NIST logo

Publications Portal

You searched on:
Author: alan migdall

Displaying records 131 to 140 of 155 records.
Resort by: Date / Title

131. Can Two-photon Interference be Considered the Interference of Two Photons?
Published: 1/1/1996
Authors: T B Pittman, D V Strekalov, Alan L Migdall, M H Rubin, A V Sergienko, Y H Shih

132. Characterization of Argon Arc Source in the Infrared
Published: 1/1/1996
Authors: John Mervin Bridges, Alan L Migdall

133. Characterization of an Argon Arc Source in the Infrared
Published: 1/1/1996
Authors: John Mervin Bridges, Alan L Migdall

134. Neutral Density Filter Measurements at the National Institute of Standards and Technology, ed. by C. Burgess and D.G. Jones
Published: 6/1/1995
Authors: Thomas R Gentile, A Frenkel, Alan L Migdall, Z M Zhang

135. Absolute Radiometry Using Correlated Photons, ed. by G.A. Lampropoulos
Published: 1/1/1995
Authors: Alan L Migdall, Raju Vsnu Datla, A V Sergienko, Y H Shih

136. Absolute Response Calibration of a Transfer Standard Cryogenic Bolometer
Published: 1/1/1995
Authors: George P Eppeldauer, Alan L Migdall, Thomas R Gentile, C L Cromer

137. A Cryogenic Silicon Resistance Bolometer for use as an Infrared Transfer Standard Detector, ed. by M. Kaviany, D.A. Kaminski, A. Majuimda, P.E. Phelan, M.M. Youvanovich Pages: and Z.M. Zhang
Published: 1/1/1994
Authors: George P Eppeldauer, Alan L Migdall, C L Cromer

138. IR Detector Spectral Responsivity Calibration Facility at NIST
Published: 1/1/1994
Authors: Alan L Migdall, George P Eppeldauer, C L Cromer

139. Filter Transmittance Measurements in the Infrared
Published: 1/1/1993
Authors: Alan L Migdall, A Frenkel, Daniel E. Kelleher

140. Linearity of a Silicon Photodiode at 30 MHz and Its Effects on Heterodyne Measurements
Published: 1/1/1991
Author: Alan L Migdall

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series