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Author: richard silver
Displaying records 111 to 114.
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111. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
W. F. Tseng, John A Dagata, Richard M Silver, Joseph Fu, J R. Lowney
112. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
H. W. Tseng, John A Dagata, Richard M Silver, Joseph Fu, J R. Lowney
Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetric ...
113. Scanning Tunneling Microscopy of Passivated Gallium Arsenide Under Ambient Conditions
John A Dagata, W. F. Tseng, Richard M Silver
114. Imaging Optics and CCD Camera Characterization for Metrology
S Fox, Edward A Kornegay, Richard M Silver
Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performan ...