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Author: jon pratt

Displaying records 11 to 20 of 82 records.
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11. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905829

12. An Ultra-Stable Platform for the Study of Single-Atom Chains
Published: 5/16/2010
Authors: Douglas T Smith, Jon Robert Pratt, Francesca M Tavazza, Lyle E Levine, Anne Marie Chaka
Abstract: We describe a surface probe instrument capable of sustaining single-atomic-bond junctions in the electronic quantum-conduction regime for tens of minutes, and present results for Au junctions that can be locked stably in n = 1 and n = 2 quantum con ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903846

13. Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy
Published: 2/18/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Lee Kumanchik, Nancy Burnham
Abstract: It has long been recognized that the angular deflection of a typical atomic force microscope (AFM) cantilever under normal loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here, that a rem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903352

14. Lateral Force Calibration: Accurate Procedures for Colloidal Probe Friction Measurements in Atomic Force Microscopy
Published: 1/19/2010
Authors: Koo-Hyun Chung, Jon Robert Pratt, Mark Reitsma
Abstract: The colloidal probe technique for atomic force microscopy (AFM) has allowed the investigation of an extensive range of surface force phenomena, including the measurement of frictional (lateral) forces between numerous materials. The quantitative accu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901657

15. SI Traceability: Current status and future trends for forces below 10 micronewtons
Published: 9/24/2009
Author: Jon Robert Pratt
Abstract: Measurements related to nano- and micro- scale science, technology, and manufacturing are pushing the limits of detectable mechanical, electrical, and chemical quantities to ever smaller values, raising important questions regarding how best to exten ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901419

16. Accurate Picoscale Forces for Insitu Calibration of AFM
Published: 9/3/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904011

17. Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy
Published: 6/15/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824677

18. Methods for transferring the SI unit of force from millinewtons to piconewtons
Published: 6/1/2009
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Douglas T Smith, Jon Robert Pratt
Abstract: The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force meas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902346

19. Accurate Picometers for DC and Low-Frequency Displacement Measurement
Published: 4/6/2009
Authors: Jon Robert Pratt, Douglas T Smith, Lowell Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of 25 nm, and noise-limited resolution of 2 pm [1]. The interferometer uses a tun ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902317

20. A Fiber-Optic Interferometer with Sub-Picometer Resolution for DC and Low-Frequency Displacement Measurement
Published: 3/13/2009
Authors: Douglas T Smith, Jon Robert Pratt, L Howard
Abstract: We have developed a fiber-optic interferometer optimized for best performance in the frequency range from DC to 1 kHz, with displacement linearity of 1 % over a range of ± 25 nm, and noise-limited resolution of 2 pm. The interferometer uses a tunabl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854438



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