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You searched on: Author: stefan leigh

Displaying records 61 to 70 of 91 records.
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61. Calibration Experiments of a Laser Scanner
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6922
Published: 9/1/2002
Authors: Geraldine S Cheok, Stefan D Leigh, Andrew L Rukhin
Abstract: The potential applications of laser scanners or LADARs (Laser Detection and Ranging) are numerous, and they cross several sectors of the industry construction, large-scale manufacturing, remote sensing, national defense. A LADAR is an instrument ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860455

62. Dynamic Range Limitations in Phase Doppler Interferometry Measurements
Published: 7/1/2002
Authors: J F. Widmann, Cary Presser, Stefan D Leigh
Abstract: It has been well established that the dynamic range of phase Doppler interferometry (PDI) size measurements is limited by the photomultiplier tubes (PMT). A statistical method is presented to overcome this limitation by combining data sets collected ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861071

63. Transformation, Ranking, and Clustering for Face Recognition Algorithm Comparison
Published: 3/1/2002
Authors: Stefan D Leigh, Nathanael A Heckert, Andrew L Rukhin, J Grother Phillips, Elaine M Newton, M Moody, K Kniskern, S Heath
Abstract: The performance of face recognition algorithms is recently of increased interest, although to date empirical analyses of algorithms have been limited to rank-based scores such a cumulative match score and receiver operating characteristic. This pap ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51043

64. Certification of the Rheological Fluid Behavior of SRM 2491, Polydimthylsiloxane.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: .
Published: 1/1/2002
Authors: Carl R. Schultesiz, Kathleen M. Flynn, Stefan D Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853822

65. Dependence Characteristics of Face Recognition Algorithms
Published: 1/1/2002
Authors: Andrew L Rukhin, Patrick J Grother, P Jonathon Phillips, Stefan D Leigh, E M Newton, Nathanael A Heckert
Abstract: Nonparametric statistics for quantifying dependence between the output rankings of face recognition algorithms are described. Analysis of the archived results of a large face recognition study shows that even the better algorithms exhibit significan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51048

66. Transformation, Ranking, and Clustering for Face Recognition Algorithm Performance
Published: 1/1/2002
Authors: Stefan D Leigh, Nathanael A Heckert, Andrew L Rukhin, P Jonathon Phillips, Patrick J Grother, E M Newton, M Moody, K Kniskern, S Heath
Abstract: The performance of face recognition algorithms is recently of increased interest, although to date empirical analyses of algorithms have been limited to rank-based scores such a cumulative match score and receiver operating characteristic. This pape ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151783

67. Improving phase Doppler volume flux measurements in low data rate applications
Published: 8/1/2001
Authors: J F. Widmann, Cary Presser, Stefan D Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905185

68. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: Special Publication (NIST SP)
Report Number: 800-22
Published: 5/15/2001
Authors: Andrew L Rukhin, Juan Soto, James R. Nechvatal, Miles E. Smid, Elaine B Barker, Stefan D Leigh, M Levenson, M Vangel, D L. Banks, Nathanael A Heckert, James F Dray Jr., S C. Vo
Abstract: [Superseded by SP 800-22 Revision 1a (April 2010): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906762] This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151222

69. Effect of Burst-Splitting Events on Phase Doppler Interferometry Measurements
Published: 2/1/2001
Authors: J F. Widmann, Cary Presser, Stefan D Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905184

70. Preparation and Certification of K-411 Glass Microspheres
Published: 12/1/2000
Authors: Ryna B. Marinenko, S V. Roberson, J S Small, Barbara B. Thorne, Douglas H. Blackburn, D Kauffman, Stefan D Leigh
Abstract: The production and characterization of NBS K-411 glass microspheres in the 3-40 um range for certification as a NIST Standard Reference Material (SRM) are described. EDS quantitative analysis and heterogeneity evaluations of the microspheres were ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831165



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  • SP 250-XX: Calibration Services
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  • SP 400-XX: Semiconductor Measurement Technology
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