NIST logo

Publications Portal

You searched on: Author: michael moldover

Displaying records 81 to 90 of 108 records.
Resort by: Date / Title

81. Electrostriction of Near-Critical SF^d6^ in Microgravity
Published: 6/1/1999
Authors: G A Zimmerli, R A Wilkinson, R A Ferrell, Michael R Moldover
Abstract: We used interferometry to measure the electric-field-induced (I.e., electrostrictive) increase of the density of sulfur hexafluoride near its critical point. The results at the temperatures T^dc^ + 5 mK, T^dc^ + 10 mK, and T^dc^ + 30 mK, with T^dc^ ...

82. Primary Acoustic Thermometer for Use Up to 800 K
Published: 4/1/1999
Authors: Dean C Ripple, Dana R Defibaugh, Keith A Gillis, Michael R Moldover
Abstract: Primary acoustic thermometers determine the thermodynamic temperature of a monatomic gas from measurements of the speed of sound in the gas. Here, we describe the design and construction of an acoustic thermometer designed to operate at temperatures ...

83. Primary Acoustic Thermometry From 217 K to 303 K
Published: 4/1/1999
Authors: Michael R Moldover, S J. Boyes, A R. Goodwin, Christopher W Meyer
Abstract: We report new values for the difference (T T^d90^) between Kelvin thermodynamic temperatures T and ITS-90, the International Temperature Scale of 1990. The new data span the range 217 K {less then or equal to} T 303 K with standard uncertainties of ...

84. Thermodynamic Temperatures of the Triple Points of Mercury and Gallium and in the Interval 217 K to 303 K
Series: Journal of Research (NIST JRES)
Published: 2/1/1999
Authors: Michael R Moldover, S J. Boyes, Christopher W Meyer, A R. Goodwin
Abstract: We measured the acoustic resonance frequencies of an argon-filled spherical cavity and the microwave resonance frequencies of the same cavity when evacuated. The microwave data were used to deduce the thermal expansion of the cavity and the acoustic ...

85. Viscoelasticity of Xenon Near the Critical Point
Published: 2/1/1999
Authors: Robert F Berg, Michael R Moldover, G A Zimmerli
Abstract: Using a novel, overdamped, oscillator flown aboard the Space Shuttle, we measured the viscosity of xenon near the liquid-vapor critical point in the frequency range 2 Hz [less than or equal to} f {less than or equal to} 12 Hz. The measured viscosity ...

86. Introduction to: Critical Point Wetting
Published: 12/1/1998
Authors: Michael R Moldover, M Schick

87. The Static Dielectric Constant of Liquid Water Between 274 and 418 K near the Saturated Vapor Pressure
Published: 12/1/1998
Authors: J O. Hamelin, J B. Mehl, Michael R Moldover

88. Critical Viscosity of Xenon: Surprises and Scientific Results
Published: 10/1/1998
Authors: Robert F Berg, Michael R Moldover, G A Zimmerli
Abstract: The Critical Viscosity of Xenon (CVX) experiment, which flew on board Space Shuttle flight STS-85 in August 1997, measured the viscosity of xenon near the liquid-vapor critical point. Very close to the critical temperature (T^dc^ = 290 K), the visco ...

89. Proposed Pressure Standard Based on Capacitance Measurements
Published: 7/1/1998
Author: Michael R Moldover
Abstract: We propose to measure the dielectric constant [epsilon] and the thermodynamic temperatue T of helium near 273.16 K and to calculate the pressure p([epsilon],T) of the helium from the fundamental constants, quantum mechanics, and statistical mechanics ...

90. Acoustic Methods for Transport Properties Measurements in Gases
Published: 6/1/1998
Authors: Keith A Gillis, J B. Mehl, Michael R Moldover
Abstract: Two novel acoustic resonators have been developed, one for measuring the viscosity and a second for measuring the Prandtl number of gases. For viscosity measurements, we use a double Helmholtz resonator called the Greenspan viscometer. The Greenspa ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series