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1. A New Monte Carlo Application for Complex Sample Geometries
Published: 11/1/2005
Author: Nicholas W m Ritchie

2. Analysis of 3D elemental mapping artifacts in biological specimens using Monte Carlo simulation
Report Number: 832267
Published: 1/29/2009
Authors: Keana C K Scott, Nicholas W m Ritchie
Abstract: In this paper, we present the Monte Carlo simulation results demonstrating the feasibility of the focused ion beam based X-ray microanalysis technique (FIB-EDS) for the 3D elemental analysis of biological samples. We used a marine diatom Thalassiosi ...

3. Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence
Published: 6/1/2011
Authors: Jeffrey M. Davis, Dale E Newbury, Nicholas W m Ritchie, Edward Paul Vicenzi, Dale P Bentz, Albert J. Fahey
Abstract: X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue w ...

4. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...

5. Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
Published: 12/1/2011
Authors: Nicholas W m Ritchie, Dale E Newbury, Abigail P. Lindstrom
Abstract: Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive x-ray spectrometry. Peaks which result from non-ideal behavior in the detector or sample can fool even an experience microanalyst into believing that they have ...

6. Electron-Excited Energy Dispersive X-ray Spectrometry in the Variable Pressure Scanning Electron Microscope (EDS/VPSEM): It‰s Not Microanalysis Anymore!
Published: Date unknown
Authors: Dale E Newbury, Nicholas W m Ritchie
Abstract: X-ray spectra measured in the variable-pressure scanning electron microscope (VPSEM, chamber pressure 1 to 2500 Pa) suffer significantly degraded spatial resolution compared to high-vacuum SEM (operating pressure < 10 mPa). Depending on the gas path ...

7. Microscopy and Microanalysis of Individual Collected Particles- Chapter 10
Published: 7/5/2011
Authors: Robert A Fletcher, Nicholas W m Ritchie, Ian M. Anderson, John A Small
Abstract: This chapter describes microscopy and microanalysis techniques used for the characterization of collected, individual particles in a variety of instruments. The instruments discussed are the light microscope, electron microscopes (both scanning and ...

8. Monte Carlo Modeling of Secondary Electron Imaging in Three Dimensions
Published: 3/1/2007
Authors: John S Villarrubia, Nicholas W m Ritchie, J R. Lowney

9. Multiplexed microcalorimeter arrays for precision measurements from microwave to gamma-ray wavelengths
Published: 8/21/2007
Authors: Joel Nathan Ullom, William B Doriese, James A Beall, William Duncan, S. Lisa Ferreira, Gene C Hilton, Robert D Horansky, Kent D Irwin, Terrence J Jach, John A B Mates, Nathan A Tomlin, Galen C O\'Neil, Carl D Reintsema, Nicholas Ritchie, Daniel R Schmidt, Leila R Vale, Yizi Xu, Barry L. Zink, Andrew Hoover, Clifford R Rudy, Derek Tournear, Duc Vo, Michael W Rabin
Abstract: Cryogenic microcalorimeters are a promising technology for ultrasensitive measurements of electromagnetic radiation from microwave to gamma-ray wavelengths. Cryogenic microcalorimeters derive their exquisite sensitivity from the minimal thermal noise ...

10. Spectrum Simulation in DTSA-II
Report Number: 832430
Published: 10/1/2009
Author: Nicholas W m Ritchie
Abstract: Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the limits of the technique and how to optimize the tools for the optimal measurement. DTSA- ...

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