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You searched on: Author: nhan nguyen

Displaying records 61 to 70 of 74 records.
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61. Thin-Film Ellipsometry Metrology
Published: 3/1/1998
Authors: P. Durgapal, James R. Ehrstein, Nhan V Nguyen
Abstract: A wide variety of commercial ellipsometers are available in the market today. They all measure the change in the state of polarization of light on reflection, but the techniques adopted vary from instrument to instrument. Further, the models used t ...

62. Thickness Determination of Ultra-Thin SiO^d2^ Films on Si by Spectroscopic Ellipsometry
Published: 12/31/1997
Authors: Nhan V Nguyen, Curt A Richter

63. High-Accuracy Principal-Angle Scanning Spectroscopic Ellipsometry of Semiconductor Interfaces
Published: 12/31/1995
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Joseph G. Pellegrino, Paul M. Amirtharaj

64. Interface Roughness Induced Changes in the Near-Eo Spectroscopic Behavior of Short-Period GaAs/AlAs Superlattices
Published: 12/31/1994
Authors: Deane Chandler-Horowitz, Joseph G. Pellegrino, Nhan V Nguyen, Paul M. Amirtharaj, S. B. Qadri

65. Determination of the Optical Constants of ZnSe Films by Spectroscopic Ellipsometry
Published: 7/1/1994
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker

66. Spectroscopic Ellipsometry Determination of the Properties of the Thin Underlying Strained Si Layer and the Roughness at SiO^d2^/Si Interface
Published: 5/16/1994
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Paul M. Amirtharaj, Joseph G. Pellegrino

67. Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry
Published: 12/31/1993
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker

68. Interface Sharpness During the Initial Stages of Growth of Thin, Short-Period III-V Superlattices
Published: 12/31/1993
Authors: Joseph G. Pellegrino, S. B. Qadri, C. M. Cotell, Paul M. Amirtharaj, Nhan V Nguyen, J. Comas

69. Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: 6/1/1993
Authors: Nhan V Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G Seiler, S. B. Qadri

70. Metrologic Support for the DARPA/NRL-XRL Mask Program: Ellipsometric Analyses of SiC Thin Films on Si
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1993
Authors: Deane Chandler-Horowitz, Nhan V Nguyen, Jay F. Marchiando, Paul M. Amirtharaj

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