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Author: richard silver

Displaying records 111 to 114.
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111. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 2/1/1994
Authors: W. F. Tseng, John A Dagata, Richard M Silver, Joseph Fu, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13544

112. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 9/5/1993
Authors: H. W. Tseng, John A Dagata, Richard M Silver, Joseph Fu, J R. Lowney
Abstract: Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820723

113. Scanning Tunneling Microscopy of Passivated Gallium Arsenide Under Ambient Conditions
Published: 8/1/1993
Authors: John A Dagata, W. F. Tseng, Richard M Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14568

114. Imaging Optics and CCD Camera Characterization for Metrology
Published: Date unknown
Authors: S Fox, Edward A Kornegay, Richard M Silver
Abstract: Optical semiconductor characterization and metrology rely heavily on digital camera imaging and its associated optical imaging systems. This work characterizes the performance of a widely used, commercially available camera and compares its performan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820962



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