Substances (RoHS) and the Waste Electrical and Electronic Equipment (WEEE) Directives. The RoHS/ ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series