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You searched on: Author: stefan leigh

Displaying records 31 to 40 of 91 records.
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31. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna Beth Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...

32. E-glass/DGEBA/m-PDA single fiber composites: New insights into the statistics of fiber fragmentation
Published: 11/9/2009
Authors: Jae Hyun Kim, Gale Antrus Holmes, Stefan D Leigh

33. Determination of Perfluorinated Alkyl Acid concentrations in Human Serum and Milk Standard Reference Materials
Published: 10/28/2009
Authors: Jennifer M Lynch, Antonia M Calafat, Kayoko Kato, Mark E Ellefson, William K Reagen, Mark Strynar, Steven G. O'Connell, Craig M Butt, Scott Mabury, Jeff Small, D.C.G. Muir, Stefan D Leigh, Michele Miller Schantz
Abstract: Standard Reference Materials (SRMs) are homogeneous, well-characterized materials that are used to validate measurement methods and are critical in improving data quality. Disagreements in perfluorinated alkyl acid (PFAA) concentrations measured in e ...

34. Effects of sample preparation on bacterial colonization of polymers
Published: 10/19/2009
Authors: Diana N. Zeiger, Christopher M Stafford, Yajun Cheng, Stefan D Leigh, Sheng Lin-Gibson, Nancy J Lin
Abstract: Characterization of materials developed for medical usage frequently includes studies in which the materials are inoculated with bacteria in order to assess biofilm formation. Differences in the bacteria are considered to be due to the material alon ...

35. Report on Acceleration Comparison SIM.AUV.V-K1 - Draft B
Published: 3/20/2009
Authors: David J. Evans, Adriana Hornikova, Stefan D Leigh, Andrew L Rukhin, William E Strawderman
Abstract: The first regional key comparison in vibration conducted under the auspices of the Inter-American System of Metrology (SIM) was begun in 1996. The comparison was registered with the International Bureau of Weights and Measures (BIPM) through the Con ...

36. Determination of Polybrominated Diphenyl Ethers (PBDEs) in Environmental Standard Reference Materials
Published: 11/1/2007
Authors: Michele Miller Schantz, H M. Stapleton, Jennifer M Lynch, John R Kucklick, Stefan D Leigh, Stephen Albert Wise

37. Development of a Murre (Uria spp.) Egg Control Material
Published: 11/1/2007
Authors: Stacy S Vander-Pol, Michael B. Ellisor, Rebecca S Pugh, Paul R. (Paul) Becker, Dianne L Poster, Michele Miller Schantz, Stefan D Leigh, B. J. Wakeford, David G. Roseneau, K. S. Simac

38. Methodology for Evaluating Candidate Geometric Reference Scaffolds
Published: 11/1/2007
Authors: Joy P Dunkers, Stefan D Leigh, David Dean, M Cooke, Richard Ketcham, Marcus T Cicerone
Abstract: The motivation for the work is to rank candidate reference scaffolds by quality metrics in a systematic and quantitative manner by screening several microstructural descriptors of importance. We chose total pore volume, pore volume distribution, and ...

39. Certification of SRM 1589a PCBs, Pesticides, PBDEs, and Dioxins/Furans in Human Serum
Published: 10/1/2007
Authors: Michele Miller Schantz, Jennifer M Lynch, Stefan D Leigh, D. G. Patterson, Katherine E Sharpless, Andreas Sjodin, H M. Stapleton, R. Swarthout, Wayman E Turner, Stephen Albert Wise

40. Development and Certification of the New SRM 695 Trace Elements in Multi-Nutrient Fertilizer
Published: 10/1/2007
Authors: Elizabeth A Mackey, Mark P Cronise, Curtis N Fales, Robert Russ Greenberg, Stefan D Leigh, Stephen E Long, Anthony F Marlow, Karen E Murphy, Rabia Oflaz, John R Sieber, Laura J Wood, M. S. Rearick, Lee Lijian Yu, Stephen A. Wilson, Paul H. Briggs, Zoe A. Brown, J. Budahn, P. F. Kane, W L Marshall

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series