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Author: john messina

Displaying records 11 to 20 of 42 records.
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11. Harmonizing Environmental Data Exchange Standards: Lessons Learned from the electronics Industry
Published: 12/15/2008
Authors: Eric D Simmon, John V Messina
Abstract: In meeting the challenges of sustainable design, information must flow through the manufacturing supply chain. Examples of this information include; product material data, product and process energy usage, and chemical safety information. To assist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900157

12. Managing Materials Information in the Supply Chain
Published: 11/28/2008
Authors: John V Messina, Eric D Simmon
Abstract: One important aspect of sustainable manufacturing is the acquisition and management of product material information. This information may be used to improve the design and manufacturing process, facilitate recycling, and to help comply with regulatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901682

13. Managing Materials Information in the Supply Chain
Published: 11/28/2008
Authors: John V Messina, Eric D Simmon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903691

14. Environmental Trends Affecting Electronics Manufacturing
Published: 8/1/2008
Authors: Eric D Simmon, John V Messina, Matthew L Aronoff, Michael Cox
Abstract: Companies that in the recent past were primarily concerned with satisfying environmental regulations are finding that environmental responsibility and environmental resource usage are of equal concern. Looking forward, manufacturers will be faced wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33135

15. Improving Environmental Information Handling and Data Exchange within the Electronics Industry
Published: 7/15/2008
Authors: Eric D Simmon, John V Messina
Abstract: Environmental regulations impacting the electronics industry are driving the need for new data management systems to track environmental data including material data. This paper describes efforts to take a holistic approach in managing this informati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32970

16. Understanding EuP and REACH
Published: 6/10/2008
Authors: John V Messina, Eric D Simmon
Abstract: There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product manufacturing. In the global economy, with its distributed supply chain, local environmental laws may ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32845

17. Understanding the IPC 175X Data Model
Published: 5/1/2008
Authors: Eric D Simmon, John V Messina
Abstract: More and more political bodies (countries, states, and unions) are enacting legislation designed to protect the environment from the impact of manufacturing. One category of restrictive legislation is called Extended Producer Responsibilities (EPR). ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32849

18. Information management for Environmental Concerns
Published: 2/8/2008
Authors: Eric D Simmon, John V Messina, Kevin G Brady
Abstract: Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials ending up in landfills to manufacturing process chelmicals causing health problems are ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32935

19. North American Environmental Compliance Attitudes Towards Electronics
Published: 9/27/2007
Authors: Krista Botsford, John V Messina, Eric D Simmon
Abstract: More and more countries are beginning eco-compliance legislation for electronics products. Where does the USA stand? This paper will discuss the following areas and attitudes towards environmental compliance in the USA: levels of legislation, who is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32840

20. Collaborative Augmented Reality for Better Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7441
Published: 8/15/2007
Authors: Matthew L Aronoff, John V Messina
Abstract: Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex -- including not only textual descriptions, but CAD models, diagnostic data, process control dat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32632



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