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You searched on: Author: christopher meyer

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11. Calibration of Hygrometers with the Hybrid Humidity Generator
Series: Special Publication (NIST SP)
Published: 12/14/2008
Authors: Christopher W Meyer, Joseph Terence Hodges, Peter H. Huang, W Wyatt Miller, Dean C Ripple, Gregory E Scace
Abstract: We describe here the calibration of customer hygrometers using a new humidity generator that has been commissioned at the National Institute of Standards and Technology. The NIST Hybrid Humidity Generator (HHG) generates frost/dew points from ‹ ...

12. Design and Performance of the new NIST Hybrid Humidity Generator
Published: 8/1/2008
Authors: Christopher W Meyer, W Wyatt Miller, Dean C Ripple, Gregory E Scace
Abstract: A new humidity generator has been constructed at the National Institute of Standards and Technology. Once fully operational, the NIST Hybrid Humidity Generator (HHG) will replace the Two-Pressure (2-P) Humidity Generator Mark II as the NIST primary ...

13. Adjustments to the NIST Realization of the ITS-90 from 5 K to 24.5561 K
Published: 5/1/2008
Authors: Weston Leo Tew, Christopher W Meyer
Abstract: Recent clarifications issued by the Consultative Committee on Thermometry (CCT) for the definitions of the equilibrium hydrogen (e-H2) triple points (TPs) and vapor-pressure points (VPs) have resulted in adjustments to the NIST-disseminated ITS-90 (T ...

14. Automated Continuous-Flow Gravimetric Hygrometer as a Primary Humidity Standard
Published: 5/1/2008
Authors: Christopher W Meyer, Joseph Terence Hodges, R W. Hyland, Gregory E Scace, J Valencia-Rodriguez, James R Whetstone
Abstract: A new primary gravimetric hygrometer has been completed at the National Institute of Standards and Technology (NIST). This apparatus determines the humidity in a steadily flowing gas stream by first separating the water from the carrier gas using de ...

15. Conformational Temperature Dependence of a Poly(ethylene-co-acrylic acid) Stationary Phase Investigated by Nuclear Magnetic Resonance Spectroscopy and Liquid Chromatography
Published: 11/1/2006
Authors: Lane C Sander, Christopher W Meyer, Stephen Albert Wise, O. Pascui, K. Albert

16. Determination of SPRT Realization Uncertainties Between Points
Published: 9/6/2006
Authors: Christopher W Meyer, Dean C Ripple
Abstract: Calibrated Standard Platinum Resistance Thermometers (SPRTs) are used to realize the International Temperature Scale of 1990 (ITS-90) from 13.8033 K to 1234.93 K. The SPRTs are calibrated at a series of fixed points, each assigned a temperature on ...

17. ITS-90 Non-Uniqueness From PRT Subrange Inconsistencies Over the Range 24.56 K to 273.16 K
Published: 9/1/2006
Authors: Christopher W Meyer, Weston Leo Tew
Abstract: Calculations have been performed to study ITS-90 non-uniqueness over the range 24.5561 K to 273.16 K, where the scale is defined by an interpolating platinum resistance thermometer (PRT) that is calibrated via sets of defined fixed points. Over this ...

18. Temperature Measurements of Microhotplates Using Fluorescence Thermometry
Published: 3/1/2006
Authors: Christopher W Meyer, Douglas C Meier, Christopher B Montgomery, Stephen Semancik
Abstract: A fluorescence microscope has been constructed for measuring surface temperatures of microhotplate platforms. The microscope measures temperature-dependent fluorescence lifetimes of a film of the phosphor Mg4(F)GeO6:Mn which is deposited on the micr ...

19. CCT Key Comparison No 1 (CCT-K1): Realisations of the ITS-90, 0.65 K to 24.5561 K, Using Rhodium-Iron Resistance Thermometers
Published: 6/1/2004
Authors: R L Rusby, Christopher W Meyer, Weston Leo Tew, D I Head, K D Hill, O Tamura, P A. de Groot, B Fellmuth, A Storm, A Peruzzi, J Engert, D N Astrov, Y Dedikov, G A Kytin
Abstract: At its meeting in 1996 the CCT initiated five Key Comparisons to test the equivalence of realisations of the ITS-90 between National Measurement Institutes. CCT-K1 covers the temperature range from 0.65 K to 24.5561 K, in which the ITS-90 is defined ...

20. Calibration of Radiation Thermometers in Rapid Thermal Processing Tools Using Si Wafers with Thin Film Thermocouples
Published: 10/1/2003
Authors: Kenneth Gruber Kreider, William Andrew Kimes, Christopher W Meyer, Dean C Ripple, Benjamin K Tsai, D H Chen, D P DeWitt
Abstract: Rapid thermal processing (RTP) tools are currently monitored and controlled with lightpipe radiation thermometers (LPRTs) which have been calibrated with thermocouple instrumented wafers. We have developed a thin-film thermocouple wafer that enables ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
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  • SP 300-XX: Precision Measurement and Calibration
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