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Author: james kushmerick
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1. Characterization of a High-Speed (10 MHz) Quadrant Avalanche Photodiode for Measuring Cantilever Displacement
Published: 9/16/2012
Authors: Brian Gregory Burke, David A LaVan, James G. Kushmerick
Abstract: We have measured the characteristics of a high-speed (10 MHz) quadrant avalanche photodiode (APD) in order to detect high frequency resonant oscillations and tip displacements of a cantilever. Currently, no high-speed quadrant detectors with a resp ...

2. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...

3. Controlling charge-carrier type in nanoscale junctions with linker chemistry
Published: 8/1/2008
Authors: Christopher D Zangmeister, J M. Beebe, Jawad Naciri, James G. Kushmerick, Roger D van Zee

4. Investigation of damage mechanisms in PMMA during ToF-SIMS depth profiling with 5 keV and 8 keV SF5+ primary ions.
Published: 9/2/2010
Authors: Christine M. Mahoney, James G. Kushmerick, Kristen L Steffens
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) has been proven to be a useful technique for the surface and in-depth characterization of molecular films. Here, an SF5+ polyatomic primary ion source is utilized for depth profiling in poly(met ...

5. Molecule induced interface states dominate charge transport in Si-alkyl-metal junctions
Published: 8/26/2008
Authors: Lam H. Yu, Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Curt A Richter, James G. Kushmerick
Abstract: Abstract. Semiconductor-molecule-metal junctions consisting of alkanethiol mono- layers self-assembled on both p+ and n¡ type highly doped Si(111)wires contacted with a 10 ¹m Au wire in a crossed-wire geometry are examined. Low temperature transpo ...

6. Nanoscale Switch Elements From Self-Assembled Monolayers on Silver
Published: Date unknown
Authors: J M. Beebe, James G. Kushmerick
Abstract: Au/molecule/Ag junctions are shown to behave as voltage-controlled two-state switches. In the open state, the current-voltage behavior is consistent with a metal-molecule-metal tunnel junction. At a negative bias threshold, silver filaments bridge ...

7. Origin of Discrepancies in Inelastic Electron Tunneling Spectra ofMolecular Junctions
Published: Date unknown
Authors: Lam H. Yu, Christopher D Zangmeister, James G. Kushmerick
Abstract: We report inelastic electron tunneling spectroscopy (IETS) of multilayer molecular junctions with and without incorporated metal nano-particles. The incorporation of metal nanoparticles into our devices leads to enhanced IET intensity and a modified ...

8. Probing Charge Transport in Molecular Electronic Junctions With Transition Voltage Spectroscopy
Published: Date unknown
Authors: J M. Beebe, BongSoo Kim, C D Frisbie, James G. Kushmerick
Abstract: Though molecular devices exhibiting potentially useful electrical behavior have been demonstrated, a deep understanding of the factors that influence charge transport in molecular electronic junctions has not yet been fully realized. Recent work has ...

9. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...

10. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick

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