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1. Parametric force analysis for measurement of arbitrary optical forces on particles trapped in air or vacuum
Published: 9/8/2015
Authors: Haesung Park, Thomas W LeBrun
Abstract: We demonstrate a new method to measure general optical forces on particles trapped in gaseous or vacuum environments during the ring down of a trapped particle following electrostatic excitation. The method is not limited to the common constraint ...

2. MEMS optomechanical accelerometry standards
Published: 7/8/2015
Authors: Felipe Guzman, Yiliang Bao, Jason John Gorman, John Russell Lawall, Jacob M Taylor, Thomas W LeBrun
Abstract: Current acceleration primary standards reach relative uncertainties of the order of 0.001 and consist of complex test facilities, typically operated at National Metrology Institutes. Our research focuses on the development of silicon mechanical os ...

3. Significantly Improved Trapping Lifetime of Nanoparticles in an Optical Trap using Feedback Control
Published: 4/10/2012
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Jason John Gorman
Abstract: We demonstrate an increase in trapping lifetime for optically trapped nanoparticles by more than an order of magnitude using feedback control. This has been demonstrated through simu- lation and experimental results for 100, nm gold particles and 3 ...

4. Feedback Control of Optically Trapped Particles
Published: 12/17/2011
Authors: Jason John Gorman, Arvind Kumar Balijepalli, Thomas W LeBrun
Abstract: Optical trapping is a method for manipulating micro- and nanoscale particles that is widely used in biophysics and colloid science, among other areas. This method uses optical forces to confine the position of a particle to a localized region, which ...

5. Accurate Stochastic Simulations Using Graphics Hardware: Nanoassembly With the Optical Tweezers
Published: 3/1/2010
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Satyandra K. Gupta
Abstract: Significant speedup is possible when using the Graphics Processing Unit (GPU) for stochastic particle simulations. A simulation of freely diffusing spherical particles using Langevin's equation has been developed and the results from the CPU an ...

6. A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers
Published: 1/1/2006
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Satyandra K. Gupta
Abstract: The optical tweezers instrument is a unique tool for directed assembly of nanocomponents. In order to function as a viable nanomanufacturing tool, a software architecture is needed to run the optical tweezers hardware, provide an effective user inter ...

7. Three-dimensional Scanning Optical Tweezers
Published: 12/5/2005
Authors: Thomas W LeBrun, T W. Hwang, I Y Park, Jun-Feng Song, Yong-Gu Lee, Nicholas G Dagalakis, Cedric Victor Lucien Gagnon, Arvind Kumar Balijepalli
Abstract: There are several new tools for manipulating microscopic objects. Among them, optical tweezers (OT) has two distinguishing advantages. Firstly, OT can easily release an object without the need of a complicated detaching scheme. Secondly, it is antici ...

8. A Modular System Architecture for Agile Assembly of Nanocomponents using Optical Tweezers
Published: 9/10/2005
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, Cedric Victor Lucien Gagnon, Yong-Gu Lee, Nicholas G Dagalakis
Abstract: In order to realize the flexibility optical trapping offers as a nanoassembly tool, we need to develop natural and intuitiveinterfaces to assemble large quantities of nanocomponents quickly and cheaply. We propose a system to create such aninterface ...

9. A Modular System Architecture for Agile Assembly of Nano-Components using Optical Tweezers
Published: 9/1/2005
Authors: Arvind Kumar Balijepalli, Thomas W LeBrun, et al

10. Characterization of Optical Traps Using On-Line Estimation Methods
Published: 8/26/2005
Authors: Jason John Gorman, Thomas W LeBrun, et al
Abstract: System identification methods are presented for the estimation of the characteristic frequency of an optically trapped particle. These methods are more amenable to automated on-line measurements and are believed to be less prone to erroneous results ...

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