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Author: james kushmerick
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1. Characterization of a High-Speed (10 MHz) Quadrant Avalanche Photodiode for Measuring Cantilever Displacement
Published: 9/16/2012
Authors: Brian Gregory Burke, David A LaVan, James G. Kushmerick
Abstract: We have measured the characteristics of a high-speed (10 MHz) quadrant avalanche photodiode (APD) in order to detect high frequency resonant oscillations and tip displacements of a cantilever. Currently, no high-speed quadrant detectors with a resp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906903

2. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32683

3. Controlling charge-carrier type in nanoscale junctions with linker chemistry
Published: 8/1/2008
Authors: Christopher D Zangmeister, J M. Beebe, Jawad Naciri, James G. Kushmerick, Roger D van Zee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902681

4. Investigation of damage mechanisms in PMMA during ToF-SIMS depth profiling with 5 keV and 8 keV SF5+ primary ions.
Published: 9/2/2010
Authors: Christine M. Mahoney, James G. Kushmerick, Kristen L Steffens
Abstract: Cluster Secondary Ion Mass Spectrometry (cluster SIMS) has been proven to be a useful technique for the surface and in-depth characterization of molecular films. Here, an SF5+ polyatomic primary ion source is utilized for depth profiling in poly(met ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904766

5. Molecule induced interface states dominate charge transport in Si-alkyl-metal junctions
Published: 8/26/2008
Authors: Lam H. Yu, Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Curt A Richter, James G. Kushmerick
Abstract: Abstract. Semiconductor-molecule-metal junctions consisting of alkanethiol mono- layers self-assembled on both p+ and n¡ type highly doped Si(111)wires contacted with a 10 ¹m Au wire in a crossed-wire geometry are examined. Low temperature transpo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832205

6. Nanoscale Switch Elements From Self-Assembled Monolayers on Silver
Published: Date unknown
Authors: J M. Beebe, James G. Kushmerick
Abstract: Au/molecule/Ag junctions are shown to behave as voltage-controlled two-state switches. In the open state, the current-voltage behavior is consistent with a metal-molecule-metal tunnel junction. At a negative bias threshold, silver filaments bridge ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831433

7. Origin of Discrepancies in Inelastic Electron Tunneling Spectra ofMolecular Junctions
Published: Date unknown
Authors: Lam H. Yu, Christopher D Zangmeister, James G. Kushmerick
Abstract: We report inelastic electron tunneling spectroscopy (IETS) of multilayer molecular junctions with and without incorporated metal nano-particles. The incorporation of metal nanoparticles into our devices leads to enhanced IET intensity and a modified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831442

8. Probing Charge Transport in Molecular Electronic Junctions With Transition Voltage Spectroscopy
Published: Date unknown
Authors: J M. Beebe, BongSoo Kim, C D Frisbie, James G. Kushmerick
Abstract: Though molecular devices exhibiting potentially useful electrical behavior have been demonstrated, a deep understanding of the factors that influence charge transport in molecular electronic junctions has not yet been fully realized. Recent work has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831447

9. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 5/1/2010
Authors: L C Teague, Oana Jurchescu, Curt A Richter, Sanker Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James Kushmerick
Abstract: We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907043

10. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141



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