NIST logo

Publications Portal

You searched on: Author: yoshihiro ohno

Displaying records 151 to 160 of 176 records.
Resort by: Date / Title

151. A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, Yoshihiro Ohno
Abstract: The Four-Color Method (FCM) was developed to improve the accuracy of chromaticity measurements of various colors of a display. The method is valid for each type of display having similar spectra. To develop the Four-Color correction matrix, colorim ...

152. A Spectrally Tunable Solid-State Source for Radiometric, Photometric and Colorimetric Applications
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, George P Eppeldauer, Yoshihiro Ohno

153. Chapter A.2.1 Photometry, Handbook of Optoelectronics
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: General introduction to photometry, radiometry, and colorimetry is given. The chapter consists of the following sections:1. Introduction2. Basis of Physical Photometry (2.1 Visual response, 2.2 Photometric base unit the candela)3. Quantities and Uni ...

154. Color Rendering
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: LED technologies are advancing at a swift pace and solid-state lighting (SSL) products are already introduced to the market and expected to grow rapidly. There is an increasing interest and concern in the color rendering properties of white SSL produ ...

155. Color Rendering and Luminous Efficacy of White LED Spectra
Published: Date unknown
Author: Yoshihiro Ohno

156. Colorimetric Accuracies and Concerns in Spectroradiometry of LEDs
Published: Date unknown
Authors: C Jones, Yoshihiro Ohno
Abstract: LEDs are narrow-band emission sources and present special problems in colorimetric characterization. Chromaticity space is mapped using Gaussian spectral models to represent narrow-band emission sources. The Gaussian maps show that the spectral regi ...

157. Detector-Based Sphere Photometry for Industry
Published: Date unknown
Authors: Yoshihiro Ohno, R S Bergman
Abstract: The Absolute Integrating Sphere Method is now used at NIST for the detector-based calibration of total luminous flux of lamps, as well as for the realization of the lumen. This method has many benefits for high-accuracy applications, allowing for me ...

158. Development and Application Issues of a Spectrally Tunable LED Source
Published: Date unknown
Authors: George P Eppeldauer, Steven W Brown, G Dezsi, Irena Fryc, Yoshihiro Ohno
Abstract: A spectrally tunable solid state source based on Light Emitting Diodes (LEDs) is being developed at the National Institute of Standards and Technology (NIST). The tunable source will emulate the spectral distributions of various light sources and can ...

159. Development of a Color Quality Scale
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: A new metric for evaluating the color quality of light sources is being developed at NIST, in close contact with the lighting industry and the CIE. The current CIE Color Rendering Index (CRI) is outdated and has several known deficiencies. The CRI o ...

160. Development of the NIST Detector-based Color Temperature Scale
Published: Date unknown
Authors: George P Eppeldauer, Yoshihiro Ohno
Abstract: Based on the spectral responsivity of the channels of a tristimulus colorimeter, a color temperature scale is being developed at NIST. The low uncertainty of the spectral responsivity measurements can dominate the chromaticity measurement uncertainty ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series