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Author: nhan nguyen

Displaying records 61 to 70 of 72 records.
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61. High-Accuracy Principal-Angle Scanning Spectroscopic Ellipsometry of Semiconductor Interfaces
Published: 12/31/1995
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Joseph G. Pellegrino, Paul M. Amirtharaj
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8555

62. Interface Roughness Induced Changes in the Near-Eo Spectroscopic Behavior of Short-Period GaAs/AlAs Superlattices
Published: 12/31/1994
Authors: Deane Chandler-Horowitz, Joseph G. Pellegrino, Nhan V Nguyen, Paul M. Amirtharaj, S. B. Qadri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18438

63. Determination of the Optical Constants of ZnSe Films by Spectroscopic Ellipsometry
Published: 7/1/1994
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17719

64. Spectroscopic Ellipsometry Determination of the Properties of the Thin Underlying Strained Si Layer and the Roughness at SiO^d2^/Si Interface
Published: 5/16/1994
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Paul M. Amirtharaj, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12518

65. Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry
Published: 12/31/1993
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2535

66. Interface Sharpness During the Initial Stages of Growth of Thin, Short-Period III-V Superlattices
Published: 12/31/1993
Authors: Joseph G. Pellegrino, S. B. Qadri, C. M. Cotell, Paul M. Amirtharaj, Nhan V Nguyen, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17145

67. Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: 6/1/1993
Authors: Nhan V Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G Seiler, S. B. Qadri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27953

68. Metrologic Support for the DARPA/NRL-XRL Mask Program: Ellipsometric Analyses of SiC Thin Films on Si
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1993
Authors: Deane Chandler-Horowitz, Nhan V Nguyen, Jay F. Marchiando, Paul M. Amirtharaj
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19691

69. Interface Sharpness in Low-Order III-V Superlattices
Published: 12/31/1992
Authors: Joseph G. Pellegrino, S. B. Qadri, Paul M. Amirtharaj, Nhan V Nguyen, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1779

70. Tailoring the High-K Gate Dielectric/Sillicon Interface for CMOS Applications
Published: Date unknown
Authors: Y S Lin, R Puthenkovilakam, J P Chang, C P. Bouldin, Igor Levin, Nhan V Nguyen, Y Sun, P Pianetta, T Conard, W Vandervorst, V Venturo, S Selbrede
Abstract: The interfacial properties, thermal stabilities, and the electrical characteristics of ZrO^d2^/ Si and ZrO^d2^/SiO^d2^/Si were investigated and the interfacial layer of as-deposited ZrO^d2^ on silicon is likely to be ZrSi^dx^O^dy^. The ZrO^d2^/ZrSi^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850704



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