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You searched on: Author: jon pratt

Displaying records 11 to 20 of 85 records.
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11. Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method
Series: Journal of Research (NIST JRES)
Published: 7/1/2011
Authors: Richard Swift Gates, Mark Reitsma, John A Kramar, Jon Robert Pratt
Abstract: The evolution of the atomic force microscope into a useful tool for measuring mechanical properties of surfaces at the nanoscale has spurred the need for more precise and accurate methods for calibrating the spring constants of test cantilevers. Gro ...

12. An interferometric platform for studying AFM probe deflection
Published: 1/3/2011
Authors: Jon Robert Pratt, Lee Kumanchik, Tony L. Schmitz
Abstract: This paper describes an interferometric platform for measuring the full-field deflection of atomic force microscope (AFM) probes and generic cantilevers during quasi-static loading. The platform consists of a scanning white light interferometer (SWLI ...

13. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...

14. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...

15. An Ultra-Stable Platform for the Study of Single-Atom Chains
Published: 5/16/2010
Authors: Douglas T Smith, Jon Robert Pratt, Francesca M Tavazza, Lyle E Levine, Anne M. (Anne M.) Chaka
Abstract: We describe a surface probe instrument capable of sustaining single-atomic-bond junctions in the electronic quantum-conduction regime for tens of minutes, and present results for Au junctions that can be locked stably in n = 1 and n = 2 quantum con ...

16. Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy
Published: 2/18/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Lee Kumanchik, Nancy Burnham
Abstract: It has long been recognized that the angular deflection of a typical atomic force microscope (AFM) cantilever under normal loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here, that a rem ...

17. Lateral Force Calibration: Accurate Procedures for Colloidal Probe Friction Measurements in Atomic Force Microscopy
Published: 1/19/2010
Authors: Koo-Hyun Chung, Jon Robert Pratt, Mark Reitsma
Abstract: The colloidal probe technique for atomic force microscopy (AFM) has allowed the investigation of an extensive range of surface force phenomena, including the measurement of frictional (lateral) forces between numerous materials. The quantitative accu ...

18. SI Traceability: Current status and future trends for forces below 10 micronewtons
Published: 9/24/2009
Author: Jon Robert Pratt
Abstract: Measurements related to nano- and micro- scale science, technology, and manufacturing are pushing the limits of detectable mechanical, electrical, and chemical quantities to ever smaller values, raising important questions regarding how best to exten ...

19. Accurate Picoscale Forces for Insitu Calibration of AFM
Published: 9/3/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force micro ...

20. Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy
Published: 6/15/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electros ...

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