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You searched on: Author: christopher meyer

Displaying records 11 to 20 of 39 records.
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11. Conformational Temperature Dependence of a Poly(ethylene-co-acrylic acid) Stationary Phase Investigated by Nuclear Magnetic Resonance Spectroscopy and Liquid Chromatography
Published: 11/1/2006
Authors: Lane C Sander, Christopher W Meyer, Stephen A Wise, O. Pascui, K. Albert

12. Determination of SPRT Realization Uncertainties Between Points
Published: 9/6/2006
Authors: Christopher W Meyer, Dean C Ripple
Abstract: Calibrated Standard Platinum Resistance Thermometers (SPRTs) are used to realize the International Temperature Scale of 1990 (ITS-90) from 13.8033 K to 1234.93 K. The SPRTs are calibrated at a series of fixed points, each assigned a temperature on ...

13. ITS-90 Non-Uniqueness From PRT Subrange Inconsistencies Over the Range 24.56 K to 273.16 K
Published: 9/1/2006
Authors: Christopher W Meyer, Weston Leo Tew
Abstract: Calculations have been performed to study ITS-90 non-uniqueness over the range 24.5561 K to 273.16 K, where the scale is defined by an interpolating platinum resistance thermometer (PRT) that is calibrated via sets of defined fixed points. Over this ...

14. Temperature Measurements of Microhotplates Using Fluorescence Thermometry
Published: 3/1/2006
Authors: Christopher W Meyer, Douglas C Meier, Christopher B Montgomery, Stephen Semancik
Abstract: A fluorescence microscope has been constructed for measuring surface temperatures of microhotplate platforms. The microscope measures temperature-dependent fluorescence lifetimes of a film of the phosphor Mg4(F)GeO6:Mn which is deposited on the micr ...

15. CCT Key Comparison No 1 (CCT-K1): Realisations of the ITS-90, 0.65 K to 24.5561 K, Using Rhodium-Iron Resistance Thermometers
Published: 6/1/2004
Authors: R L Rusby, Christopher W Meyer, Weston Leo Tew, D I Head, K D Hill, O Tamura, P A. de Groot, B Fellmuth, A Storm, A Peruzzi, J Engert, D N Astrov, Y Dedikov, G A Kytin
Abstract: At its meeting in 1996 the CCT initiated five Key Comparisons to test the equivalence of realisations of the ITS-90 between National Measurement Institutes. CCT-K1 covers the temperature range from 0.65 K to 24.5561 K, in which the ITS-90 is defined ...

16. Calibration of Radiation Thermometers in Rapid Thermal Processing Tools Using Si Wafers with Thin Film Thermocouples
Published: 10/1/2003
Authors: Kenneth Gruber Kreider, William Andrew Kimes, Christopher W Meyer, Dean C Ripple, Benjamin K Tsai, D H Chen, D P DeWitt
Abstract: Rapid thermal processing (RTP) tools are currently monitored and controlled with lightpipe radiation thermometers (LPRTs) which have been calibrated with thermocouple instrumented wafers. We have developed a thin-film thermocouple wafer that enables ...

17. A Four-Zone Furnace for Realization of Silver and Gold Freezing Points
Published: 9/1/2003
Authors: Dean C Ripple, K Garrity, Christopher W Meyer
Abstract: Recently, the Thermocouple Calibration Laboratory at the National Institute of Standards and Technology has used sodium heat-pipe furnaces for the realization of ITS-90 freezing points of aluminum, silver, and gold. When using a fixed-point cell moun ...

18. Recent Results of NIST Realizations of the ITS-90 Below 84 K
Published: 1/1/2003
Authors: Weston Leo Tew, Christopher W Meyer
Abstract: The results at NIST of realizations and comparisons of the ITS-90 below 84 K are presented. The 3He and 4He vapor pressure scales (0.65 K to 5.0 K), and the interpolating constant volume gas thermometer (ICVGT) scale (5.0 K to 24.556 K) as realized f ...

19. The NIST Low Temperature ITS-90 Realization and Calibration Facilities
Published: 10/1/2002
Authors: Christopher W Meyer, Weston Leo Tew
Abstract: Two facilities have been constructed at NIST for realizing and maintaining the ITS-90 below 84 K. The first facility is an integrated low temperature realization system that realizes the ITS-90 below 84 K in its entirety and which we refer to as the ...

20. Wafer Emissivity Effects on Light Pipe Radiometry in RTP Tools
Published: 5/1/2002
Authors: Kenneth Gruber Kreider, David W Allen, D H Chen, D P DeWitt, Christopher W Meyer, Benjamin K Tsai
Abstract: We investigated the effect of different wafer emissivities and the effect of low emissivity films on RTP wafer temperature measurements using light pipe radiation thermometers (LPRTs). These tests were performed in the NIST RTP test bed. We used a ...

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