NIST logo

Publications Portal

You searched on: Author: nhan nguyen

Displaying records 61 to 70 of 74 records.
Resort by: Date / Title


61. Thin-Film Ellipsometry Metrology
Published: 3/1/1998
Authors: P. Durgapal, James R. Ehrstein, Nhan V Nguyen
Abstract: A wide variety of commercial ellipsometers are available in the market today. They all measure the change in the state of polarization of light on reflection, but the techniques adopted vary from instrument to instrument. Further, the models used t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30140

62. Thickness Determination of Ultra-Thin SiO^d2^ Films on Si by Spectroscopic Ellipsometry
Published: 12/31/1997
Authors: Nhan V Nguyen, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=835

63. High-Accuracy Principal-Angle Scanning Spectroscopic Ellipsometry of Semiconductor Interfaces
Published: 12/31/1995
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Joseph G. Pellegrino, Paul M. Amirtharaj
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8555

64. Interface Roughness Induced Changes in the Near-Eo Spectroscopic Behavior of Short-Period GaAs/AlAs Superlattices
Published: 12/31/1994
Authors: Deane Chandler-Horowitz, Joseph G. Pellegrino, Nhan V Nguyen, Paul M. Amirtharaj, S. B. Qadri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18438

65. Determination of the Optical Constants of ZnSe Films by Spectroscopic Ellipsometry
Published: 7/1/1994
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17719

66. Spectroscopic Ellipsometry Determination of the Properties of the Thin Underlying Strained Si Layer and the Roughness at SiO^d2^/Si Interface
Published: 5/16/1994
Authors: Nhan V Nguyen, Deane Chandler-Horowitz, Paul M. Amirtharaj, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12518

67. Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry
Published: 12/31/1993
Authors: R. Dahmani, L. Salamanca-Riba, Nhan V Nguyen, Deane Chandler-Horowitz, B T Jonker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2535

68. Interface Sharpness During the Initial Stages of Growth of Thin, Short-Period III-V Superlattices
Published: 12/31/1993
Authors: Joseph G. Pellegrino, S. B. Qadri, C. M. Cotell, Paul M. Amirtharaj, Nhan V Nguyen, J. Comas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17145

69. Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: 6/1/1993
Authors: Nhan V Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G Seiler, S. B. Qadri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27953

70. Metrologic Support for the DARPA/NRL-XRL Mask Program: Ellipsometric Analyses of SiC Thin Films on Si
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1993
Authors: Deane Chandler-Horowitz, Nhan V Nguyen, Jay F. Marchiando, Paul M. Amirtharaj
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19691



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series